Scott McCann
- Electrical and Electronic Engineering
- Mechanical Engineering
- Mechanics of Materials
- Biomedical Engineering
- Computational Theory and Mathematics
- Co-authors
- Rao TummalaSuresh K. SitaramanAnh TranVenkatesh SundaramTimothy WildeyVanessa SmetYoichiro SatoGamal Refai-Ahmed
- Topics
- Electronic Packaging and Soldering Technologies (18 papers)3D IC and TSV technologies (16 papers)Advanced Multi-Objective Optimization Algorithms (5 papers)
- Cited by
- Electrical and Electronic EngineeringStatistics, Probability and UncertaintyComputational Theory and Mathematics
- Journals
- Structural and Multidisciplinary OptimizationJournal of Mechanical DesignIEEE Transactions on Device and Materials Reliability
- Partner nations
- United StatesJapanGermany
In The Last Decade
Scott McCann
26 papers receiving 288 citations
Peers
Comparison fields: 5 of 35
- Electrical and Electronic Engineering 206
- Mechanical Engineering 48
- Mechanics of Materials 44
- Biomedical Engineering 37
- Computational Theory and Mathematics 33
Countries citing papers authored by Scott McCann
This map shows the geographic impact of Scott McCann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Scott McCann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Scott McCann more than expected).
Fields of papers citing papers by Scott McCann
This network shows the impact of papers produced by Scott McCann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Scott McCann. The network helps show where Scott McCann may publish in the future.
Co-authorship network of co-authors of Scott McCann
This figure shows the co-authorship network connecting the top 25 collaborators of Scott McCann. A scholar is included among the top collaborators of Scott McCann based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Scott McCann. Scott McCann is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 13 | |
| 2 | 7 | |
| 3 | 1 | |
| 4 | 8 | |
| 5 | 1 | |
| 6 | 9 | |
| 7 | 7 | |
| 8 | 9 | |
| 9 | 25 | |
| 10 | 11 | |
| 11 | 35 | |
| 12 | 12 | |
| 13 | 5 | |
| 14 | 3 | |
| 15 | 2 | |
| 16 | 14 | |
| 17 | 12 | |
| 18 | 29 | |
| 19 | 23 | |
| 20 | 13 |
About Scott McCann
Scott McCann is a scholar working on Management Science and Operations Research, Metals and Alloys and Computational Theory and Mathematics, having authored 26 papers that have together received 306 indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (18 papers), 3D IC and TSV technologies (16 papers) and Advanced Multi-Objective Optimization Algorithms (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (206 citations), Statistics, Probability and Uncertainty (25 citations) and Computational Theory and Mathematics (33 citations). Scott McCann has collaborated with scholars based in United States, Japan and Germany. Frequent co-authors include Rao Tummala, Suresh K. Sitaraman, Anh Tran, Venkatesh Sundaram, Timothy Wildey, Vanessa Smet, Yoichiro Sato, Gamal Refai-Ahmed, Venky Sundaram and Bhupender Singh. Their work appears in journals such as Structural and Multidisciplinary Optimization, Journal of Mechanical Design and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.