Pierre Louette

1.6k citations
67 papers · 1.4k indexed · h-index 21
Topics
Electron and X-Ray Spectroscopy Techniques (35 papers)Advancements in Photolithography Techniques (30 papers)Ion-surface interactions and analysis (18 papers)

In The Last Decade

Pierre Louette

67 papers receiving 1.3k citations

Peers

Pierre Louette
Comparison fields: 5 of 98
  • Materials Chemistry 550
  • Electrical and Electronic Engineering 459
  • Biomedical Engineering 442
  • Molecular Biology 237
  • Polymers and Plastics 165
Replace P. Bodö with:
P. Bodö Sweden
Miguel Manso‐Silván Spain
Xianghuai Liu China
M. Charbonnier France
Mohamed Oubaha Ireland
Damian Wojcieszak Poland
Klaus Rose Germany
Michel Jacquet France
Gang Feng United States
Marcela Socol Romania
Pierre Louette relative to P. Bodö Sweden P. Bodö's profile →
Citations per field
00.5×
P. Bodö · 1×
Citations per year

Countries citing papers authored by Pierre Louette

Since Specialization
Citations

This map shows the geographic impact of Pierre Louette's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Pierre Louette with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Pierre Louette more than expected).

Fields of papers citing papers by Pierre Louette

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Pierre Louette. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Pierre Louette. The network helps show where Pierre Louette may publish in the future.

Co-authorship network of co-authors of Pierre Louette

This figure shows the co-authorship network connecting the top 25 collaborators of Pierre Louette. A scholar is included among the top collaborators of Pierre Louette based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Pierre Louette. Pierre Louette is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 2
2 40
3 20
4 4
5 24
6 114
7 33
8 4
9 46
10 142
11 10
12 1
13 2
14 2
15 13
16 25
17 244
18 8
19 38
20 3

About Pierre Louette

Pierre Louette is a scholar working on Surfaces, Coatings and Films, Radiation and Archeology, having authored 67 papers that have together received 1.4k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (35 papers), Advancements in Photolithography Techniques (30 papers) and Ion-surface interactions and analysis (18 papers). The work is most often cited by research in Surfaces, Coatings and Films (136 citations), Materials Chemistry (550 citations) and Polymers and Plastics (165 citations). Pierre Louette has collaborated with scholars based in Belgium, Germany and United Kingdom. Frequent co-authors include Jean‐Jacques Pireaux, Frederic Bodino, Stéphane Courtois, Nathalie Zammatteo, José Remacle, Sandrine Hamels, Jean‐François Colomer, Alexandre Felten, Geetanjali Deokar and D. Vignaud. Their work appears in journals such as Physical Review Letters, Angewandte Chemie International Edition and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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