Yaogang Hu
- Electrical and Electronic Engineering top 10%
- Control and Systems Engineering top 5%
- Mechanical Engineering
- Safety, Risk, Reliability and Quality top 5%
- Mechanics of Materials
- Topics
- Silicon Carbide Semiconductor Technologies (10 papers)Wind Turbine Control Systems (6 papers)HVDC Systems and Fault Protection (5 papers)
- Cited by
- Control and Systems EngineeringSafety, Risk, Reliability and QualityElectrical and Electronic Engineering
- Journals
- SHILAP Revista de lepidopterologíaIEEE AccessRenewable Energy
- Partner nations
- ChinaDenmarkUnited States
In The Last Decade
Yaogang Hu
30 papers receiving 520 citations
Peers
Comparison fields: 5 of 66
- Electrical and Electronic Engineering 341
- Control and Systems Engineering 242
- Mechanical Engineering 126
- Safety, Risk, Reliability and Quality 68
- Mechanics of Materials 41
Countries citing papers authored by Yaogang Hu
This map shows the geographic impact of Yaogang Hu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yaogang Hu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yaogang Hu more than expected).
Fields of papers citing papers by Yaogang Hu
This network shows the impact of papers produced by Yaogang Hu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yaogang Hu. The network helps show where Yaogang Hu may publish in the future.
Co-authorship network of co-authors of Yaogang Hu
This figure shows the co-authorship network connecting the top 25 collaborators of Yaogang Hu. A scholar is included among the top collaborators of Yaogang Hu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yaogang Hu. Yaogang Hu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 0 | |
| 3 | 5 | |
| 4 | 10 | |
| 5 | 3 | |
| 6 | 4 | |
| 7 | 4 | |
| 8 | 22 | |
| 9 | 7 | |
| 10 | 89 | |
| 11 | 31 | |
| 12 | The stability and density of Fe-bearing akimotoite and implications for subduction | 1 |
| 13 | 13 | |
| 14 | 3 | |
| 15 | 22 | |
| 16 | 10 | |
| 17 | 5 | |
| 18 | 4 | |
| 19 | 59 | |
| 20 | 4 |
About Yaogang Hu
Yaogang Hu is a scholar working on Control and Systems Engineering, Electrical and Electronic Engineering and Safety, Risk, Reliability and Quality, having authored 32 papers that have together received 539 indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (10 papers), Wind Turbine Control Systems (6 papers) and HVDC Systems and Fault Protection (5 papers). The work is most often cited by research in Control and Systems Engineering (242 citations), Safety, Risk, Reliability and Quality (68 citations) and Electrical and Electronic Engineering (341 citations). Yaogang Hu has collaborated with scholars based in China, Denmark and United States. Frequent co-authors include Hui Li, Xinglin Liao, Zhe Chen, Shengquan Liu, Dong Yang, Chao Yang, Zheng Zeng, Hong‐Wei Xiao, Hui Li and Hui Li. Their work appears in journals such as SHILAP Revista de lepidopterología, IEEE Access and Renewable Energy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.