Alfred L. Crouch

539 total citations
34 papers, 385 citations indexed

About

Alfred L. Crouch is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, Alfred L. Crouch has authored 34 papers receiving a total of 385 indexed citations (citations by other indexed papers that have themselves been cited), including 31 papers in Hardware and Architecture, 30 papers in Electrical and Electronic Engineering and 9 papers in Control and Systems Engineering. Recurrent topics in Alfred L. Crouch's work include Integrated Circuits and Semiconductor Failure Analysis (27 papers), VLSI and Analog Circuit Testing (26 papers) and Engineering and Test Systems (9 papers). Alfred L. Crouch is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (27 papers), VLSI and Analog Circuit Testing (26 papers) and Engineering and Test Systems (9 papers). Alfred L. Crouch collaborates with scholars based in United States, United Kingdom and Portugal. Alfred L. Crouch's co-authors include B. Pouya, Jeff Rearick, Bill Eklow, Magdy S. Abadir, R. Raina, Jennifer Dworak, Kundan Nepal, G. J. Young, Ping Gui and Theodore W. Manikas and has published in prestigious journals such as IEEE Transactions on Emerging Topics in Computing, IEEE Instrumentation & Measurement Magazine and IEEE Design and Test.

In The Last Decade

Alfred L. Crouch

30 papers receiving 335 citations

Peers

Alfred L. Crouch

HA

EEE

CSE

BE

CNC

H. Hashempour United States

Jeff Rearick United States

G. Hetherington United States

Kuo-Liang Cheng Taiwan

Tomokazu Yoneda Japan

D. Appello Italy

Sreejit Chakravarty United States

Saman Adham Canada

Teresa McLaurin United States

Mariane Comte France

H. Hashempour United States

Alfred L. Crouch

278 ×0.8

HA

392 ×1.1

EEE

28 ×0.5

CSE

50 ×2.6

BE

15 ×1.3

CNC

Citations per year, relative to Alfred L. Crouch Alfred L. Crouch (= 1×) peers H. Hashempour

Countries citing papers authored by Alfred L. Crouch

Since Specialization

Citations

This map shows the geographic impact of Alfred L. Crouch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alfred L. Crouch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alfred L. Crouch more than expected).

Fields of papers citing papers by Alfred L. Crouch

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Alfred L. Crouch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alfred L. Crouch. The network helps show where Alfred L. Crouch may publish in the future.

Co-authorship network of co-authors of Alfred L. Crouch

This figure shows the co-authorship network connecting the top 25 collaborators of Alfred L. Crouch. A scholar is included among the top collaborators of Alfred L. Crouch based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Alfred L. Crouch. Alfred L. Crouch is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

1.

Dworak, Jennifer, et al.. (2020). 3D Ring Oscillator Based Test Structures to Detect a Trojan Die in a 3D Die Stack in the Presence of Process Variations. IEEE Transactions on Emerging Topics in Computing. 9(2). 774–786. 3 indexed citations

2.

Crouch, Alfred L., et al.. (2020). A role for embedded instrumentation in real-time hardware assurance and online monitoring against cybersecurity threats. IEEE Instrumentation & Measurement Magazine. 23(5). 27–32. 1 indexed citations

3.

Crouch, Alfred L., et al.. (2019). P1687.1: Accessing Embedded 1687 Instruments using Alternate Device Interfaces other than JTAG. 1–7. 3 indexed citations

4.

Crouch, Alfred L., Peter Levin, Jennifer Dworak, et al.. (2019). Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. 1–1.

5.

Crouch, Alfred L., et al.. (2018). Enabling Hardware Trojan Detection and Prevention through Emulation. 1–5. 1 indexed citations

6.

Dworak, Jennifer, et al.. (2017). Detecting a trojan die in 3D stacked integrated circuits. 1–6. 9 indexed citations

7.

Crouch, Alfred L., et al.. (2013). BA-BIST: Board test from inside the IC out. 1–1.

8.

Crouch, Alfred L., et al.. (2008). The Advantages of Limiting P1687 to a Restricted Subset. 1–8. 6 indexed citations

9.

Crouch, Alfred L., et al.. (2007). Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip. 1–10. 17 indexed citations

10.

Crouch, Alfred L.. (2007). IJTAG: The path to organized instrument connectivity. 1–10. 15 indexed citations

11.

Crouch, Alfred L., et al.. (2006). Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks. 1–8. 14 indexed citations

12.

Rearick, Jeff, et al.. (2006). IJTAG (Internal JTAG): A Step Toward a DFT Standard. 808–815. 40 indexed citations

13.

Crouch, Alfred L.. (2005). Future trends in test: the adoption and use of low cost structural testers. 698–703. 3 indexed citations

14.

Crouch, Alfred L.. (2005). Debugging and Diagnosing Scan Chains. 7(1). 16–24. 18 indexed citations

15.

Crouch, Alfred L., et al.. (2003). AC scan path selection for physical debugging. IEEE Design & Test of Computers. 20(5). 34–40. 18 indexed citations

16.

Crouch, Alfred L., et al.. (2002). A case study of the test development for the 2nd generation ColdFire/sup R/ microprocessors. 20. 424–432. 11 indexed citations

17.

Raina, R., et al.. (2001). Very low cost testers: Opportunities and challenges. IEEE Design & Test of Computers. 18(5). 60–69. 25 indexed citations

18.

Crouch, Alfred L.. (2000). Position Statement: DFT Focused Testers. International Test Conference. 1121. 1 indexed citations

19.

Crouch, Alfred L.. (1999). Design-for-Test for Digital IC's and Embedded Core Systems. Medical Entomology and Zoology. 73 indexed citations

20.

Crouch, Alfred L., et al.. (1998). Test development for second-generation ColdFire microprocessors. IEEE Design & Test of Computers. 15(3). 70–76. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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