Yu. A. Vainer
Impact in
- Radiation top 5%
- Advanced X-ray Imaging Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
Papers in
- Radiation 10
- Advanced X-ray Imaging Techniques 9
- X-ray Spectroscopy and Fluorescence Analysis 4
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- Surface Roughness and Optical Measurements 8
- Ion-surface interactions and analysis 7
- Co-authors
- Н. Н. СалащенкоН. И. ЧхалоА. Е. ПестовМ. V. ZorinaВ. Н. ПолковниковS. Yu. ZuevМ. В. СвечниковС. А. Гусев
In The Last Decade
Yu. A. Vainer
33 papers receiving 410 citations
Peers
Comparison fields: 5 of 41
- Radiation 125
- Surfaces, Coatings and Films 78
- Computational Mechanics 163
- Structural Biology 7
- Biomedical Engineering 189
Countries citing papers authored by Yu. A. Vainer
This map shows the geographic impact of Yu. A. Vainer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yu. A. Vainer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yu. A. Vainer more than expected).
Fields of papers citing papers by Yu. A. Vainer
This network shows the impact of papers produced by Yu. A. Vainer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yu. A. Vainer. The network helps show where Yu. A. Vainer may publish in the future.
Co-authors
The 25 scholars most cited alongside Yu. A. Vainer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 1 | |
| 2 | 2022 | 3 | |
| 3 | 2020 | 5 | |
| 4 | 2019 | 1 | |
| 5 | 2018 | 36 | |
| 6 | 2018 | 16 | |
| 7 | 2017 | 46 | |
| 8 | 2014 | 2 | |
| 9 | 2013 | 3 | |
| 10 | 2013 | 3 | |
| 11 | 2013 | 7 | |
| 12 | 2012 | 3 | |
| 13 | 2011 | 9 | |
| 14 | 2011 | 1 | |
| 15 | 2011 | 27 | |
| 16 | 2010 | 1 | |
| 17 | 2010 | 10 | |
| 18 | 2009 | 33 | |
| 19 | 2007 | 2 | |
| 20 | 2005 | 37 |
About Yu. A. Vainer
Yu. A. Vainer is a scholar working on Radiation, Computational Mechanics, Surfaces, Coatings and Films, Condensed Matter Physics and Biomedical Engineering, having authored 33 papers that have together received 455 indexed citations. Recurring topics across this work include Advanced Surface Polishing Techniques (14 papers), Advanced X-ray Imaging Techniques (9 papers), Surface Roughness and Optical Measurements (8 papers), Ion-surface interactions and analysis (7 papers), Metal and Thin Film Mechanics (5 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), X-ray Spectroscopy and Fluorescence Analysis (4 papers) and Crystallography and Radiation Phenomena (4 papers). The work is most often cited by research in Radiation (125 citations), Surfaces, Coatings and Films (78 citations), Computational Mechanics (163 citations), Structural Biology (7 citations) and Biomedical Engineering (189 citations). Yu. A. Vainer has collaborated with scholars based in Russia, Germany and France. Frequent co-authors include Н. Н. Салащенко, Н. И. Чхало, А. Е. Пестов, М. V. Zorina, В. Н. Полковников, S. Yu. Zuev, М. В. Свечников, Н. И. Чхало, С. А. Гусев and B. A. Gribkov. Their work appears in journals such as Optics Express, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, Thin Solid Films, AIP Advances and Journal of X-Ray Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.