Zahava Koren

1.3k total citations
72 papers, 926 citations indexed

About

Zahava Koren is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Hardware and Architecture. According to data from OpenAlex, Zahava Koren has authored 72 papers receiving a total of 926 indexed citations (citations by other indexed papers that have themselves been cited), including 56 papers in Electrical and Electronic Engineering, 31 papers in Aerospace Engineering and 13 papers in Hardware and Architecture. Recurrent topics in Zahava Koren's work include CCD and CMOS Imaging Sensors (32 papers), Infrared Target Detection Methodologies (26 papers) and Image Processing Techniques and Applications (12 papers). Zahava Koren is often cited by papers focused on CCD and CMOS Imaging Sensors (32 papers), Infrared Target Detection Methodologies (26 papers) and Image Processing Techniques and Applications (12 papers). Zahava Koren collaborates with scholars based in United States, Canada and Israel. Zahava Koren's co-authors include Israel Koren, Glenn H. Chapman, A. Ganz, É. M. Gutman, Ya. Unigovski, A. Eliezer, C.H. Stapper, Dhiraj K. Pradhan, Eli Aghion and Stephen Y. H. Su and has published in prestigious journals such as Proceedings of the IEEE, Materials Science and Engineering A and Journal of Materials Science.

In The Last Decade

Zahava Koren

67 papers receiving 861 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Zahava Koren United States	17	595	271	221	189	150	72	926
Wei-Yu Chen Taiwan	20	888 1.5×	413 1.5×	85 0.4×	381 2.0×	152 1.0×	82	1.2k
Keller United States	12	120 0.2×	160 0.6×	37 0.2×	183 1.0×	60 0.4×	38	658
Lu Yin China	14	313 0.5×	23 0.1×	188 0.9×	158 0.8×	26 0.2×	71	571
Hoang Le‐Huy Canada	22	1.6k 2.8×	37 0.1×	45 0.2×	37 0.2×	181 1.2×	93	2.0k
Arnaldo S. R. Oliveira Portugal	18	813 1.4×	121 0.4×	122 0.6×	253 1.3×	56 0.4×	147	1.1k
Peixin Qiao China	10	214 0.4×	7 0.0×	167 0.8×	105 0.6×	103 0.7×	22	762
Haitao Wu China	16	214 0.4×	12 0.0×	15 0.1×	326 1.7×	171 1.1×	59	960
Mohamed R. M. Rizk Egypt	17	452 0.8×	26 0.1×	133 0.6×	321 1.7×	12 0.1×	131	863
Jiabao Yu China	14	362 0.6×	35 0.1×	182 0.8×	79 0.4×	22 0.1×	31	834

Countries citing papers authored by Zahava Koren

Since Specialization

Citations

This map shows the geographic impact of Zahava Koren's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Zahava Koren with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Zahava Koren more than expected).

Fields of papers citing papers by Zahava Koren

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Zahava Koren. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Zahava Koren. The network helps show where Zahava Koren may publish in the future.

Co-authorship network of co-authors of Zahava Koren

This figure shows the co-authorship network connecting the top 25 collaborators of Zahava Koren. A scholar is included among the top collaborators of Zahava Koren based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Zahava Koren. Zahava Koren is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Chapman, Glenn H., et al.. (2018). Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels. Electronic Imaging. 30(11). 401–1. 1 indexed citations

Chapman, Glenn H., et al.. (2017). Hot Pixel Behavior as Pixel Size Reduces to 1 micron. Electronic Imaging. 29(11). 39–45. 2 indexed citations

Chapman, Glenn H., et al.. (2015). Single Event Upsets and Hot Pixels in digital imagers. 7875. 41–46. 7 indexed citations

Chapman, Glenn H., et al.. (2014). Improved correction for hot pixels in digital imagers. 3. 116–121. 3 indexed citations

Chapman, Glenn H., et al.. (2012). Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8298. 82980E–82980E. 1 indexed citations

Chapman, Glenn H., et al.. (2011). Predicting Pixel Defect Rates Based on Image Sensor Parameters. 408–416. 7 indexed citations

Chapman, Glenn H., et al.. (2010). Analyzing the impact of ISO on digital imager defects with an automatic defect trace algorithm. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7536. 75360F–75360F. 10 indexed citations

Sundaresan, Srikanth, Israel Koren, Zahava Koren, & C.M. Krishna. (2009). Event-driven adaptive duty-cycling in sensor networks. International Journal of Sensor Networks. 6(2). 89–89. 13 indexed citations

Unigovski, Ya., et al.. (2008). Effect of processing on stress-corrosion behavior of die-cast Mg–Al alloy. Journal of Materials Processing Technology. 208(1-3). 395–399. 7 indexed citations

10.

Regev, Michael, et al.. (2007). Microstructure study of particle reinforced AZ91D and AM50 magnesium alloy semisolid casting. Materials Science and Technology. 23(12). 1485–1491. 2 indexed citations

11.

Chapman, Glenn H., et al.. (2006). <title>Robust detection of defects in imaging arrays</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6059. 60590X–60590X. 9 indexed citations

12.

Koren, Israel & Zahava Koren. (2002). Yield analysis of a novel scheme for defect-tolerant memories. 269–278. 2 indexed citations

13.

Koren, Israel & Zahava Koren. (2002). Yield and routing objectives in floorplanning. 28–36. 2 indexed citations

14.

Koren, Zahava, et al.. (2002). Using rational approximations for evaluating the reliability of highly reliable systems. ac 32. 8 pp–8 pp. 1 indexed citations

15.

Koren, Zahava & Israel Koren. (2002). The impact of floorplanning on the yield of fault-tolerant ICs. 329–338. 1 indexed citations

16.

Koren, Israel & Zahava Koren. (1998). Defect tolerance in VLSI circuits: techniques and yield analysis. Proceedings of the IEEE. 86(9). 1819–1838. 173 indexed citations

17.

Koren, Zahava & Israel Koren. (1997). On the effect of floorplanning on the yield of large area integrated circuits. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 5(1). 3–14. 7 indexed citations

18.

Koren, Zahava & A. Ganz. (1992). Efficient performance analysis of asymmetric finite buffer multichannel networks. Communications in Statistics Stochastic Models. 8(3). 599–616. 2 indexed citations

19.

Ganz, A. & Zahava Koren. (1991). WDM passive star-protocols and performance analysis. 991–1000 vol.3. 70 indexed citations

20.

Chlamtac, Imrich, A. Ganz, & Zahava Koren. (1988). Prioritized demand assignment protocols and their evaluation. IEEE Transactions on Communications. 36(2). 133–143. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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