Andréy Sokolov

1.4k total citations
85 papers, 935 citations indexed

About

Andréy Sokolov is a scholar working on Electrical and Electronic Engineering, Radiation and Surfaces, Coatings and Films. According to data from OpenAlex, Andréy Sokolov has authored 85 papers receiving a total of 935 indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Electrical and Electronic Engineering, 32 papers in Radiation and 27 papers in Surfaces, Coatings and Films. Recurrent topics in Andréy Sokolov's work include Advanced X-ray Imaging Techniques (27 papers), Electron and X-Ray Spectroscopy Techniques (18 papers) and X-ray Spectroscopy and Fluorescence Analysis (16 papers). Andréy Sokolov is often cited by papers focused on Advanced X-ray Imaging Techniques (27 papers), Electron and X-Ray Spectroscopy Techniques (18 papers) and X-ray Spectroscopy and Fluorescence Analysis (16 papers). Andréy Sokolov collaborates with scholars based in Germany, Russia and China. Andréy Sokolov's co-authors include Е. О. Филатова, F. Schäfers, Aleksei S. Konashuk, V. V. Afanas’ev, Frank Siewert, Mewael Sertsu, I. V. Kozhevnikov, F. Senf, Н. Н. Салащенко and В. Н. Полковников and has published in prestigious journals such as SHILAP Revista de lepidopterología, Nano Letters and Journal of Applied Physics.

In The Last Decade

Andréy Sokolov

82 papers receiving 901 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Andréy Sokolov Germany 16 415 346 243 177 161 85 935
F. Hüe France 13 355 0.9× 242 0.7× 218 0.9× 355 2.0× 183 1.1× 24 949
Qiushi Huang China 16 285 0.7× 211 0.6× 311 1.3× 261 1.5× 170 1.1× 134 932
Prafull Purohit United States 10 242 0.6× 380 1.1× 344 1.4× 186 1.1× 349 2.2× 33 1.1k
E. Nichelatti Italy 18 404 1.0× 314 0.9× 432 1.8× 238 1.3× 211 1.3× 120 1.2k
Hugh T. Philipp United States 17 226 0.5× 344 1.0× 396 1.6× 130 0.7× 167 1.0× 50 943
Andreas Leson Germany 15 188 0.5× 261 0.8× 147 0.6× 169 1.0× 70 0.4× 63 821
Marco Zangrando Italy 18 385 0.9× 276 0.8× 328 1.3× 342 1.9× 55 0.3× 82 914
Florent Houdellier France 22 621 1.5× 521 1.5× 166 0.7× 656 3.7× 360 2.2× 67 1.7k
L. Cultrera United States 17 430 1.0× 154 0.4× 193 0.8× 349 2.0× 207 1.3× 64 888
B. Pardo France 19 298 0.7× 326 0.9× 267 1.1× 334 1.9× 163 1.0× 82 1.0k

Countries citing papers authored by Andréy Sokolov

Since Specialization
Citations

This map shows the geographic impact of Andréy Sokolov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Andréy Sokolov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Andréy Sokolov more than expected).

Fields of papers citing papers by Andréy Sokolov

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Andréy Sokolov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Andréy Sokolov. The network helps show where Andréy Sokolov may publish in the future.

