F. Senf
- Radiation top 1%
- Advanced X-ray Imaging Techniques 31
- X-ray Spectroscopy and Fluorescence Analysis 14
- Structural Biology top 5%
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 11
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- Atomic and Molecular Physics 9
- Condensed Matter Physics top 10%
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- Particle Accelerators and Free-Electron Lasers 19
- Advancements in Photolithography Techniques 10
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- Advanced Measurement and Metrology Techniques 6
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- Advanced Surface Polishing Techniques 6
F. Senf
56 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 65
- Radiation 610
- Structural Biology 69
- Surfaces, Coatings and Films 295
- Atomic and Molecular Physics, and Optics 454
- Condensed Matter Physics 124
Countries citing papers authored by F. Senf
This map shows the geographic impact of F. Senf's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Senf with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Senf more than expected).
Fields of papers citing papers by F. Senf
This network shows the impact of papers produced by F. Senf. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Senf. The network helps show where F. Senf may publish in the future.
Co-authorship network
The 25 scholars most cited alongside F. Senf, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 2 | |
| 2 | 2018 | 3 | |
| 3 | 2016 | 34 | |
| 4 | 2015 | 44 | |
| 5 | 2014 | 9 | |
| 6 | 2014 | 24 | |
| 7 | 2014 | 4 | |
| 8 | 2012 | 18 | |
| 9 | 2007 | 1 | |
| 10 | 2001 | 41 | |
| 11 | 2001 | 16 | |
| 12 | 2001 | 31 | |
| 13 | 2001 | 2 | |
| 14 | 1999 | 8 | |
| 15 | 1998 | 85 | |
| 16 | 1998 | 9 | |
| 17 | 1998 | 41 | |
| 18 | 1997 | 107 | |
| 19 | 1992 | 18 | |
| 20 | 1987 | 2 |
About F. Senf
F. Senf is a scholar working on Radiation, Structural Biology and Surfaces, Coatings and Films, having authored 57 papers that have together received 1.2k indexed citations. Recurring topics across this work include Advanced X-ray Imaging Techniques (31 papers), Particle Accelerators and Free-Electron Lasers (19 papers), X-ray Spectroscopy and Fluorescence Analysis (14 papers), Electron and X-Ray Spectroscopy Techniques (11 papers), Advancements in Photolithography Techniques (10 papers), Atomic and Molecular Physics (9 papers), Advanced Measurement and Metrology Techniques (6 papers) and Advanced Surface Polishing Techniques (6 papers). The work is most often cited by research in Radiation (610 citations), Structural Biology (69 citations) and Surfaces, Coatings and Films (295 citations). F. Senf has collaborated with scholars based in Germany, United States and India. Frequent co-authors include R. Follath, W. Gudat, F. Eggenstein, Kawal Sawhney, F. Schäfers, J. Bahrdt, Thomas Zeschke, A. Gaupp, Frank Siewert and Heiner Lammert. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, Review of Scientific Instruments, Journal of Synchrotron Radiation, Journal of Electron Spectroscopy and Related Phenomena and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.