В. И. Лучин

476 total citations
35 papers, 352 citations indexed

About

В. И. Лучин is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Mechanics of Materials. According to data from OpenAlex, В. И. Лучин has authored 35 papers receiving a total of 352 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 11 papers in Surfaces, Coatings and Films and 9 papers in Mechanics of Materials. Recurrent topics in В. И. Лучин's work include Electron and X-Ray Spectroscopy Techniques (8 papers), Advancements in Photolithography Techniques (6 papers) and Semiconductor materials and interfaces (6 papers). В. И. Лучин is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (8 papers), Advancements in Photolithography Techniques (6 papers) and Semiconductor materials and interfaces (6 papers). В. И. Лучин collaborates with scholars based in Russia, China and Netherlands. В. И. Лучин's co-authors include S. V. Gaponov, A. Ya. Lopatin, Н. Н. Салащенко, Н. Н. Цыбин, Н. И. Чхало, E. B. Kluenkov, М. Н. Дроздов, S. Yu. Zuev, А. Е. Пестов and Н. И. Чхало and has published in prestigious journals such as Thin Solid Films, Applied Physics A and Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment.

In The Last Decade

В. И. Лучин

32 papers receiving 323 citations

Peers

В. И. Лучин

EEE

SCF

E. B. Kluenkov Russia

John P. Lehan United States

Mónica Fernández-Perea Spain

A. Ya. Lopatin Russia

Peter Gawlitza Germany

Н. Н. Цыбин Russia

Paola Zuppella Italy

Yurii P. Pershin Ukraine

A. N. Nechay Russia

Alain Jody Corso Italy

E. B. Kluenkov Russia

В. И. Лучин

136 ×1.0

EEE

51 ×0.5

79 ×1.0

78 ×1.0

SCF

71 ×0.9

Citations per year, relative to В. И. Лучин В. И. Лучин (= 1×) peers E. B. Kluenkov

Countries citing papers authored by В. И. Лучин

Since Specialization

Citations

This map shows the geographic impact of В. И. Лучин's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by В. И. Лучин with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites В. И. Лучин more than expected).

Fields of papers citing papers by В. И. Лучин

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by В. И. Лучин. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by В. И. Лучин. The network helps show where В. И. Лучин may publish in the future.

Co-authorship network of co-authors of В. И. Лучин

This figure shows the co-authorship network connecting the top 25 collaborators of В. И. Лучин. A scholar is included among the top collaborators of В. И. Лучин based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with В. И. Лучин. В. И. Лучин is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Чхало, Н. И., М. Н. Дроздов, A. Ya. Lopatin, et al.. (2023). Study of the temporal stability of the reflection coefficient in the vicinity of 58.4 nm of narrow-band Sc/Al mirrors with Si or ScN interlayers and a MoSi2 protective cap layer. Thin Solid Films. 783. 140047–140047.

Zuev, S. Yu., A. Ya. Lopatin, В. И. Лучин, et al.. (2023). Protective Free-Standing Films for Projection Lithography Installations in the Extreme UV Range. Russian Microelectronics. 52(5). 344–355. 1 indexed citations

Zuev, S. Yu., A. Ya. Lopatin, В. И. Лучин, et al.. (2023). Comparative Study of the Thermal Stability of Be-Based Extreme Ultraviolet Pellicles. Technical Physics. 68(S3). S630–S636. 1 indexed citations

Лучин, В. И., et al.. (2022). Search for high-strength multilayer free-standing film filters with high transmittance in the wavelength range of the "water window" (2.3-4.4 nm). Журнал технической физики. 92(8). 949–949.

Zuev, S. Yu., A. Ya. Lopatin, В. И. Лучин, et al.. (2020). Prospects for the Use of X-Ray Tubes with a Field-Emission Cathode and a Through-Type Anode in the Range of Soft X-Ray Radiation. Technical Physics. 65(11). 1726–1735. 2 indexed citations

Лучин, В. И., et al.. (2019). Исследование оптических, механических и термических свойств свободновисящих пленок на основе нанокомпозитных материалов MoSi-=SUB=-2-=/SUB=-N-=SUB=-x-=/SUB=- и ZrSi-=SUB=-2-=/SUB=-N-=SUB=-y-=/SUB=-. Журнал технической физики. 89(11). 1680–1680. 1 indexed citations

Чхало, Н. И., М. Н. Дроздов, E. B. Kluenkov, et al.. (2016). Thin film multilayer filters for solar EUV telescopes. Applied Optics. 55(17). 4683–4683. 30 indexed citations

Гусев, С. А., М. Н. Дроздов, E. B. Kluenkov, et al.. (2012). Thermal stability of a freestanding EUV filter under long-term vacuum annealing at 700–1000°C. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 6(3). 482–486. 3 indexed citations

Lopatin, A. Ya., В. И. Лучин, Н. Н. Салащенко, et al.. (2010). New focusing multilayer structures for X-ray and VUV plasma spectroscopy. Technical Physics. 55(7). 1018–1023. 4 indexed citations

10.

Дроздов, М. Н., Yu. N. Drozdov, E. B. Kluenkov, et al.. (2010). SIMS study of annealing effect on element distribution in free-standing Al/Si and Zr/ZrSi2 multilayer films. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 4(3). 405–410. 1 indexed citations

11.

Чхало, Н. И., С. А. Гусев, М. Н. Дроздов, et al.. (2009). Influence of annealing on the structural and optical properties of thin multilayer EUV filters containing Zr, Mo, and silicides of these metals. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7521. 752105–752105. 10 indexed citations

12.

Kuzin, S. V., S. V. Shestov, A. A. Pertsov, et al.. (2008). Spectral calibration of filters and detectors of solar telescope at a wavelength of 13.2 nm for the TESIS project. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 2(4). 527–530. 3 indexed citations

13.

Казаков, Е. Д., et al.. (2008). New focusing multilayer structures for X-ray plasma spectroscopy. Quantum Electronics. 38(2). 169–171. 3 indexed citations

14.

Andreev, S. S., Н. И. Чхало, A. Ya. Lopatin, et al.. (2005). Application of free-standing multilayer films as polarizers for X-ray radiation. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 543(1). 340–345. 17 indexed citations

15.

Lopatin, A. Ya., et al.. (2000). PMMA-based resists for a spectral range near 13 nm. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 448(1-2). 487–492. 7 indexed citations

16.

Дроздов, М. Н., S. V. Gaponov, С. А. Гусев, et al.. (1999). Y-Ba-Cu-O thin films composition formation during magnetron sputtering. IEEE Transactions on Applied Superconductivity. 9(2). 2371–2374. 5 indexed citations

17.

Gaponov, S. V., et al.. (1995). Mechanisms of melt droplets and solid-particle ejection from a target surface by pulsed laser action. Applied Physics A. 61(1). 81–86. 98 indexed citations

18.

Gaponov, S. V., et al.. (1982). Processes occurring in an erosion plasma during laser vacuum deposition of films. I. Properties of a laser erosion plasma in the inertial-expansion stage. 3 indexed citations

19.

Gaponov, S. V., et al.. (1980). Relationship between the properties of the flare of a CO/sub 2/ laser plasma and the electronic structure of the target atoms. 1 indexed citations

20.

Ковалев, И. Д., et al.. (1976). Possible chemical analysis of microscopic regions with a laser mass spectrometer. Technical Physics Letters. 2. 356. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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