Edward B. Hakim

501 total citations
44 papers, 338 citations indexed

About

Edward B. Hakim is a scholar working on Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Edward B. Hakim has authored 44 papers receiving a total of 338 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 8 papers in Safety, Risk, Reliability and Quality and 4 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Edward B. Hakim's work include Integrated Circuits and Semiconductor Failure Analysis (12 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers) and Electrostatic Discharge in Electronics (8 papers). Edward B. Hakim is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (12 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers) and Electrostatic Discharge in Electronics (8 papers). Edward B. Hakim collaborates with scholars based in United States. Edward B. Hakim's co-authors include Michael Pecht, Pradeep Lall, Johannes Karl Fink, Luu Nguyen, Anthony J. Rafanelli, F. Patrick McCluskey, Lloyd W. Condra, Donald E. Emerson, G. Malinowski and Simon Tam and has published in prestigious journals such as Proceedings of the IEEE, IEEE Transactions on Electron Devices and IEEE Transactions on Reliability.

In The Last Decade

Edward B. Hakim

42 papers receiving 300 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Edward B. Hakim United States	9	216	61	56	35	23	44	338
Nishad Patil United States	10	407 1.9×	33 0.5×	49 0.9×	24 0.7×	8 0.3×	13	483
Guicui Fu China	10	286 1.3×	171 2.8×	36 0.6×	42 1.2×	30 1.3×	82	456
Edward Chan United States	12	555 2.6×	35 0.6×	129 2.3×	20 0.6×	12 0.5×	24	643
Qi Yuan China	10	370 1.7×	156 2.6×	27 0.5×	20 0.6×	11 0.5×	17	582
M. Cacciari Italy	16	368 1.7×	37 0.6×	96 1.7×	339 9.7×	5 0.2×	22	597
Shanshui Yang China	11	346 1.6×	33 0.5×	22 0.4×	47 1.3×	17 0.7×	54	439
Yaogang Hu China	13	341 1.6×	126 2.1×	68 1.2×	14 0.4×	31 1.3×	32	539
José Antônio Jardini Brazil	10	419 1.9×	50 0.8×	29 0.5×	87 2.5×	16 0.7×	37	521
P.S. Hamer United States	12	265 1.2×	52 0.9×	9 0.2×	44 1.3×	14 0.6×	49	368
Bob Willis United Kingdom	9	213 1.0×	106 1.7×	4 0.1×	12 0.3×	17 0.7×	16	292

Countries citing papers authored by Edward B. Hakim

Since Specialization

Citations

This map shows the geographic impact of Edward B. Hakim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Edward B. Hakim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Edward B. Hakim more than expected).

Fields of papers citing papers by Edward B. Hakim

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Edward B. Hakim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Edward B. Hakim. The network helps show where Edward B. Hakim may publish in the future.

Co-authorship network of co-authors of Edward B. Hakim

This figure shows the co-authorship network connecting the top 25 collaborators of Edward B. Hakim. A scholar is included among the top collaborators of Edward B. Hakim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Edward B. Hakim. Edward B. Hakim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Lall, Pradeep, Michael Pecht, & Edward B. Hakim. (2020). Influence of Tempemture on Microelectronics and System Reliability. 9 indexed citations

Condra, Lloyd W., et al.. (2002). Using plastic-encapsulated microcircuits in high reliability applications. 481–493. 6 indexed citations

Hakim, Edward B., et al.. (2002). A framework for reliability modeling of electronics. 15. 317–324. 1 indexed citations

Hakim, Edward B., Johannes Karl Fink, Simon Tam, Patrick McCluskey, & Michael Pecht. (1997). Plastic‐encapsulated Microcircuits (PEMs) : Long‐term Dormancy Studies. Circuit World. 23(4). 26–29. 3 indexed citations

Pecht, Michael, Luu Nguyen, Edward B. Hakim, & Anthony J. Rafanelli. (1997). Plastic Encapsulated Microelectronics; Materials, Processes, Quality, Reliability, and Application. Journal of Electronic Packaging. 119(2). 144–145. 18 indexed citations

Emerson, Donald E., et al.. (1996). Plastic-encapsulated microcircuit reliability and cost-effectiveness study. IEEE Transactions on Reliability. 45(1). 19–22. 3 indexed citations

Lall, Pradeep, Michael Pecht, & Edward B. Hakim. (1995). Characterization of functional relationship between temperature and microelectronic reliability. Microelectronics Reliability. 35(3). 377–402. 25 indexed citations

Hakim, Edward B., et al.. (1994). The demise of plastic encapsulated microcircuit myths. In AGARD. 1 indexed citations

Hakim, Edward B.. (1991). Microelectronic reliability/temperature independence. Quality and Reliability Engineering International. 7(4). 215–220. 3 indexed citations

10.

Hakim, Edward B., et al.. (1976). The use of reliable plastic semiconductors in military equipment. Microelectronics Reliability. 15(1). 29–33. 5 indexed citations

11.

Lall, Pradeep, et al.. (1970). Computer Aided Design And Reliability Assessment Of Microelectronic Packages. WIT transactions on engineering sciences. 3. 1 indexed citations

12.

Hakim, Edward B., et al.. (1969). Hot-spot thermal resistance in transistors. IEEE Transactions on Electron Devices. 16(2). 166–170. 11 indexed citations

13.

Hakim, Edward B., et al.. (1969). Effect of collector design on hot-spot formation and second breakdown in transistors. IEEE Transactions on Electron Devices. 16(2). 224–225. 4 indexed citations

14.

Hakim, Edward B.. (1965). Hot Spot Mesoplasma Formation in Silicon Planar Transistors. 609–619. 1 indexed citations

15.

Hakim, Edward B., et al.. (1965). Solder ball formation in silicon alloy transistors. IEEE Transactions on Electron Devices. 12(6). 369–372. 2 indexed citations

16.

Hakim, Edward B.. (1965). Transistor-surface analysis after secondary breakdown. Proceedings of the IEEE. 53(9). 1226–1226. 2 indexed citations

17.

Hakim, Edward B., et al.. (1965). "Solder ball" formation in silicon alloy transistors. Proceedings of the IEEE. 53(4). 389–389. 1 indexed citations

18.

Hakim, Edward B., et al.. (1964). TRADING OFF RADIATION RESISTANCE AND SECOND-BREAKDOWN PERFORMANCE. 1 indexed citations

19.

Hakim, Edward B., et al.. (1964). Maximum collector voltage and secondary breakdown in transistors. IEEE Transactions on Electron Devices. 11(3). 122–122. 3 indexed citations

20.

Hakim, Edward B., et al.. (1963). Light emission from silicon transistor junctions. Proceedings of the IEEE. 51(8). 1155–1156. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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