A. F. Schwartzman

875 total citations
23 papers, 728 citations indexed

About

A. F. Schwartzman is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Mechanics of Materials. According to data from OpenAlex, A. F. Schwartzman has authored 23 papers receiving a total of 728 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 10 papers in Materials Chemistry and 7 papers in Mechanics of Materials. Recurrent topics in A. F. Schwartzman's work include Chalcogenide Semiconductor Thin Films (5 papers), Metal and Thin Film Mechanics (5 papers) and GaN-based semiconductor devices and materials (5 papers). A. F. Schwartzman is often cited by papers focused on Chalcogenide Semiconductor Thin Films (5 papers), Metal and Thin Film Mechanics (5 papers) and GaN-based semiconductor devices and materials (5 papers). A. F. Schwartzman collaborates with scholars based in United States, Germany and Singapore. A. F. Schwartzman's co-authors include L. B. Freund, David C. Paine, K. S. Stevens, R. Beresford, Rodney Sinclair, Vivek B. Shenoy, Akira Ohtani, V. B. Shenoy, Kengqing Jian and Gregory P. Crawford and has published in prestigious journals such as Advanced Materials, ACS Nano and Applied Physics Letters.

In The Last Decade

A. F. Schwartzman

23 papers receiving 709 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. F. Schwartzman United States 14 325 309 184 155 137 23 728
James C. Mabon United States 16 354 1.1× 218 0.7× 152 0.8× 163 1.1× 82 0.6× 29 728
Hideki Ichinose Japan 20 674 2.1× 232 0.8× 238 1.3× 141 0.9× 117 0.9× 69 1.0k
P.C.P. Bouten Netherlands 14 484 1.5× 230 0.7× 121 0.7× 281 1.8× 148 1.1× 29 1.1k
Atefeh Ghaderi Iran 21 618 1.9× 329 1.1× 106 0.6× 236 1.5× 294 2.1× 46 1.2k
A. Olsen Norway 16 615 1.9× 278 0.9× 159 0.9× 129 0.8× 92 0.7× 56 1.0k
J.A.P. da Costa Brazil 20 560 1.7× 303 1.0× 162 0.9× 96 0.6× 379 2.8× 58 952
Nobuo Kieda Japan 11 320 1.0× 151 0.5× 62 0.3× 100 0.6× 105 0.8× 40 616
Chris H. Stoessel United States 6 324 1.0× 259 0.8× 60 0.3× 122 0.8× 287 2.1× 8 647
T.M. Grehk Sweden 19 405 1.2× 307 1.0× 322 1.8× 84 0.5× 94 0.7× 42 898
D. Gotthold United States 14 266 0.8× 400 1.3× 180 1.0× 183 1.2× 87 0.6× 39 753

Countries citing papers authored by A. F. Schwartzman

Since Specialization
Citations

This map shows the geographic impact of A. F. Schwartzman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. F. Schwartzman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. F. Schwartzman more than expected).

Fields of papers citing papers by A. F. Schwartzman

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. F. Schwartzman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. F. Schwartzman. The network helps show where A. F. Schwartzman may publish in the future.

