Werner Smekal

912 total citations
27 papers, 737 citations indexed

About

Werner Smekal is a scholar working on Surfaces, Coatings and Films, Radiation and Electrical and Electronic Engineering. According to data from OpenAlex, Werner Smekal has authored 27 papers receiving a total of 737 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Surfaces, Coatings and Films, 24 papers in Radiation and 16 papers in Electrical and Electronic Engineering. Recurrent topics in Werner Smekal's work include Electron and X-Ray Spectroscopy Techniques (27 papers), X-ray Spectroscopy and Fluorescence Analysis (24 papers) and Advancements in Photolithography Techniques (11 papers). Werner Smekal is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (27 papers), X-ray Spectroscopy and Fluorescence Analysis (24 papers) and Advancements in Photolithography Techniques (11 papers). Werner Smekal collaborates with scholars based in Austria, United States and Italy. Werner Smekal's co-authors include Wolfgang Werner, C. J. Powell, H. Störi, C. Tomastik, A. Ruocco, G. Stefani, F. Offi, H. Winter, A. Jabłoński and Francesc Salvat–Pujol and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Physical Review B.

In The Last Decade

Werner Smekal

27 papers receiving 726 citations

Peers

Countries citing papers authored by Werner Smekal

Since Specialization

Citations

This map shows the geographic impact of Werner Smekal's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Werner Smekal with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Werner Smekal more than expected).

Fields of papers citing papers by Werner Smekal

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Werner Smekal. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Werner Smekal. The network helps show where Werner Smekal may publish in the future.

Co-authorship network of co-authors of Werner Smekal

This figure shows the co-authorship network connecting the top 25 collaborators of Werner Smekal. A scholar is included among the top collaborators of Werner Smekal based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Werner Smekal. Werner Smekal is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA), SRD 100, Version 2.1 2017 ·Wolfgang Werner, Werner Smekal, C. J. Powell	6
2	Sample-morphology effects on x-ray photoelectron peak intensities. III. Simulated spectra of model core–shell nanoparticles 2015 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·C. J. Powell, (unknown), Wolfgang Werner, Werner Smekal	4
3	Interlaboratory study comparing analyses of simulated angle‐resolved X‐ray photoelectron spectroscopy data 2014 ·Surface and Interface Analysis ·(unknown), Wolfgang Werner, Werner Smekal, C. J. Powell	2
4	Interpretation of nanoparticle X-ray photoelectron intensities 2014 ·Applied Physics Letters ·Wolfgang Werner, (unknown), Werner Smekal, C. J. Powell	29
5	Simulation of Electron Spectra for Surface Analysis (SESSA)for quantitative interpretation of (hard) X-ray photoelectron spectra(HAXPES) 2013 ·Journal of Electron Spectroscopy and Related Phenomena ·Wolfgang Werner, Werner Smekal, (unknown), (unknown), C. J. Powell	19
6	Sample-morphology effects on x-ray photoelectron peak intensities 2013 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·C. J. Powell, S. Tougaard, Wolfgang Werner, Werner Smekal	18
7	Secondary-electron emission induced byin vacuosurface excitations near a polycrystalline Al surface 2013 ·Physical Review B ·Wolfgang Werner, Francesc Salvat–Pujol, (unknown), (unknown), Werner Smekal, (unknown), A. Ruocco, G. Stefani	21
8	Angular dependence of electron induced surface plasmon excitation 2011 ·Applied Physics Letters ·Wolfgang Werner, Werner Smekal, Francesc Salvat–Pujol, (unknown), (unknown), (unknown), Christoph Eisenmenger‐Sittner	6
9	Contribution of surface plasmon decay to secondary electron emission from an Al surface 2011 ·Applied Physics Letters ·Wolfgang Werner, Francesc Salvat–Pujol, Werner Smekal, (unknown), F. Aumayr, H. Störi, A. Ruocco, G. Stefani	22
10	Effects of elastic scattering and analyzer‐acceptance angle on the analysis of angle‐resolved X‐ray photoelectron spectroscopy data 2010 ·Surface and Interface Analysis ·C. J. Powell, Wolfgang Werner, Werner Smekal	10
11	Simulation of parallel angle‐resolved X‐ray photoelectron spectroscopy data 2010 ·Surface and Interface Analysis ·(unknown), Wolfgang Werner, Werner Smekal, C. J. Powell	5
12	Role of surface and bulk plasmon decay in secondary electron emission 2008 ·Physical Review B ·Wolfgang Werner, A. Ruocco, F. Offi, S. Iacobucci, Werner Smekal, H. Winter, G. Stefani	43
13	Comparison of hard and soft x-ray photoelectron spectra of silicon 2007 ·Physical Review B ·F. Offi, Wolfgang Werner, M. Sacchi, Piero Torelli, Marco Cautero, G. Cautero, A. Fondacaro, Simo Huotari, G. Monaco, G. Paolicelli, Werner Smekal, G. Stefani, G. Panaccione	10
14	Distinguishability of N Composition Profiles In SiON Films On Si By Angle-Resolved X-ray Photoelectron Spectroscopy 2007 ·AIP conference proceedings ·C. J. Powell, Wolfgang Werner, Werner Smekal, David G. Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M. Secula	1
15	Refined calculations of effective attenuation lengths for SiO2 film thicknesses by x-ray photoelectron spectroscopy 2006 ·Applied Physics Letters ·C. J. Powell, Wolfgang Werner, Werner Smekal	14
16	Distinguishability of N composition profiles in SiON films on Si by angle-resolved x-ray photoelectron spectroscopy 2006 ·Applied Physics Letters ·C. J. Powell, Wolfgang Werner, Werner Smekal	18
17	Emission-Depth-Selective Auger Photoelectron Coincidence Spectroscopy 2005 ·Physical Review Letters ·Wolfgang Werner, Werner Smekal, H. Störi, H. Winter, G. Stefani, A. Ruocco, F. Offi, R. Gotter, A. Morgante, F. Tommasini	52
18	Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger‐electron spectroscopy and X‐ray photoelectron spectroscopy 2005 ·Surface and Interface Analysis ·Werner Smekal, Wolfgang Werner, C. J. Powell	215
19	Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy 2004 ·Applied Surface Science ·C. J. Powell, A. Jabłoński, Wolfgang Werner, Werner Smekal	40
20	Angular dependence of the surface excitation probability for medium energy electrons backscattered from Al and Si surfaces 2001 ·Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·Wolfgang Werner, Werner Smekal, H. Störi, (unknown)	22

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact