F. D. Tichelaar

728 total citations
23 papers, 610 citations indexed

About

F. D. Tichelaar is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Mechanics of Materials. According to data from OpenAlex, F. D. Tichelaar has authored 23 papers receiving a total of 610 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Materials Chemistry, 7 papers in Electrical and Electronic Engineering and 5 papers in Mechanics of Materials. Recurrent topics in F. D. Tichelaar's work include Thin-Film Transistor Technologies (4 papers), Silicon Nanostructures and Photoluminescence (4 papers) and Silicon and Solar Cell Technologies (3 papers). F. D. Tichelaar is often cited by papers focused on Thin-Film Transistor Technologies (4 papers), Silicon Nanostructures and Photoluminescence (4 papers) and Silicon and Solar Cell Technologies (3 papers). F. D. Tichelaar collaborates with scholars based in Netherlands, Belgium and Russia. F. D. Tichelaar's co-authors include I. Apachitei, J. Duszczyk, L. Katgerman, Hans Mertens, Albert Polman, R.E.I. Schropp, J. Verhoeven, J.M.C. Mol, Peter Visser and Ali Kosari and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Chemical Physics Letters.

In The Last Decade

F. D. Tichelaar

23 papers receiving 583 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. D. Tichelaar Netherlands 11 366 326 122 118 92 23 610
Jenq‐Horng Liang Taiwan 14 620 1.7× 294 0.9× 140 1.1× 101 0.9× 67 0.7× 86 873
Guo Yang China 13 554 1.5× 259 0.8× 154 1.3× 228 1.9× 122 1.3× 29 847
T. A. Lafford United Kingdom 14 317 0.9× 317 1.0× 138 1.1× 102 0.9× 117 1.3× 35 633
Qiangmin Wei China 15 435 1.2× 246 0.8× 78 0.6× 99 0.8× 110 1.2× 34 664
Elías H. Penilla United States 11 250 0.7× 218 0.7× 82 0.7× 82 0.7× 91 1.0× 18 509
Jitendra S. Goela United States 10 449 1.2× 262 0.8× 54 0.4× 97 0.8× 64 0.7× 40 681
Wouter Leroy Belgium 19 472 1.3× 466 1.4× 130 1.1× 74 0.6× 77 0.8× 31 855
Jeffrey P. Hayes United States 15 357 1.0× 179 0.5× 52 0.4× 97 0.8× 42 0.5× 35 509
R.G. Saint-Jacques Canada 13 452 1.2× 383 1.2× 55 0.5× 81 0.7× 139 1.5× 45 653
K. Sbiaai Morocco 16 350 1.0× 234 0.7× 189 1.5× 248 2.1× 71 0.8× 68 752

Countries citing papers authored by F. D. Tichelaar

Since Specialization
Citations

This map shows the geographic impact of F. D. Tichelaar's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. D. Tichelaar with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. D. Tichelaar more than expected).

Fields of papers citing papers by F. D. Tichelaar

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. D. Tichelaar. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. D. Tichelaar. The network helps show where F. D. Tichelaar may publish in the future.

