W. Reuter
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 17
- Computational Mechanics top 2%
- Ion-surface interactions and analysis 20
- Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis 10
- Nuclear Physics and Applications 7
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- Integrated Circuits and Semiconductor Failure Analysis 4
- Materials Chemistry top 10%
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- Advanced Materials Characterization Techniques 5
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- Analytical chemistry methods development 5
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- Metal and Thin Film Mechanics 4
- Journals
- Applied Physics Letters (6 papers)Journal of Applied Physics (11 papers)Analytical Chemistry (6 papers)
- Partner nations
- United StatesGermanyItaly
In The Last Decade
W. Reuter
48 papers receiving 1.1k citations
Peers
Comparison fields: 5 of 79
- Surfaces, Coatings and Films 276
- Computational Mechanics 454
- Radiation 187
- Electrical and Electronic Engineering 642
- Materials Chemistry 498
Countries citing papers authored by W. Reuter
This map shows the geographic impact of W. Reuter's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Reuter with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Reuter more than expected).
Fields of papers citing papers by W. Reuter
This network shows the impact of papers produced by W. Reuter. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Reuter. The network helps show where W. Reuter may publish in the future.
Co-authorship network
The 25 scholars most cited alongside W. Reuter, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1998 | 11 | |
| 2 | 1991 | 4 | |
| 3 | 1988 | 32 | |
| 4 | 1988 | 8 | |
| 5 | 1988 | 32 | |
| 6 | 1986 | 46 | |
| 7 | 1983 | 10 | |
| 8 | 1981 | 43 | |
| 9 | 1981 | 12 | |
| 10 | 1981 | 1 | |
| 11 | 1981 | 10 | |
| 12 | 1981 | 10 | |
| 13 | 1981 | 40 | |
| 14 | 1980 | 16 | |
| 15 | 1980 | 23 | |
| 16 | 1979 | 5 | |
| 17 | 1976 | 17 | |
| 18 | 1974 | 4 | |
| 19 | 1971 | 105 | |
| 20 | 1969 | 27 |
About W. Reuter
W. Reuter is a scholar working on Surfaces, Coatings and Films, Radiation and Computational Mechanics, having authored 50 papers that have together received 1.3k indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (20 papers), Electron and X-Ray Spectroscopy Techniques (17 papers), X-ray Spectroscopy and Fluorescence Analysis (10 papers), Nuclear Physics and Applications (7 papers), Advanced Materials Characterization Techniques (5 papers), Analytical chemistry methods development (5 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Metal and Thin Film Mechanics (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (276 citations), Computational Mechanics (454 citations) and Radiation (187 citations). W. Reuter has collaborated with scholars based in United States, Germany and Italy. Frequent co-authors include Ming L. Yu, K. Wittmaack, A. Onton, Michael Lorenz, Allen Lurio, P. Leary, J. J. Cuomo, A. Wucher, F. Cardone and J. F. Ziegler. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Analytical Chemistry.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.