David D. Hawn

789 total citations · 1 hit paper
14 papers, 702 citations indexed

About

David D. Hawn is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, David D. Hawn has authored 14 papers receiving a total of 702 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Electrical and Electronic Engineering, 4 papers in Mechanics of Materials and 4 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in David D. Hawn's work include Electronic Packaging and Soldering Technologies (5 papers), Copper Interconnects and Reliability (3 papers) and Boron and Carbon Nanomaterials Research (3 papers). David D. Hawn is often cited by papers focused on Electronic Packaging and Soldering Technologies (5 papers), Copper Interconnects and Reliability (3 papers) and Boron and Carbon Nanomaterials Research (3 papers). David D. Hawn collaborates with scholars based in United States, India and Belgium. David D. Hawn's co-authors include Benjamin M. DeKoven, Luda S. Shlyakhtenko, Alexander Gall, Jeffrey J. Weimer, Yuri L. Lyubchenko, Peter Williams, Neal R. Armstrong, W. Cermignani, J. Blackson and T. G. Fawcett and has published in prestigious journals such as The Journal of Physical Chemistry, Biophysical Journal and Journal of the American Ceramic Society.

In The Last Decade

David D. Hawn

13 papers receiving 689 citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Deconvolution as a correction for photoelectron inelastic energy losses in the core level XPS spectra of iron oxides

1987 366 citations David D. Hawn, Benjamin M. DeKoven Surface and Interface Analysis profile →

Peers

Countries citing papers authored by David D. Hawn

Since Specialization

Citations

This map shows the geographic impact of David D. Hawn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David D. Hawn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David D. Hawn more than expected).

Fields of papers citing papers by David D. Hawn

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David D. Hawn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David D. Hawn. The network helps show where David D. Hawn may publish in the future.

Co-authorship network of co-authors of David D. Hawn

This figure shows the co-authorship network connecting the top 25 collaborators of David D. Hawn. A scholar is included among the top collaborators of David D. Hawn based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David D. Hawn. David D. Hawn is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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14 of 14 papers shown

#	Work	Indexed citations
1	A novel positive-tone and aqueous-base-developable photosensitive benzocyclobutene-based material for microelectronics 2005 ·Ying‐Hung So, (unknown), (unknown), (unknown), Yongfu Li, (unknown), (unknown), Jang‐Hi Im, (unknown), (unknown), Elvin Beach, (unknown), (unknown), David D. Hawn, (unknown), (unknown)	3
2	Underfill adhesion to Cyclotene/sup TM/ (BCB) dielectrics 2003 ·P Garrou, (unknown), Jay Im, Gregory F. Meyers, David D. Hawn, Jian Wu, Michael Vincent, C.P. Wong	0
3	Characterization of SiLK I™ Semiconductor Dielectric by XPS 2002 ·Surface Science Spectra ·David D. Hawn	3
4	Underfill adhesion to BCB (Cyclotene/sup TM/) bumping and redistribution dielectrics 2000 ·IEEE Transactions on Advanced Packaging ·(unknown), (unknown), Jang‐Hi Im, (unknown), Gregory F. Meyers, David D. Hawn, Jiali Wu, (unknown), C.P. Wong	9
5	Atomic Force Microscopy Imaging of DNA Covalently Immobilized on a Functionalized Mica Substrate 1999 ·Biophysical Journal ·Luda S. Shlyakhtenko, Alexander Gall, Jeffrey J. Weimer, David D. Hawn, Yuri L. Lyubchenko	117
6	On the Mechanical Reliability of Photo-BCB-Based Thin Film Dielectric Polymer for Electronic Packaging Applications 1999 ·Journal of Electronic Packaging ·Jang‐Hi Im, Edward O. Shaffer, (unknown), Andrew Strandjord, (unknown), (unknown), (unknown), Greg Meyers, David D. Hawn, (unknown), (unknown)	30
7	Adhesion Energy Measurements of Multilayer Low-K Dielectric Materials for ULSI Applications 1998 ·MRS Proceedings ·Edward O. Shaffer, M. E. Mills, David D. Hawn, (unknown), Andreas Knorr, (unknown), (unknown), Alain E. Kaloyeros, Robert Geer	10
8	Structures and properties of disordered boron carbide coatings generated by magnetron sputtering 1998 ·Thin Solid Films ·Terry Hu, (unknown), William Rafaniello, T. G. Fawcett, David D. Hawn, (unknown), Steve Rozeveld, (unknown), J. Blackson, W. Cermignani, (unknown)	89
9	A method for improving the adhesion of PE-CVD SiO/sub 2/ to Cyclotene/sup TM/ 5021 polymeric interlayer dielectric 1998 ·Edward O. Shaffer, M. E. Mills, David D. Hawn, (unknown), J.P. Hummel	2
10	Aqueous Dispersion and Slip Casting of Boron Carbide Powder: Effect of pH and Oxygen Content 1991 ·Journal of the American Ceramic Society ·Peter Williams, David D. Hawn	37
11	Scanning Auger and Xps Studies of Fracture Surfaces of B₄C Hot Pressed with Excess Carbon 1989 ·MRS Proceedings ·Benjamin M. DeKoven, (unknown), David D. Hawn	2
12	Deconvolution as a correction for photoelectron inelastic energy losses in the core level XPS spectra of iron oxides breakdown → 1987 ·Surface and Interface Analysis ·David D. Hawn, Benjamin M. DeKoven	366
13	Collimation of a dual-anode x-ray source used for x-ray photoelectron spectroscopy (XPS) 1983 ·Review of Scientific Instruments ·David D. Hawn	2
14	Electrochemical adsorption and covalent attachment of erythrosin to modified tin dioxide electrodes and measurement of the photocurrent sensitization to visible wavelength light 1978 ·The Journal of Physical Chemistry ·David D. Hawn, Neal R. Armstrong	32

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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