E. Principe

833 total citations
24 papers, 670 citations indexed

About

E. Principe is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering. According to data from OpenAlex, E. Principe has authored 24 papers receiving a total of 670 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 13 papers in Surfaces, Coatings and Films and 8 papers in Biomedical Engineering. Recurrent topics in E. Principe's work include Electron and X-Ray Spectroscopy Techniques (13 papers), Semiconductor materials and devices (8 papers) and Advanced Electron Microscopy Techniques and Applications (7 papers). E. Principe is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (13 papers), Semiconductor materials and devices (8 papers) and Advanced Electron Microscopy Techniques and Applications (7 papers). E. Principe collaborates with scholars based in United States, United Kingdom and Czechia. E. Principe's co-authors include Beverley J. Inkson, Michael D. Uchic, Lorenz Holzer, Paul Munroe, Nicholas A. Yaraghi, Sanjit Bhowmick, Eric Hintsala, Joanna McKittrick, L. R. Sheppard and David Kisailus and has published in prestigious journals such as Advanced Materials, Langmuir and The Journal of Physical Chemistry C.

In The Last Decade

E. Principe

24 papers receiving 647 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
E. Principe United States 10 194 190 178 138 136 24 670
Xin Yan China 16 288 1.5× 149 0.8× 180 1.0× 75 0.5× 161 1.2× 64 748
Michael Daly United Kingdom 9 164 0.8× 97 0.5× 145 0.8× 78 0.6× 164 1.2× 20 545
Erik Poloni Switzerland 13 161 0.8× 101 0.5× 243 1.4× 55 0.4× 147 1.1× 27 578
Andrew Martin United States 17 376 1.9× 246 1.3× 307 1.7× 43 0.3× 195 1.4× 45 927
Roberto Martini Belgium 15 182 0.9× 348 1.8× 349 2.0× 148 1.1× 156 1.1× 34 779
Hideki Kakisawa Japan 16 209 1.1× 71 0.4× 237 1.3× 276 2.0× 270 2.0× 72 779
Rajaprakash Ramachandramoorthy Germany 15 342 1.8× 89 0.5× 187 1.1× 45 0.3× 251 1.8× 30 666
Huixin Wang China 16 152 0.8× 203 1.1× 164 0.9× 33 0.2× 123 0.9× 47 676
Stefano Signetti United Kingdom 16 343 1.8× 91 0.5× 163 0.9× 81 0.6× 174 1.3× 28 684
Xizhao Lu China 16 272 1.4× 108 0.6× 409 2.3× 87 0.6× 172 1.3× 33 641

Countries citing papers authored by E. Principe

Since Specialization
Citations

This map shows the geographic impact of E. Principe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Principe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Principe more than expected).

Fields of papers citing papers by E. Principe

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Principe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Principe. The network helps show where E. Principe may publish in the future.

