Mariane Comte

486 total citations
48 papers, 324 citations indexed

About

Mariane Comte is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering. According to data from OpenAlex, Mariane Comte has authored 48 papers receiving a total of 324 indexed citations (citations by other indexed papers that have themselves been cited), including 44 papers in Electrical and Electronic Engineering, 34 papers in Hardware and Architecture and 6 papers in Biomedical Engineering. Recurrent topics in Mariane Comte's work include VLSI and Analog Circuit Testing (34 papers), Integrated Circuits and Semiconductor Failure Analysis (24 papers) and VLSI and FPGA Design Techniques (8 papers). Mariane Comte is often cited by papers focused on VLSI and Analog Circuit Testing (34 papers), Integrated Circuits and Semiconductor Failure Analysis (24 papers) and VLSI and FPGA Design Techniques (8 papers). Mariane Comte collaborates with scholars based in France, Germany and United States. Mariane Comte's co-authors include M. Renovell, F. Azaı̈s, Serge Bernard, Vincent Kerzérho, Ilia Polian, Giorgio Di Natale, Aida Todri‐Sanial, Patrick Girard, Bernd Becker and Saraju P. Mohanty and has published in prestigious journals such as IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Transactions on Nanotechnology and Journal of Electronic Testing.

In The Last Decade

Mariane Comte

41 papers receiving 321 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Mariane Comte France	9	273	235	35	31	30	48	324
Mohsen Raji Iran	10	254 0.9×	135 0.6×	20 0.6×	25 0.8×	33 1.1×	49	295
Debjit Sinha United States	11	348 1.3×	281 1.2×	27 0.8×	11 0.4×	64 2.1×	37	425
H. Hashempour United States	12	392 1.4×	278 1.2×	50 1.4×	12 0.4×	15 0.5×	32	412
Yiorgos Tsiatouhas Greece	11	603 2.2×	323 1.4×	85 2.4×	14 0.5×	26 0.9×	113	631
Wilfred Gomes United States	8	194 0.7×	76 0.3×	31 0.9×	19 0.6×	73 2.4×	13	273
Rob Aitken United States	6	356 1.3×	190 0.8×	42 1.2×	17 0.5×	104 3.5×	20	451
Engín Afacan Türkiye	11	365 1.3×	103 0.4×	54 1.5×	59 1.9×	7 0.2×	52	413
Josie E. Rodriguez Condia Italy	9	227 0.8×	182 0.8×	11 0.3×	43 1.4×	49 1.6×	52	282
Milovan Blagojević United States	10	237 0.9×	143 0.6×	51 1.5×	24 0.8×	83 2.8×	12	320
Jaeduk Han South Korea	11	423 1.5×	115 0.5×	79 2.3×	15 0.5×	36 1.2×	63	467

Countries citing papers authored by Mariane Comte

Since Specialization

Citations

This map shows the geographic impact of Mariane Comte's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mariane Comte with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mariane Comte more than expected).

Fields of papers citing papers by Mariane Comte

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Mariane Comte. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mariane Comte. The network helps show where Mariane Comte may publish in the future.

Co-authorship network of co-authors of Mariane Comte

This figure shows the co-authorship network connecting the top 25 collaborators of Mariane Comte. A scholar is included among the top collaborators of Mariane Comte based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Mariane Comte. Mariane Comte is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Champac, Victor, et al.. (2024). Cost-Effective Analytical Models of Resistive Opens Defects in FinFET Technology. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 33(3). 841–852.

Azaı̈s, F., et al.. (2020). Implementing indirect test of RF circuits without compromising test quality: a practical case study. HAL (Le Centre pour la Communication Scientifique Directe). 3 indexed citations

Azaı̈s, F., et al.. (2019). Use of ensemble methods for indirect test of RF circuits: can it bring benefits?. HAL (Le Centre pour la Communication Scientifique Directe). 1–6. 14 indexed citations

Azaı̈s, F., et al.. (2018). Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies. HAL (Le Centre pour la Communication Scientifique Directe). 1–5. 1 indexed citations

Todri‐Sanial, Aida, et al.. (2015). Proceedings of IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2015). HAL (Le Centre pour la Communication Scientifique Directe). 51 indexed citations

Azaı̈s, F., et al.. (2014). Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. Microelectronics Journal. 45(3). 336–344. 1 indexed citations

Aparicio, Manuel, et al.. (2013). MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. HAL (Le Centre pour la Communication Scientifique Directe). 177–182. 9 indexed citations

Comte, Mariane, et al.. (2013). Accurate and efficient analytical electrical model of antenna for NFC applications. HAL (Le Centre pour la Communication Scientifique Directe). 5. 1–4. 1 indexed citations

Comte, Mariane, F. Azaı̈s, Yves Bertrand, et al.. (2012). An IR-Drop Simulation Principle Oriented to Delay Testing. 404–409. 1 indexed citations

10.

Bernard, Serge, et al.. (2010). Adaptive LUT-based system for in situ ADC auto-correction. 17. 1–6. 2 indexed citations

11.

Kerzérho, Vincent, et al.. (2009). A multi-converter DFT technique for complex SIP: Concepts and validation. 747–750. 2 indexed citations

12.

Comte, Mariane, et al.. (2009). An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. HAL (Le Centre pour la Communication Scientifique Directe). 21–26. 1 indexed citations

13.

Polian, Ilia, et al.. (2008). A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. 113–118. 45 indexed citations

14.

Kerzérho, Vincent, et al.. (2007). Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Computers & Digital Techniques. 1(3). 146–153.

15.

Renovell, M., et al.. (2006). Analyzing the memory effect of resistive open in CMOS random logic. 251–256. 4 indexed citations

16.

Bernard, Serge, et al.. (2006). A Novel DFT Technique to Test a Complete Set of ADC's and DAC's Embedded in a Complex SiP. 1 indexed citations

17.

Kerzérho, Vincent, et al.. (2006). A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs. IEEE Design & Test of Computers. 23(3). 234–243. 12 indexed citations

18.

Azaı̈s, F., Serge Bernard, Yves Bertrand, Mariane Comte, & M. Renovell. (2004). Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. Journal of Electronic Testing. 20(4). 375–387. 3 indexed citations

19.

Bernard, Serge, Mariane Comte, F. Azaı̈s, Yves Bertrand, & M. Renovell. (2004). Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. Journal of Electronic Testing. 20(3). 257–267. 5 indexed citations

20.

Bernard, Serge, F. Azaı̈s, Mariane Comte, Yves Bertrand, & M. Renovell. (2003). Automatic Generation of LH-BIST Architecture for ADC Testing. HAL (Le Centre pour la Communication Scientifique Directe). 7–12. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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