Chandan Bhat
Impact in
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- Electronic Packaging and Soldering Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
Papers in
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- Electronic Packaging and Soldering Technologies 9
- Integrated Circuits and Semiconductor Failure Analysis 7
- Indoor and Outdoor Localization Technologies 2
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- Microwave Imaging and Scattering Analysis 6
- Co-authors
- Pradeep Lall (9 shared papers)Jeff Suhling (5 shared papers)Jay Lee (4 shared papers)Nokibul Islam (3 shared papers)Uday K. Khankhoje (7 shared papers)Kaushik Sengupta (2 shared papers)Kai Goebel (2 shared papers)R. R. N. Sailaja (1 shared paper)
- Journals
- Microelectronics Reliability (2 papers)Remote Sensing (1 paper)IEEE Transactions on Components Packaging and Manufacturing Technology (1 paper)IEEE Transactions on Computational Imaging (1 paper)IEEE Transactions on Industrial Electronics (1 paper)
- Partner nations
- United StatesIndiaItaly
In The Last Decade
Chandan Bhat
16 papers receiving 300 citations
Peers
Comparison fields: 5 of 52
- Electrical and Electronic Engineering 205
- Statistics, Probability and Uncertainty 25
- Industrial and Manufacturing Engineering 30
- Civil and Structural Engineering 64
- Hardware and Architecture 15
Countries citing papers authored by Chandan Bhat
This map shows the geographic impact of Chandan Bhat's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chandan Bhat with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chandan Bhat more than expected).
Fields of papers citing papers by Chandan Bhat
This network shows the impact of papers produced by Chandan Bhat. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chandan Bhat. The network helps show where Chandan Bhat may publish in the future.
Co-authors
The 14 scholars most cited alongside Chandan Bhat, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 45 | |
| 2 | 2007 | 44 | |
| 3 | 2023 | 43 | |
| 4 | 2008 | 36 | |
| 5 | 2008 | 36 | |
| 6 | 2016 | 28 | |
| 7 | 2006 | 20 | |
| 8 | 2010 | 18 | |
| 9 | 2006 | 15 | |
| 10 | 2011 | 14 | |
| 11 | 2009 | 3 | |
| 12 | 2023 | 3 | |
| 13 | 2020 | 2 | |
| 14 | 2022 | 2 | |
| 15 | 2018 | 1 | |
| 16 | 2019 | 1 | |
| 17 | 2023 | 0 | |
| 18 | 2021 | 0 |
About Chandan Bhat
Chandan Bhat is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Ocean Engineering, Aerospace Engineering and Computational Mechanics, having authored 18 papers that have together received 311 indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (9 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Microwave Imaging and Scattering Analysis (6 papers), Geophysical Methods and Applications (4 papers), Probabilistic and Robust Engineering Design (3 papers), Sparse and Compressive Sensing Techniques (3 papers), Fatigue and fracture mechanics (2 papers) and Indoor and Outdoor Localization Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (205 citations), Statistics, Probability and Uncertainty (25 citations), Industrial and Manufacturing Engineering (30 citations), Civil and Structural Engineering (64 citations) and Hardware and Architecture (15 citations). Chandan Bhat has collaborated with scholars based in United States, India and Italy. Frequent co-authors include Pradeep Lall, Jeff Suhling, Jay Lee, Nokibul Islam, Uday K. Khankhoje, Kaushik Sengupta, Kai Goebel, R. R. N. Sailaja, Srijanani Bhaskar and Ranjit Pandher. Their work appears in journals such as Microelectronics Reliability, Remote Sensing, IEEE Transactions on Components Packaging and Manufacturing Technology, IEEE Transactions on Computational Imaging and IEEE Transactions on Industrial Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.