Co-authorship network of co-authors of E. Principe

This figure shows the co-authorship network connecting the top 25 collaborators of E. Principe. A scholar is included among the top collaborators of E. Principe based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Principe. E. Principe is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kim, Steve, Fahima Ouchen, Daniel A. Fischer, et al.. (2017). Monitoring Deformation in Graphene Through Hyperspectral Synchrotron Spectroscopy to Inform Fabrication. The Journal of Physical Chemistry C. 121(29). 15653–15664. 3 indexed citations
2.
Grote, James G., Rajesh R. Naik, Andrew Williams, et al.. (2017). Strain and Bond Length Dynamics upon Growth and Transfer of Graphene by NEXAFS Spectroscopy from First-Principles and Experiment. Langmuir. 34(4). 1783–1794. 11 indexed citations
3.
Principe, E., Navid Asadizanjani, Domenic Forte, et al.. (2017). Plasma FIB Deprocessing of Integrated Circuits from the Backside. 19(4). 36–44. 3 indexed citations
4.
Yaraghi, Nicholas A., Nicolás Guarín‐Zapata, Lessa Kay Grunenfelder, et al.. (2016). Biocomposites: A Sinusoidally Architected Helicoidal Biocomposite (Adv. Mater. 32/2016). Advanced Materials. 28(32). 6769–6769. 9 indexed citations
5.
Yaraghi, Nicholas A., Nicolás Guarín‐Zapata, Lessa Kay Grunenfelder, et al.. (2016). A Sinusoidally Architected Helicoidal Biocomposite. Advanced Materials. 28(32). 6835–6844. 212 indexed citations
6.
Hovington, Pierre, Marin Lagacé, E. Principe, et al.. (2015). Direct and Indirect Observation of Lithium in a Scanning Electron Microscope; Not Only on Pure Li!. Microscopy and Microanalysis. 21(S3). 2357–2358. 3 indexed citations
7.
Schmidt, Ute, O. Hollricher, Wei Liu, & E. Principe. (2015). RISE Microscopy: Correlative Raman and SEM Imaging. Microscopy and Microanalysis. 21(S3). 17–18. 1 indexed citations
8.
Stevie, F. A., et al.. (2014). FIB‐SIMS quantification using TOF‐SIMS with Ar and Xe plasma sources. Surface and Interface Analysis. 46(S1). 285–287. 9 indexed citations
9.
Lifshin, Eric, et al.. (2005). Three dimensional imaging of microelectronic devices using a crossbeam FTB. 3–3. 1 indexed citations
10.
Principe, E., et al.. (2005). A Three Beam Approach to TEM Preparation Using In-situ Low Voltage Argon Ion Final Milling in a FIB-SEM Instrument. Microscopy and Microanalysis. 11(S02). 5 indexed citations
11.
Lifshin, Eric, et al.. (2004). Three Dimensional Imaging of Microelectronic Devices Using a CrossBeam FIB. Proceedings - International Symposium for Testing and Failure Analysis. 30873. 429–435. 5 indexed citations
12.
Lifshin, Eric, et al.. (2004). Considerations for Three Dimensional Imaging In the Crossbeam FIB. Microscopy and Microanalysis. 10(S02). 1134–1135. 1 indexed citations
13.
Diebold, Alain C., Brendan Foran, C. Kisielowski, et al.. (2003). Thin Dielectric Film Thickness Determination by Advanced Transmission Electron Microscopy. Microscopy and Microanalysis. 9(6). 493–508. 46 indexed citations
14.
Shallenberger, Jeffrey R., David A. Cole, Steven W. Novak, et al.. (2003). Oxide thickness determination by XPS, AES, SIMS, RBS and TEM. 1. 79–82. 17 indexed citations
15.
Principe, E., David G. Watson, & C. Kisielowski. (2002). Advancements in the characterization of "hyper-thin" oxynitride gate \ndielectrics through exit wave reconstruction HRTEM and XPS. eScholarship (California Digital Library). 1 indexed citations
16.
Kisielowski, C., E. Principe, Bert Freitag, & D. Hubert. (2001). Benefits of microscopy with super resolution. Physica B Condensed Matter. 308-310. 1090–1096. 20 indexed citations
17.
Cole, David A., Jeffrey R. Shallenberger, Steven W. Novak, et al.. (2000). SiO 2 thickness determination by x-ray photoelectron spectroscopy, Auger electron spectroscopy, secondary ion mass spectrometry, Rutherford backscattering, transmission electron microscopy, and ellipsometry. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 18(1). 440–444. 83 indexed citations
18.
Albin, Michael, et al.. (1998). Process Control for Optimal PCR Performance in Glass Microstructures. Biomedical Microdevices. 1(1). 65–70. 23 indexed citations
19.
20.
Principe, E. & Benjamín A. Shaw. (1997). Technical Note:Observations Regarding the Effects of Nitrogen Addition to the Aluminum-Tungsten System by Reactive Sputter Deposition. CORROSION. 53(9). 675–678. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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