C. Kisielowski

6.6k total citations · 4 hit papers
83 papers, 5.1k citations indexed

About

C. Kisielowski is a scholar working on Materials Chemistry, Structural Biology and Surfaces, Coatings and Films. According to data from OpenAlex, C. Kisielowski has authored 83 papers receiving a total of 5.1k indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Materials Chemistry, 30 papers in Structural Biology and 30 papers in Surfaces, Coatings and Films. Recurrent topics in C. Kisielowski's work include Electron and X-Ray Spectroscopy Techniques (30 papers), Advanced Electron Microscopy Techniques and Applications (30 papers) and GaN-based semiconductor devices and materials (27 papers). C. Kisielowski is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (30 papers), Advanced Electron Microscopy Techniques and Applications (30 papers) and GaN-based semiconductor devices and materials (27 papers). C. Kisielowski collaborates with scholars based in United States, Germany and Mexico. C. Kisielowski's co-authors include Alex Zettl, Michael F. Crommie, Rolf Erni, Marta D. Rossell, Jannik C. Meyer, Marvin L. Cohen, Steven G. Louie, Kwanpyo Kim, E. R. Weber and Z. Liliental‐Weber and has published in prestigious journals such as Science, Physical Review Letters and Advanced Materials.

In The Last Decade

C. Kisielowski

81 papers receiving 5.0k citations

Hit Papers

Graphene at the Edge: Sta... 1996 2026 2006 2016 2009 2008 1996 2011 250 500 750 1000
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Graphene at the Edge: Stability and Dynamics
    2009 1.0k citations Rolf Erni, C. Kisielowski et al. profile →
  2. Direct Imaging of Lattice Atoms and Topological Defects in Graphene Membranes
    2008 930 citations C. Kisielowski, Rolf Erni et al. profile →
  3. Strain-related phenomena in GaN thin films
    1996 764 citations C. Kisielowski, S. Ruvimov et al. profile →
  4. Grain Boundary Mapping in Polycrystalline Graphene
    2011 526 citations Kwanpyo Kim, C. Kisielowski et al. profile →

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
C. Kisielowski 3.6k 1.6k 1.2k 1.0k 955 83 5.1k
D. Cherns 2.7k 0.7× 2.1k 1.3× 1.5k 1.3× 1.2k 1.2× 667 0.7× 163 4.8k
Tsukasa Hirayama 2.2k 0.6× 3.1k 1.9× 1.8k 1.6× 828 0.8× 742 0.8× 241 6.1k
Wilfried Sigle 3.2k 0.9× 1.5k 0.9× 385 0.3× 813 0.8× 1.0k 1.1× 194 5.0k
J. W. Steeds 2.4k 0.7× 1.1k 0.7× 1.0k 0.9× 763 0.8× 406 0.4× 181 4.0k
Jean‐Luc Rouvière 2.2k 0.6× 2.6k 1.6× 2.6k 2.3× 2.2k 2.2× 1.4k 1.5× 198 5.7k
A. K. Petford‐Long 3.0k 0.8× 1.3k 0.8× 887 0.8× 2.7k 2.7× 1.8k 1.9× 318 6.4k
Milos Toth 4.0k 1.1× 2.2k 1.4× 563 0.5× 2.2k 2.1× 1.5k 1.6× 197 6.4k
Paul M. Voyles 3.8k 1.0× 2.4k 1.5× 945 0.8× 1.2k 1.2× 750 0.8× 229 6.7k
D. E. Jesson 1.6k 0.5× 1.6k 1.0× 605 0.5× 1.8k 1.8× 686 0.7× 110 4.0k
Gerd Duscher 4.5k 1.2× 3.1k 1.9× 319 0.3× 761 0.8× 1.3k 1.3× 213 7.0k

Countries citing papers authored by C. Kisielowski

Since Specialization
Citations

This map shows the geographic impact of C. Kisielowski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Kisielowski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Kisielowski more than expected).

Fields of papers citing papers by C. Kisielowski

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Kisielowski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Kisielowski. The network helps show where C. Kisielowski may publish in the future.

