C. H. Yu
Impact in
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- Industrial Vision Systems and Defect Detection
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- 3D IC and TSV technologies
- Electronic Packaging and Soldering Technologies
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- 3D IC and TSV technologies 14
- Electronic Packaging and Soldering Technologies 11
- Semiconductor materials and devices 4
- Advancements in Semiconductor Devices and Circuit Design 3
- Integrated Circuits and Semiconductor Failure Analysis 2
- Electromagnetic Compatibility and Noise Suppression 2
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- Copper Interconnects and Reliability 5
- Co-authors
- M.S. Liang (2 shared papers)Fu‐Hsiang Ko (1 shared paper)S.Y. Wu (1 shared paper)H. Lo (1 shared paper)A. S. Oates (1 shared paper)J.-C. Lin (1 shared paper)Doug C. H. Yu (5 shared papers)Chi‐Hua Tung (2 shared papers)
- Journals
- Science and Technology of Welding & Joining (1 paper)IMAPSource Proceedings (1 paper)
- Partner nations
- TaiwanUnited StatesBelgium
In The Last Decade
C. H. Yu
18 papers receiving 288 citations
Peers
Comparison fields: 5 of 30
- Industrial and Manufacturing Engineering 75
- Electrical and Electronic Engineering 212
- Statistics, Probability and Uncertainty 22
- Media Technology 24
- Automotive Engineering 20
Countries citing papers authored by C. H. Yu
This map shows the geographic impact of C. H. Yu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. H. Yu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. H. Yu more than expected).
Fields of papers citing papers by C. H. Yu
This network shows the impact of papers produced by C. H. Yu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. H. Yu. The network helps show where C. H. Yu may publish in the future.
Co-authors
The 25 scholars most cited alongside C. H. Yu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 84 | |
| 2 | 2009 | 34 | |
| 3 | 2007 | 28 | |
| 4 | 2006 | 27 | |
| 5 | 2013 | 23 | |
| 6 | 2011 | 18 | |
| 7 | 2001 | 16 | |
| 8 | 2011 | 15 | |
| 9 | 2015 | 12 | |
| 10 | 2012 | 12 | |
| 11 | 2021 | 11 | |
| 12 | 2012 | 9 | |
| 13 | 2007 | 3 | |
| 14 | 2008 | 2 | |
| 15 | 2008 | 2 | |
| 16 | 2008 | 1 | |
| 17 | 2012 | 1 | |
| 18 | 2013 | 1 |
About C. H. Yu
C. H. Yu is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Automotive Engineering, Mechanics of Materials and Mechanical Engineering, having authored 18 papers that have together received 299 indexed citations. Recurring topics across this work include 3D IC and TSV technologies (14 papers), Electronic Packaging and Soldering Technologies (11 papers), Copper Interconnects and Reliability (5 papers), Semiconductor materials and devices (4 papers), Additive Manufacturing and 3D Printing Technologies (3 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers) and Electromagnetic Compatibility and Noise Suppression (2 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (75 citations), Electrical and Electronic Engineering (212 citations), Statistics, Probability and Uncertainty (22 citations), Media Technology (24 citations) and Automotive Engineering (20 citations). C. H. Yu has collaborated with scholars based in Taiwan, United States and Belgium. Frequent co-authors include M.S. Liang, Fu‐Hsiang Ko, S.Y. Wu, H. Lo, A. S. Oates, J.-C. Lin, Doug C. H. Yu, Chi‐Hua Tung, W.C. Chiou and Hun-Hsien Chang. Their work appears in journals such as Science and Technology of Welding & Joining and IMAPSource Proceedings.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.