Co-authorship network of co-authors of A. F. Schwartzman

This figure shows the co-authorship network connecting the top 25 collaborators of A. F. Schwartzman. A scholar is included among the top collaborators of A. F. Schwartzman based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. F. Schwartzman. A. F. Schwartzman is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sinclair, Josiah, et al.. (2023). Degradation of Ta2O5 / SiO2 dielectric cavity mirrors in ultra-high vacuum. Optics Express. 31(24). 39670–39670. 2 indexed citations
2.
Park, Heechul, A. F. Schwartzman, Tzu‐Chieh Tang, Lei Wang, & Timothy K. Lu. (2022). Ultra-lightweight living structural material for enhanced stiffness and environmental sensing. Materials Today Bio. 18. 100504–100504. 4 indexed citations
3.
Raut, Hemant Kumar, A. F. Schwartzman, Fan Liu, et al.. (2020). Tough and Strong: Cross-Lamella Design Imparts Multifunctionality to Biomimetic Nacre. ACS Nano. 14(8). 9771–9779. 65 indexed citations
4.
Sheldon, Brian W., et al.. (2004). Chemistry-induced intrinsic stress variations during the chemical vapor deposition of polycrystalline diamond. Journal of Applied Physics. 96(6). 3531–3539. 15 indexed citations
5.
Jian, Kengqing, Hongsuk Shim, A. F. Schwartzman, Gregory P. Crawford, & Robert H. Hurt. (2003). Orthogonal Carbon Nanofibers by Template‐Mediated Assembly of Discotic Mesophase Pitch. Advanced Materials. 15(2). 164–167. 66 indexed citations
6.
Shenoy, V. B., A. F. Schwartzman, & L. B. Freund. (2001). Crack patterns in brittle thin films. International Journal of Fracture. 109(1). 29–45. 44 indexed citations
7.
Kisielowski, C., et al.. (2000). Aberration Corrected Lattice Imaging With Sub Ångstrom Resolution. Microscopy and Microanalysis. 6(S2). 16–17. 12 indexed citations
8.
Shenoy, Vivek B., A. F. Schwartzman, & L. B. Freund. (2000). Crack patterns in brittle thin films. International Journal of Fracture. 103(1). 1–17. 62 indexed citations
9.
Beresford, R., K. S. Stevens, & A. F. Schwartzman. (1998). Microstructure and composition of InAsN alloys grown by plasma-source molecular beam epitaxy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 16(3). 1293–1296. 21 indexed citations
10.
Stevens, K. S., et al.. (1997). Feasibility of the synthesis of AlAsN and GaAsN films by plasma-source molecular-beam epitaxy. Journal of Crystal Growth. 178(1-2). 45–55. 14 indexed citations
11.
Dobbins, Richard A., et al.. (1996). Carbonization Rate of Soot Precursor Particles. Combustion Science and Technology. 121(1-6). 103–121. 61 indexed citations
12.
Beresford, R., et al.. (1996). Material and Device Characteristics of MBE-Grown GaN Using a New rf Plasma Source. MRS Proceedings. 449. 10 indexed citations
13.
Stevens, K. S., Akira Ohtani, A. F. Schwartzman, & R. Beresford. (1994). Growth of group III nitrides on Si(111) by plasma-assisted molecular beam epitaxy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(2). 1186–1189. 26 indexed citations
14.
Schwartzman, A. F., et al.. (1992). Determination of the strain field from an HREM image of a Si lomer dislocation. Proceedings annual meeting Electron Microscopy Society of America. 50(1). 144–145. 1 indexed citations
15.
Paine, David C., et al.. (1991). Oxidation of Si1−xGex alloys at atmospheric and elevated pressure. Journal of Applied Physics. 70(9). 5076–5084. 96 indexed citations
16.
Schwartzman, A. F., et al.. (1991). Experimental Deformation Mechanics of Materials from their Near-Atomic-Resolution Defect Images. MRS Proceedings. 239. 10 indexed citations
17.
Schwartzman, A. F.. (1990). Misfit Dislocations at II-VI/GaAs Interfaces. MRS Proceedings. 183. 6 indexed citations
18.
Schwartzman, A. F. & Robert Sinclair. (1989). Hrem In Situ Annealing of the CdTe/GaAs Heterojunction. MRS Proceedings. 139. 4 indexed citations
19.
Sinclair, Ryan, et al.. (1988). The development ofin situhigh-resolution electron microscopy. Acta Crystallographica Section A Foundations of Crystallography. 44(6). 965–975. 55 indexed citations
20.
Wang, Fang, A. F. Schwartzman, Alan L. Fahrenbruch, et al.. (1987). Kinetics and oxide composition for thermal oxidation of cadmium telluride. Journal of Applied Physics. 62(4). 1469–1476. 47 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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