M. Fallavier
- Computational Mechanics top 1%
- Ion-surface interactions and analysis 34
- Radiation top 2%
- Nuclear Physics and Applications 12
- X-ray Spectroscopy and Fluorescence Analysis 12
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 10
- Polymers and Plastics top 10%
- Materials Chemistry top 10%
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- Atomic and Molecular Physics 8
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- Mass Spectrometry Techniques and Applications 6
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- Thin-Film Transistor Technologies 6
- Integrated Circuits and Semiconductor Failure Analysis 5
- Co-authors
- J.P. ThomasJean-Claude PoizatJ. RémillieuxS. Della‐NegraJ. DavenasGisèle BoiteuxY. Le BeyecJ. Depauw
- Journals
- Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (21 papers)Applied Physics Letters (3 papers)Physical Review Letters (3 papers)
- Partner nations
- FranceSwitzerlandUnited States
In The Last Decade
M. Fallavier
56 papers receiving 977 citations
Peers
Comparison fields: 5 of 59
- Computational Mechanics 704
- Radiation 243
- Surfaces, Coatings and Films 155
- Polymers and Plastics 123
- Materials Chemistry 367
Countries citing papers authored by M. Fallavier
This map shows the geographic impact of M. Fallavier's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Fallavier with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Fallavier more than expected).
Fields of papers citing papers by M. Fallavier
This network shows the impact of papers produced by M. Fallavier. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Fallavier. The network helps show where M. Fallavier may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M. Fallavier, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2014 | 10 | |
| 2 | 2010 | 6 | |
| 3 | 2009 | 9 | |
| 4 | 2009 | 14 | |
| 5 | 2005 | 3 | |
| 6 | 2005 | 44 | |
| 7 | 2003 | 11 | |
| 8 | 1997 | 17 | |
| 9 | 1996 | 34 | |
| 10 | 1996 | 11 | |
| 11 | 1994 | 6 | |
| 12 | 1993 | 7 | |
| 13 | 1990 | 2 | |
| 14 | 1988 | 15 | |
| 15 | 1986 | 46 | |
| 16 | 1985 | 1 | |
| 17 | Microscopic analysis with ion beams | 1984 | 2 |
| 18 | 1983 | 21 | |
| 19 | 1979 | 11 | |
| 20 | 1978 | 23 |
About M. Fallavier
M. Fallavier is a scholar working on Radiation, Computational Mechanics, Surfaces, Coatings and Films, Geochemistry and Petrology and Spectroscopy, having authored 56 papers that have together received 1.0k indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (34 papers), Nuclear Physics and Applications (12 papers), X-ray Spectroscopy and Fluorescence Analysis (12 papers), Electron and X-Ray Spectroscopy Techniques (10 papers), Atomic and Molecular Physics (8 papers), Mass Spectrometry Techniques and Applications (6 papers), Thin-Film Transistor Technologies (6 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). The work is most often cited by research in Computational Mechanics (704 citations), Radiation (243 citations), Surfaces, Coatings and Films (155 citations), Polymers and Plastics (123 citations) and Materials Chemistry (367 citations). M. Fallavier has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include J.P. Thomas, Jean-Claude Poizat, J. Rémillieux, S. Della‐Negra, J. Davenas, Gisèle Boiteux, Y. Le Beyec, J. Depauw, R. Kirsch and P. Thévénard. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Applied Physics Letters, Physical Review Letters, Rapid Communications in Mass Spectrometry and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.