F. Eggenstein

584 total citations
22 papers, 394 citations indexed

About

F. Eggenstein is a scholar working on Electrical and Electronic Engineering, Radiation and Surfaces, Coatings and Films. According to data from OpenAlex, F. Eggenstein has authored 22 papers receiving a total of 394 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 15 papers in Radiation and 5 papers in Surfaces, Coatings and Films. Recurrent topics in F. Eggenstein's work include Advanced X-ray Imaging Techniques (15 papers), X-ray Spectroscopy and Fluorescence Analysis (10 papers) and Advancements in Photolithography Techniques (6 papers). F. Eggenstein is often cited by papers focused on Advanced X-ray Imaging Techniques (15 papers), X-ray Spectroscopy and Fluorescence Analysis (10 papers) and Advancements in Photolithography Techniques (6 papers). F. Eggenstein collaborates with scholars based in Germany and Switzerland. F. Eggenstein's co-authors include F. Senf, W. Gudat, U. Flechsig, R. Follath, Thomas Zeschke, Jan-Simon Schmidt, W. B. Peatman, F. Schäfers, G. Ulm and R. Klein and has published in prestigious journals such as Review of Scientific Instruments, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment and Journal of Electron Spectroscopy and Related Phenomena.

In The Last Decade

F. Eggenstein

22 papers receiving 376 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. Eggenstein Germany 11 203 141 114 102 79 22 394
M. Mast Germany 8 139 0.7× 111 0.8× 67 0.6× 129 1.3× 61 0.8× 11 331
Takashi Imazono Japan 13 221 1.1× 86 0.6× 163 1.4× 74 0.7× 117 1.5× 54 458
T. Vecchione United States 13 134 0.7× 166 1.2× 81 0.7× 236 2.3× 105 1.3× 23 475
N. S. Faradzhev United States 11 68 0.3× 200 1.4× 157 1.4× 164 1.6× 149 1.9× 39 456
R. L. Myklebust United States 12 188 0.9× 48 0.3× 206 1.8× 58 0.6× 78 1.0× 33 405
Francesc Salvat–Pujol Germany 9 61 0.3× 91 0.6× 117 1.0× 80 0.8× 61 0.8× 25 356
E. Shiles United States 7 101 0.5× 162 1.1× 193 1.7× 229 2.2× 112 1.4× 17 497
J. Parellada Spain 8 273 1.3× 77 0.5× 275 2.4× 329 3.2× 80 1.0× 20 588
Takuya Nebiki Japan 10 129 0.6× 175 1.2× 174 1.5× 93 0.9× 110 1.4× 15 559
Q. F. Xiao United States 13 184 0.9× 60 0.4× 29 0.3× 124 1.2× 66 0.8× 39 350

Countries citing papers authored by F. Eggenstein

Since Specialization
Citations

This map shows the geographic impact of F. Eggenstein's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Eggenstein with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Eggenstein more than expected).

Fields of papers citing papers by F. Eggenstein

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Eggenstein. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Eggenstein. The network helps show where F. Eggenstein may publish in the future.

Co-authorship network of co-authors of F. Eggenstein

This figure shows the co-authorship network connecting the top 25 collaborators of F. Eggenstein. A scholar is included among the top collaborators of F. Eggenstein based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Eggenstein. F. Eggenstein is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Eggenstein, F., et al.. (2021). New UHV angle encoder for high resolution monochromators, a modern spare part for the Heidenhain UHV RON 905. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 1014. 165645–165645. 3 indexed citations
2.
Eggenstein, F., Andréy Sokolov, A. Varykhalov, et al.. (2017). Investigation of HF-plasma-treated soft x-ray optical elements. 23. 4–4. 1 indexed citations
3.
Sokolov, Andréy, F. Eggenstein, A. Erko, et al.. (2016). At-wavelength metrology facility for soft X-ray reflection optics. Review of Scientific Instruments. 87(5). 52005–52005. 34 indexed citations
4.
Eggenstein, F., F. Schäfers, F. Senf, et al.. (2016). Survey and adjustment methods applied on an 11 axes high performance reflectometer for synchrotron radiation. AIP conference proceedings. 1741. 30025–30025. 2 indexed citations
5.
Schäfers, F., F. Eggenstein, A. Erko, et al.. (2015). The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II. Journal of Synchrotron Radiation. 23(1). 67–77. 44 indexed citations
6.
Kachel, T., F. Eggenstein, & R. Follath. (2015). A soft X-ray plane-grating monochromator optimized for elliptical dipole radiation from modern sources. Journal of Synchrotron Radiation. 22(5). 1301–1305. 17 indexed citations
7.
Sokolov, Andréy, F. Eggenstein, A. Erko, et al.. (2014). An XUV optics beamline at BESSY II. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9206. 92060J–92060J. 24 indexed citations
8.
Eggenstein, F., A. Gaupp, F. Senf, et al.. (2014). A reflectometer for at-wavelength characterization of XUV-reflection gratings. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9206. 920607–920607. 9 indexed citations
9.
Eggenstein, F., F. Schäfers, A. Erko, et al.. (2012). A reflectometer for at-wavelength characterisation of gratings. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 710. 166–171. 7 indexed citations
10.
Könnecke, René, R. Follath, N. Pontius, et al.. (2012). The confocal plane grating spectrometer at BESSY II. Journal of Electron Spectroscopy and Related Phenomena. 188. 133–139. 9 indexed citations
11.
Schnürer, M., U. Eichmann, Mikhail Kalashnikov, et al.. (2004). “On-line” cleaning of optical components in a multi-TW-Ti:Sa laser system. Vacuum. 76(1). 45–49. 10 indexed citations
12.
Eichmann, U., V. M. Karpov, H. Schönnagel, et al.. (2003). Decontamination of CPA diffraction gratings. 337–337. 1 indexed citations
13.
Eggenstein, F., F. Senf, Thomas Zeschke, & W. Gudat. (2001). Cleaning of contaminated XUV-optics at BESSY II. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 467-468. 325–328. 20 indexed citations
14.
Senf, F., F. Eggenstein, U. Flechsig, et al.. (2001). Performance of the first undulator beamline U49-1-SGM at BESSY II. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 467-468. 474–478. 31 indexed citations
15.
Schwarzkopf, O., M. J. Borchert, F. Eggenstein, et al.. (1999). The BESSY constant length Rowland circle monochromator. Journal of Electron Spectroscopy and Related Phenomena. 101-103. 997–1001. 8 indexed citations
16.
Senf, F., U. Flechsig, F. Eggenstein, et al.. (1998). A plane-grating monochromator beamline for the PTB undulators at BESSY II. Journal of Synchrotron Radiation. 5(3). 780–782. 85 indexed citations
17.
Schwarzkopf, O., F. Eggenstein, U. Flechsig, et al.. (1998). High-resolution constant length Rowland circle monochromator at BESSY. Review of Scientific Instruments. 69(11). 3789–3793. 10 indexed citations
18.
Flechsig, U., F. Eggenstein, R. Follath, & F. Senf. (1997). Experimental determination of the diffraction efficiency and high-order suppression of gratings for synchrotron radiation. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3150. 9–9. 2 indexed citations
19.
Peatman, W. B., J. Bahrdt, F. Eggenstein, G. Reichardt, & F. Senf. (1995). The exactly focusing spherical grating monochromator for undulator radiation at BESSY. Review of Scientific Instruments. 66(4). 2801–2806. 27 indexed citations
20.
Senf, F., F. Eggenstein, & W. B. Peatman. (1992). Simple, constant length Rowland circle monochromators for undulator radiation. Review of Scientific Instruments. 63(1). 1326–1329. 18 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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