Heiner Lammert
- Radiation top 5%
- Mechanical Engineering
- Biomedical Engineering
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Co-authors
- F. SenfFrank SiewertThomas ZeschkeTino NollSimon G. AlcockS M ScottU. PedersenKawal Sawhney
- Topics
- Advanced X-ray Imaging Techniques (8 papers)Advanced Measurement and Metrology Techniques (7 papers)Advanced Surface Polishing Techniques (6 papers)
- Journals
- Review of Scientific InstrumentsNuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated EquipmentJournal of Electron Spectroscopy and Related Phenomena
- Partner nations
- United StatesGermanyUnited Kingdom
In The Last Decade
Heiner Lammert
15 papers receiving 304 citations
Peers
Comparison fields: 5 of 38
- Radiation 183
- Mechanical Engineering 147
- Biomedical Engineering 114
- Electrical and Electronic Engineering 73
- Atomic and Molecular Physics, and Optics 71
Countries citing papers authored by Heiner Lammert
This map shows the geographic impact of Heiner Lammert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Heiner Lammert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Heiner Lammert more than expected).
Fields of papers citing papers by Heiner Lammert
This network shows the impact of papers produced by Heiner Lammert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Heiner Lammert. The network helps show where Heiner Lammert may publish in the future.
Co-authorship network of co-authors of Heiner Lammert
This figure shows the co-authorship network connecting the top 25 collaborators of Heiner Lammert. A scholar is included among the top collaborators of Heiner Lammert based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Heiner Lammert. Heiner Lammert is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 134 | |
| 2 | 9 | |
| 3 | 8 | |
| 4 | 5 | |
| 5 | 28 | |
| 6 | 33 | |
| 7 | 4 | |
| 8 | 31 | |
| 9 | 32 | |
| 10 | 2 | |
| 11 | 8 | |
| 12 | 9 | |
| 13 | 10 | |
| 14 | 9 | |
| 15 | 5 |
About Heiner Lammert
Heiner Lammert is a scholar working on Radiation, Surfaces, Coatings and Films and Mechanical Engineering, having authored 15 papers that have together received 327 indexed citations. Recurring topics across this work include Advanced X-ray Imaging Techniques (8 papers), Advanced Measurement and Metrology Techniques (7 papers) and Advanced Surface Polishing Techniques (6 papers). The work is most often cited by research in Radiation (183 citations), Structural Biology (14 citations) and Statistics, Probability and Uncertainty (30 citations). Heiner Lammert has collaborated with scholars based in United States, Germany and United Kingdom. Frequent co-authors include F. Senf, Frank Siewert, Thomas Zeschke, Tino Noll, Simon G. Alcock, S M Scott, U. Pedersen, Kawal Sawhney, Rob Walton and Axel Schindler. Their work appears in journals such as Review of Scientific Instruments, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment and Journal of Electron Spectroscopy and Related Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.