Co-authorship network of co-authors of Andréy Sokolov

This figure shows the co-authorship network connecting the top 25 collaborators of Andréy Sokolov. A scholar is included among the top collaborators of Andréy Sokolov based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Andréy Sokolov. Andréy Sokolov is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Müller, Matthias, Michael Krumrey, T. Gießel, et al.. (2025). Tender x-ray microfocus beamline employing a combined double crystal/multilayer grating monochromator. Review of Scientific Instruments. 96(9). 1 indexed citations
2.
Sokolov, Andréy, et al.. (2024). Phosphorus-Containing Alkynes in the Synthesis of Heterocyclic Compounds (A Review). Russian Journal of General Chemistry. 94(3). 558–590. 4 indexed citations
3.
Siewert, Frank, et al.. (2023). X-FAST: A versatile, high-throughput, and user-friendly XUV femtosecond absorption spectroscopy tabletop instrument. Review of Scientific Instruments. 94(7). 3 indexed citations
4.
Полковников, В. Н., S. Yu. Zuev, М. В. Свечников, et al.. (2022). Highly reflective Ru/Y multilayer mirrors for the spectral range of 9-11 nm. Optics Express. 30(11). 19332–19332. 4 indexed citations
5.
Vainer, Yu. A., S. Yu. Zuev, A. N. Nechay, et al.. (2020). Beryllium-Based Multilayer Mirrors for the Soft X-Ray and Extreme Ultraviolet Wavelength Ranges. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 14(1). 124–134. 5 indexed citations
6.
Huang, Qiushi, Jiangtao Feng, Tongzhou Li, et al.. (2019). Narrowband lamellar multilayer grating with low contrast MoSi 2 /Si materials for the soft x-ray region. Journal of Physics D Applied Physics. 52(19). 195303–195303. 2 indexed citations
7.
Sertsu, Mewael, O. F. Yakushev, V.M. Krivtsun, et al.. (2019). Single-walled carbon nanotube membranes for optical applications in the extreme ultraviolet range. Carbon. 155. 734–739. 18 indexed citations
8.
Свечников, М. В., Н. И. Чхало, С. А. Гусев, et al.. (2018). Influence of barrier interlayers on the performance of Mo/Be multilayer mirrors for next-generation EUV lithography. Optics Express. 26(26). 33718–33718. 36 indexed citations
9.
Nayak, M., et al.. (2018). Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials. Scientific Reports. 8(1). 15724–15724. 7 indexed citations
10.
Dziarzhytski, Siarhei, Frank Siewert, Andréy Sokolov, et al.. (2017). Diffraction gratings metrology and ray-tracing results for an XUV Raman spectrometer at FLASH. Journal of Synchrotron Radiation. 25(1). 138–144. 4 indexed citations
11.
Дабагов, С.Б., А. М. Lerer, Andréy Sokolov, et al.. (2017). Transmission diffractive patterns of large microchannel plates at soft X-ray energies. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 402. 282–286. 9 indexed citations
12.
Филатова, Е. О. & Andréy Sokolov. (2017). Effect of reflection and refraction on NEXAFS spectra measured in TEY mode. Journal of Synchrotron Radiation. 25(1). 232–240. 5 indexed citations
13.
Sokolov, Andréy, et al.. (2017). Efficient high-order suppression system for a metrology beamline. Journal of Synchrotron Radiation. 25(1). 100–107. 11 indexed citations
14.
Schäfers, F., F. Eggenstein, A. Erko, et al.. (2015). The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II. Journal of Synchrotron Radiation. 23(1). 67–77. 44 indexed citations
15.
Firsov, А. А., et al.. (2015). Reflection zone plate wavelength-dispersive spectrometer for ultra-light elements measurements. Optics Express. 23(23). 29476–29476. 8 indexed citations
16.
Nayak, M., et al.. (2015). Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution. Scientific Reports. 5(1). 31016–31016. 9 indexed citations
17.
Филатова, Е. О., I. V. Kozhevnikov, Andréy Sokolov, et al.. (2012). Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacks. Science and Technology of Advanced Materials. 13(1). 15001–15001. 25 indexed citations
18.
Sokolov, Andréy, et al.. (2008). Interface analysis of HfO2films on (1 0 0)Si using x-ray photoelectron spectroscopy. Journal of Physics D Applied Physics. 42(3). 35308–35308. 30 indexed citations
19.
Sokolov, Andréy, et al.. (2003). Numerical Study and Analysis of Pollutant Production and Emission Control Using Ion Current Prediction in the SI Engine. SAE technical papers on CD-ROM/SAE technical paper series. 9 indexed citations
20.
Sokolov, Andréy & S.T. Glad. (1999). Identifiability of Turbocharged IC Engine Models. SAE technical papers on CD-ROM/SAE technical paper series. 1. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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