P. J. Orders

681 citations

18 papers · 553 indexed · h-index 14

Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 10
Structural Biology top 10%
Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis 7
Atomic and Molecular Physics, and Optics top 5%
- Advanced Chemical Physics Studies 9
- Semiconductor Quantum Structures and Devices 5
- Surface and Thin Film Phenomena 2
Condensed Matter Physics top 10%
Electrical and Electronic Engineering
- Advanced Semiconductor Detectors and Materials 7
- Chalcogenide Semiconductor Thin Films 3
Materials Chemistry
- Quantum Dots Synthesis And Properties 2

Co-authors: B. F. Usher C. S. Fadley R. Trehan M. Ga�l Eric L. Bullock S. Kono N. F. T. Hall Z. Hussain
Cited by: Surfaces, Coatings and Films Structural Biology Radiation
Journals: Physical review. B, Condensed matter (5 papers)Applied Physics Letters (2 papers)Journal of Crystal Growth (1 paper)
Partner nations: United States Australia France

In The Last Decade

P. J. Orders

18 papers receiving 536 citations

Peers

Countries citing papers authored by P. J. Orders

Since Specialization

Citations

This map shows the geographic impact of P. J. Orders's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. J. Orders with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. J. Orders more than expected).

Fields of papers citing papers by P. J. Orders

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. J. Orders. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. J. Orders. The network helps show where P. J. Orders may publish in the future.

Co-authorship network

The 25 scholars most cited alongside P. J. Orders, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with P. J. Orders Line = papers co-authored together P. J. Orders links everyone, so they are left out of the graph.

