Atsuro Nakano
- Electrical and Electronic Engineering top 5%
- Surfaces, Coatings and Films top 1%
- Biomedical Engineering top 10%
- Hardware and Architecture
- Polymers and Plastics
- Co-authors
- Takahiro KozawaSeiichi TagawaKazumasa OkamotoHiroki YamamotoHiroji KomanoTomoyuki AndoMitsuru SatôYukio Yamamoto
- Topics
- Advancements in Photolithography Techniques (13 papers)Integrated Circuits and Semiconductor Failure Analysis (7 papers)Electron and X-Ray Spectroscopy Techniques (6 papers)
- Journals
- Japanese Journal of Applied PhysicsJournal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and PhenomenaProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
- Partner nations
- Japan
In The Last Decade
Atsuro Nakano
13 papers receiving 683 citations
Peers
Comparison fields: 5 of 19
- Electrical and Electronic Engineering 678
- Surfaces, Coatings and Films 381
- Biomedical Engineering 272
- Hardware and Architecture 14
- Polymers and Plastics 11
Countries citing papers authored by Atsuro Nakano
This map shows the geographic impact of Atsuro Nakano's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Atsuro Nakano with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Atsuro Nakano more than expected).
Fields of papers citing papers by Atsuro Nakano
This network shows the impact of papers produced by Atsuro Nakano. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Atsuro Nakano. The network helps show where Atsuro Nakano may publish in the future.
Co-authorship network of co-authors of Atsuro Nakano
This figure shows the co-authorship network connecting the top 25 collaborators of Atsuro Nakano. A scholar is included among the top collaborators of Atsuro Nakano based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Atsuro Nakano. Atsuro Nakano is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 70 | |
| 2 | 46 | |
| 3 | 14 | |
| 4 | 14 | |
| 5 | 26 | |
| 6 | 16 | |
| 7 | 124 | |
| 8 | 161 | |
| 9 | 30 | |
| 10 | 40 | |
| 11 | 57 | |
| 12 | 27 | |
| 13 | 62 |
About Atsuro Nakano
Atsuro Nakano is a scholar working on Surfaces, Coatings and Films, Radiation and Electrical and Electronic Engineering, having authored 13 papers that have together received 687 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (13 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Electron and X-Ray Spectroscopy Techniques (6 papers). The work is most often cited by research in Surfaces, Coatings and Films (381 citations), Electrical and Electronic Engineering (678 citations) and Biomedical Engineering (272 citations). Atsuro Nakano has collaborated with scholars based in Japan. Frequent co-authors include Takahiro Kozawa, Seiichi Tagawa, Kazumasa Okamoto, Hiroki Yamamoto, Hiroji Komano, Tomoyuki Ando, Mitsuru Satô, Yukio Yamamoto, Toshiyuki Kai and Tsutomu Shimokawa. Their work appears in journals such as Japanese Journal of Applied Physics, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.