N. Sandner
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 4
- Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis 6
- Advanced X-ray Imaging Techniques 1
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- Atomic and Molecular Physics 8
- Advanced Chemical Physics Studies 5
- Spectroscopy top 10%
- Mass Spectrometry Techniques and Applications 2
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- Ion-surface interactions and analysis 2
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- Advancements in Photolithography Techniques 1
N. Sandner
10 papers receiving 423 citations
Peers
Comparison fields: 5 of 27
- Surfaces, Coatings and Films 158
- Radiation 189
- Atomic and Molecular Physics, and Optics 408
- Spectroscopy 89
- Structural Biology 3
Countries citing papers authored by N. Sandner
This map shows the geographic impact of N. Sandner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Sandner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Sandner more than expected).
Fields of papers citing papers by N. Sandner
This network shows the impact of papers produced by N. Sandner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Sandner. The network helps show where N. Sandner may publish in the future.
Co-authorship network
The 10 scholars most cited alongside N. Sandner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1980 | 31 | |
| 2 | 1980 | 24 | |
| 3 | 1979 | 34 | |
| 4 | 1978 | 20 | |
| 5 | 1978 | 3 | |
| 6 | 1978 | 46 | |
| 7 | 1977 | 60 | |
| 8 | 1977 | 81 | |
| 9 | 1976 | 111 | |
| 10 | 1976 | 43 |
About N. Sandner
N. Sandner is a scholar working on Radiation, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics, having authored 10 papers that have together received 453 indexed citations. Recurring topics across this work include Atomic and Molecular Physics (8 papers), X-ray Spectroscopy and Fluorescence Analysis (6 papers), Advanced Chemical Physics Studies (5 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), Ion-surface interactions and analysis (2 papers), Mass Spectrometry Techniques and Applications (2 papers), Advanced X-ray Imaging Techniques (1 paper) and Advancements in Photolithography Techniques (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (158 citations), Radiation (189 citations) and Atomic and Molecular Physics, and Optics (408 citations). N. Sandner has collaborated with scholars based in Germany, France and Sweden. Frequent co-authors include F. J. Wuilleumier, Volker Schmidt, M. Y. Adam, W. Mehlhorn, P. Dhez, Volker Schmidt, E. Källne, S. Krummacher, Göran Wendin and J. P. Desclaux. Their work appears in journals such as Japanese Journal of Applied Physics, Journal of Electron Spectroscopy and Related Phenomena, Physical Review Letters, Journal de Physique Lettres and Physical review. A, General physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.