All Works

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18 of 18 papers shown

#	Work
1	In-situ ellipsometric measurements of the MBE growth of CdTe/HgTe and CdTe/ZnTe superlattices Journal of Electronic Materials ·Qin Yan-ka,Guozhen Shen,Wenjuan Wu,Timothy A. Steele,D. Rees,Imre Varga,D. M. Carr,T. Izawa,Nicola Elias Rüegsegger,P. J. Orders,R. Hartley,BRUNA MARIA PEDROSA DA SILVA JAMBO,M. Gál	1993	2
2	Real time control of the molecular-beam epitaxial growth of CdHgTe and CdTe/HgTe superlattices using ellipsometry Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·R. Hartley,Qin Yan-ka,D. M. Carr,P. J. Orders,D. Rees,Imre Varga,Wenjuan Wu,Guozhen Shen,Timothy A. Steele,BRUNA MARIA PEDROSA DA SILVA JAMBO,Jeong‐Bong Lee	1992	18
3	Ellipsometry: a technique for real time monitoring and analysis of MBE-grown CdHgTe and CdTe/HgTe superlattices Journal of Crystal Growth ·R. Hartley,Qin Yan-ka,D. M. Carr,P. J. Orders,D. Rees,Imre Varga,Wenjuan Wu,Guozhen Shen,Timothy A. Steele,BRUNA MARIA PEDROSA DA SILVA JAMBO,Mario Aguilar-Aragón	1992	19
4	Effect of strain on the band structure of InGaAs Physica Scripta ·A. P. J. Stampfl,G. Kemister,Robert Leckey,J.D. Riley,P. J. Orders,B. F. Usher,F. U. Hillebrecht,L. Ley	1990	3
5	Electron trajectory analysis of the spherical-sector electrostatic spectrometer: focussing properties and multichannel detection capability Journal of Electron Spectroscopy and Related Phenomena ·J. Osterwalder,M. Sagurton,P. J. Orders,C. S. Fadley,B. D. Hermsmeier,D. J. Friedman	1989	35
6	Observation of compressive and tensile strains in InGaAs/GaAs by photoluminescence spectroscopy Applied Physics Letters ·M. Ga�l,P. J. Orders,B. F. Usher,Victor P. Khaydukov,Jiansuo Lin	1988	23
7	Photoluminescence in strained InGaAs-GaAs heterostructures Journal of Applied Physics ·M. Ga�l,P. C. Taylor,B. F. Usher,P. J. Orders	1987	25
8	Determination of critical layer thickness in InxGa1−xAs/GaAs heterostructures by x-ray diffraction Applied Physics Letters ·P. J. Orders,B. F. Usher	1987	166
9	Quantitative analysis of a submonolayer adsorption system by angle resolved XPS: c(2×2)S on Ni(001) Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·Merlin F. Barschke,C. S. Fadley,P. J. Orders	1984	16
10	Temperature dependence of azimuthal X-ray Photoelectron Diffraction (XPD) from core level of Cu(001): Experiment and single scattering cluster calculations Solid State Communications ·R. Trehan,C. S. Fadley,P. J. Orders	1984	12
11	Adsorbate core-level azimuthal photoelectron diffraction at intermediate energies of 230-900 eV: Grazing emission with polarization dependence Physical review. B, Condensed matter ·B. Sinković,P. J. Orders,C. S. Fadley,R. Trehan,Z. Hussain,J. Lecante	1984	17
12	Intermediate-energy azimuthal photoelectron diffraction fromc(2×2)S(1s)on Ni(001) in a geometry emphasizing substrate backscattering Physical review. B, Condensed matter ·P. J. Orders,B. Sinković,C. S. Fadley,R. Trehan,Z. Hussain,J. Lecante	1984	22
13	Single-scattering cluster calculations and Fourier-transform analyses of normal photoelectron diffraction Physical review. B, Condensed matter ·P. J. Orders,C. S. Fadley	1983	55
14	Surface-structure determinations by means of off-normal photoelectron diffraction: A kinematical analysis Physical review. B, Condensed matter ·Eric L. Bullock,C. S. Fadley,P. J. Orders	1983	33
15	Angle-resolved X-ray photoemission from core levels of c(2 × 2) CO on Ni(001): Single-scattering theory and effects of vibration Surface Science ·P. J. Orders,S. Kono,C. S. Fadley,R. Trehan,Srie Hemawati	1982	49
16	Angle-resolved photoemission from the valence bands of NiTe₂, PdTe₂and PtTe₂ Journal of Physics F Metal Physics ·P. J. Orders,J. Liesegang,Robert Leckey,J.G. Jenkin,J.D. Riley	1982	16
17	Angle-resolved x-ray photoemission and Auger emission from core levels ofc(2×2)S and Se on Ni(001): Diffraction effects and single-scattering theory Physical review. B, Condensed matter ·P. J. Orders,Merlin F. Barschke,N. F. T. Hall,C. S. Fadley	1981	40
18	Electronic structure of the valence bands of SnF2 studied by ultraviolet photoelectron spectroscopy Chemical Physics Letters ·R. T. Poole,P. J. Orders,J.G. Jenkin,Robert Leckey,J. Liesegang	1978	2

About P. J. Orders

P. J. Orders is a scholar working on Surfaces, Coatings and Films, Radiation and Atomic and Molecular Physics, and Optics, having authored 18 papers that have together received 553 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (10 papers), Advanced Chemical Physics Studies (9 papers), Advanced Semiconductor Detectors and Materials (7 papers), X-ray Spectroscopy and Fluorescence Analysis (7 papers), Semiconductor Quantum Structures and Devices (5 papers), Chalcogenide Semiconductor Thin Films (3 papers), Quantum Dots Synthesis And Properties (2 papers) and Surface and Thin Film Phenomena (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (250 citations), Structural Biology (25 citations) and Radiation (125 citations). P. J. Orders has collaborated with scholars based in United States, Australia and France. Frequent co-authors include B. F. Usher, C. S. Fadley, C. S. Fadley, R. Trehan, M. Ga�l, Eric L. Bullock, S. Kono, N. F. T. Hall, Z. Hussain and B. Sinković. Their work appears in journals such as Physical review. B, Condensed matter, Applied Physics Letters, Journal of Crystal Growth, Journal of Electronic Materials and Chemical Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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