Wilfried Sigle
- Materials Chemistry top 1%
- Electronic, Optical and Magnetic Materials top 1%
- Electrical and Electronic Engineering top 2%
- Biomedical Engineering top 2%
- Atomic and Molecular Physics, and Optics top 5%
- Co-authors
- M. RühlePeter A. van AkenJoachim MaierZaoli ZhangXin GuoD. BrunnerChristoph T. KochSung Bo Lee
- Topics
- Electronic and Structural Properties of Oxides (56 papers)Electron and X-Ray Spectroscopy Techniques (34 papers)Semiconductor materials and devices (29 papers)
- Partner nations
- GermanyUnited StatesChina
In The Last Decade
Wilfried Sigle
189 papers receiving 4.9k citations
Peers
Comparison fields: 5 of 103
- Materials Chemistry 3.2k
- Electronic, Optical and Magnetic Materials 1.6k
- Electrical and Electronic Engineering 1.5k
- Biomedical Engineering 1.0k
- Atomic and Molecular Physics, and Optics 813
Countries citing papers authored by Wilfried Sigle
This map shows the geographic impact of Wilfried Sigle's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wilfried Sigle with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wilfried Sigle more than expected).
Fields of papers citing papers by Wilfried Sigle
This network shows the impact of papers produced by Wilfried Sigle. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wilfried Sigle. The network helps show where Wilfried Sigle may publish in the future.
Co-authorship network of co-authors of Wilfried Sigle
This figure shows the co-authorship network connecting the top 25 collaborators of Wilfried Sigle. A scholar is included among the top collaborators of Wilfried Sigle based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Wilfried Sigle. Wilfried Sigle is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 4 | |
| 2 | 8 | |
| 3 | 3 | |
| 4 | 3 | |
| 5 | 7 | |
| 6 | 4 | |
| 7 | 17 | |
| 8 | 50 | |
| 9 | 32 | |
| 10 | 47 | |
| 11 | 48 | |
| 12 | 18 | |
| 13 | 69 | |
| 14 | 65 | |
| 15 | 24 | |
| 16 | 68 | |
| 17 | 22 | |
| 18 | 27 | |
| 19 | 7 | |
| 20 | 25 |
About Wilfried Sigle
Wilfried Sigle is a scholar working on Structural Biology, Surfaces, Coatings and Films and Electronic, Optical and Magnetic Materials, having authored 194 papers that have together received 5.0k indexed citations. Recurring topics across this work include Electronic and Structural Properties of Oxides (56 papers), Electron and X-Ray Spectroscopy Techniques (34 papers) and Semiconductor materials and devices (29 papers). The work is most often cited by research in Structural Biology (301 citations), Electronic, Optical and Magnetic Materials (1.6k citations) and Materials Chemistry (3.2k citations). Wilfried Sigle has collaborated with scholars based in Germany, United States and China. Frequent co-authors include M. Rühle, Peter A. van Aken, Joachim Maier, Zaoli Zhang, Xin Guo, D. Brunner, Christoph T. Koch, Sung Bo Lee, Nahid Talebi and Ralf Vogelgesang. Their work appears in journals such as Science, Journal of the American Chemical Society and Physical Review Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.