Co-authorship network of co-authors of C. Kisielowski

This figure shows the co-authorship network connecting the top 25 collaborators of C. Kisielowski. A scholar is included among the top collaborators of C. Kisielowski based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. Kisielowski. C. Kisielowski is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
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Chen, Fu‐Rong, D. Van Dyck, & C. Kisielowski. (2016). In-line three-dimensional holography of nanocrystalline objects at atomic resolution. Nature Communications. 7(1). 10603–10603. 38 indexed citations
3.
Helveg, Stig, C. Kisielowski, Joerg R. Jinschek, et al.. (2014). Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity. Micron. 68. 176–185. 42 indexed citations
4.
5.
Chen, Fu‐Rong, C. Kisielowski, & D. Van Dyck. (2014). 3D reconstruction of nanocrystalline particles from a single projection. Micron. 68. 59–65. 19 indexed citations
6.
Calderón, H.A., C. Kisielowski, P. Specht, et al.. (2014). Maintaining the genuine structure of 2D materials and catalytic nanoparticles at atomic resolution. Micron. 68. 164–175. 9 indexed citations
7.
Kim, Kwanpyo, Sinisa Coh, C. Kisielowski, et al.. (2013). Atomically perfect torn graphene edges and their reversible reconstruction. Nature Communications. 4(1). 2723–2723. 109 indexed citations
8.
Tiemeijer, Peter, Maarten Bischoff, Bert Freitag, & C. Kisielowski. (2012). Using a monochromator to improve the resolution in TEM to below 0.5Å. Part I: Creating highly coherent monochromated illumination. Ultramicroscopy. 114. 72–81. 51 indexed citations
9.
Jinschek, Joerg R., Kees Joost Batenburg, H.A. Calderón, et al.. (2007). 3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: Prospects of atomic resolution electron tomography. Ultramicroscopy. 108(6). 589–604. 63 indexed citations
10.
Aert, Sandra Van, et al.. (2006). Electron channelling based crystallography. Ultramicroscopy. 107(6-7). 551–558. 31 indexed citations
11.
Bals, Sara, G. Van Tendeloo, & C. Kisielowski. (2006). A New Approach for Electron Tomography: Annular Dark‐Field Transmission Electron Microscopy. Advanced Materials. 18(7). 892–895. 58 indexed citations
12.
Kisielowski, C., Bert Freitag, Xiaoxue Xu, Scott P. Beckman, & D. C. Chrzan. (2005). Sub Angstrom imaging of dislocation core structures: How well are experiments comparable \nwith theory?. eScholarship (California Digital Library). 10 indexed citations
13.
Bals, Sara, R. Kilaas, & C. Kisielowski. (2005). Nonlinear imaging using annular dark field TEM. Ultramicroscopy. 104(3-4). 281–289. 14 indexed citations
14.
Xu, X.Z., Scott P. Beckman, P. Specht, et al.. (2005). Distortion and Segregation in a Dislocation Core Region at Atomic Resolution. Physical Review Letters. 95(14). 145501–145501. 44 indexed citations
15.
Diebold, Alain C., Brendan Foran, C. Kisielowski, et al.. (2003). Thin Dielectric Film Thickness Determination by Advanced Transmission Electron Microscopy. Microscopy and Microanalysis. 9(6). 493–508. 46 indexed citations
16.
Principe, E., David G. Watson, & C. Kisielowski. (2002). Advancements in the characterization of "hyper-thin" oxynitride gate \ndielectrics through exit wave reconstruction HRTEM and XPS. eScholarship (California Digital Library). 1 indexed citations
17.
Stach, Eric A., C. Kisielowski, William S. Wong, T. Sands, & N.W. Cheung. (2000). Real Time Observation and Characterization of Dislocation Motion, Nitrogen Desorption and Nanopipe Formation in GaN. MRS Proceedings. 622. 3 indexed citations
18.
Hong, M. H., et al.. (1999). Deformation-Induced Dislocations in 4H-SiC and GaN. MRS Proceedings. 572. 12 indexed citations
19.
Kim, Youngmee, et al.. (1997). Stress Controlled MBE-growth of GaN:Mg and GaN:Si. MRS Proceedings. 482. 7 indexed citations
20.
Liliental‐Weber, Z., S. Ruvimov, T. Suski, et al.. (1996). Effect of Si Doping on The Structure of Gan. MRS Proceedings. 423. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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