Co-authorship network of co-authors of F. D. Tichelaar

This figure shows the co-authorship network connecting the top 25 collaborators of F. D. Tichelaar. A scholar is included among the top collaborators of F. D. Tichelaar based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. D. Tichelaar. F. D. Tichelaar is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kosari, Ali, Peter Visser, F. D. Tichelaar, et al.. (2020). Cross-sectional characterization of the conversion layer formed on AA2024-T3 by a lithium-leaching coating. Applied Surface Science. 512. 145665–145665. 19 indexed citations
2.
Kosari, Ali, H.W. Zandbergen, F. D. Tichelaar, et al.. (2020). In-situ nanoscopic observations of dealloying-driven local corrosion from surface initiation to in-depth propagation. Corrosion Science. 177. 108912–108912. 87 indexed citations
3.
Tichelaar, F. D., et al.. (2016). Gas phase grown silicon germanium nanocrystals. Chemical Physics Letters. 661. 185–190. 2 indexed citations
4.
Molaei, Mohammad Jafar, A. Ataie, Shahram Raygan, Stephen J. Picken, & F. D. Tichelaar. (2011). Investigation on the Effects of Milling Atmosphere on Synthesis of Barium Ferrite/Magnetite Nanocomposite. Journal of Superconductivity and Novel Magnetism. 25(2). 519–524. 13 indexed citations
5.
Rigaux, C., F. D. Tichelaar, Pierre Louette, Julien L. Colaux, & Stéphane Lucas. (2010). First results of the surface modification of multiwall carbon nanotubes by a hollow cathode discharge. Surface and Coatings Technology. 205. S601–S604. 5 indexed citations
6.
Gao, J. R., M. Hajenius, F. D. Tichelaar, et al.. (2007). Monocrystalline NbN nanofilms on a 3C-SiC∕Si substrate. Applied Physics Letters. 91(6). 47 indexed citations
7.
Dik, Joris, et al.. (2006). DARK AND SHINY: THE DISCOVERY OF CHROMITE IN BRONZE AGE FAIENCE*. Archaeometry. 48(2). 229–236. 6 indexed citations
8.
Dik, Joris, et al.. (2004). Using FIB sample preparation in the study of historical artefacts. 346–347. 1 indexed citations
9.
Mertens, Hans, J. Verhoeven, Albert Polman, & F. D. Tichelaar. (2004). Infrared surface plasmons in two-dimensional silver nanoparticle arrays in silicon. Applied Physics Letters. 85(8). 1317–1319. 84 indexed citations
10.
Moret, M., et al.. (2003). Damage after annealing and aging at room temperature of platinized silicon substrates. Thin Solid Films. 434(1-2). 283–295. 19 indexed citations
11.
Dik, Joris, et al.. (2002). 19th century Naples Yellow re-examined.. UvA-DARE (University of Amsterdam). 16(2). 291–306. 8 indexed citations
12.
Kempen, A. T. W., et al.. (2002). Diffraction-contrast analysis of misfit strains around inclusions in a matrix: VN particles in α-Fe. Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 82(5). 971–1001. 1 indexed citations
13.
Zupanič, Franc, et al.. (2002). Microstructural evolution on continuous casting of nickel based superalloy Inconel* 713C. Materials Science and Technology. 18(7). 811–819. 6 indexed citations
14.
Apachitei, I., F. D. Tichelaar, J. Duszczyk, & L. Katgerman. (2002). The effect of heat treatment on the structure and abrasive wear resistance of autocatalytic NiP and NiP–SiC coatings. Surface and Coatings Technology. 149(2-3). 263–278. 179 indexed citations
15.
Pawlak, Bartek, et al.. (2001). Experimental investigation of band structure modification in silicon nanocrystals. Physical review. B, Condensed matter. 64(11). 22 indexed citations
16.
Vredenberg, A. M., et al.. (1999). Microstructural investigation of iron nitride layers formed by low-temperature gaseous nitriding. Journal of materials research/Pratt's guide to venture capital sources. 14(6). 2674–2679. 4 indexed citations
17.
Rath, J.K., F. D. Tichelaar, & R.E.I. Schropp. (1999). Profiled Poly-Silicon Films by Hot-Wire Chemical Vapour Deposition for Solar Cells on Cheap Metal Substrate. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 67-68. 465–470. 19 indexed citations
18.
Rath, J.K., F. D. Tichelaar, & R.E.I. Schropp. (1999). Microstructural Defects of Device Quality Hot-Wire Cvd Poly-Silicon Films. MRS Proceedings. 557. 2 indexed citations
19.
Rath, J.K., F. D. Tichelaar, H. Meiling, & R.E.I. Schropp. (1998). Hot-Wire CVD Poly-Silicon Films for Thin Film Devices. MRS Proceedings. 507. 56 indexed citations
20.
Tichelaar, F. D., et al.. (1998). Nitride formation in iron after nitrogen implantation in a nickel top layer. Journal of materials research/Pratt's guide to venture capital sources. 13(2). 440–445. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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