Volker Schmidt

100 papers receiving 2.1k citations

Peers

Volker Schmidt
Comparison fields: 5 of 113
  • Surfaces, Coatings and Films 385
  • Structural Biology 50
  • Radiation 302
  • Atomic and Molecular Physics, and Optics 804
  • Automotive Engineering 217
Replace Yukio Sato with:
Yukio Sato Japan
Michael R. Keenan United States
Ralf B. Bergmann Germany
Hiroaki Yoshida Japan
Alexander V. Shapeev Russia
Robert L. Sproull United States
Hua Li China
Alexander V. Tikhonravov Russia
Toru Ujihara Japan
Phillip M. Duxbury United States
Volker Schmidt relative to Yukio Sato Japan Yukio Sato's profile →
Citations per field
00.5×3.0×
Yukio Sato · 1×
Citations per year

Countries citing papers authored by Volker Schmidt

Since Specialization
Citations

This map shows the geographic impact of Volker Schmidt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Volker Schmidt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Volker Schmidt more than expected).

Fields of papers citing papers by Volker Schmidt

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Volker Schmidt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Volker Schmidt. The network helps show where Volker Schmidt may publish in the future.

Co-authors

The 25 scholars most cited alongside Volker Schmidt, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Volker Schmidt Line = papers co-authored together Volker Schmidt links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20251
2 202310
3 202223
4 201912
5 20183
6 20188
7 20151
8 201565
9 201537
10 201439
11 20141
12 20132
13 201111
14 201147
15 20102
16 201012
17 201037
18 200980
19 200721
20 197820

About Volker Schmidt

Volker Schmidt is a scholar working on Surfaces, Coatings and Films, Structural Biology, Radiation, Applied Mathematics and Computational Mechanics, having authored 104 papers that have together received 2.2k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (26 papers), Laser Material Processing Techniques (13 papers), Point processes and geometric inequalities (12 papers), X-ray Spectroscopy and Fluorescence Analysis (12 papers), Atomic and Molecular Physics (9 papers), Nonlinear Optical Materials Studies (9 papers), Mineral Processing and Grinding (6 papers) and Nanofabrication and Lithography Techniques (6 papers). The work is most often cited by research in Surfaces, Coatings and Films (385 citations), Structural Biology (50 citations), Radiation (302 citations), Atomic and Molecular Physics, and Optics (804 citations) and Automotive Engineering (217 citations). Volker Schmidt has collaborated with scholars based in Germany, Austria and France. Frequent co-authors include Aaron Spettl, W. Mehlhorn, Siegfried Flügge, U. Gösele, Ingo Manke, W. Husinsky, G. Betz, Johannes de Boor, M. S. Banna and P. Werner. Their work appears in journals such as Computational Materials Science, Materials Characterization, Physical Review Letters, Advances in Applied Probability and Journal of Physics B Atomic Molecular and Optical Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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