V. Kottler
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- Magnetic properties of thin films 9
- Force Microscopy Techniques and Applications 3
- Surface and Thin Film Phenomena 2
- Structural Biology top 5%
- Condensed Matter Physics top 5%
- Theoretical and Computational Physics 2
- Computational Mechanics top 5%
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- Near-Field Optical Microscopy 6
- Plasmonic and Surface Plasmon Research 2
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- Integrated Circuits and Semiconductor Failure Analysis 5
- Semiconductor materials and devices 2
- Journals
- Journal of Applied Physics (4 papers)Journal of Magnetism and Magnetic Materials (2 papers)IEEE Transactions on Magnetics (2 papers)
- Partner nations
- FranceNetherlandsGermany
In The Last Decade
V. Kottler
14 papers receiving 919 citations
Hit Papers
Peers
Comparison fields: 5 of 44
- Atomic and Molecular Physics, and Optics 750
- Structural Biology 32
- Condensed Matter Physics 253
- Electronic, Optical and Magnetic Materials 282
- Computational Mechanics 217
Countries citing papers authored by V. Kottler
This map shows the geographic impact of V. Kottler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Kottler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Kottler more than expected).
Fields of papers citing papers by V. Kottler
This network shows the impact of papers produced by V. Kottler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Kottler. The network helps show where V. Kottler may publish in the future.
Co-authorship network
The 25 scholars most cited alongside V. Kottler, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 49 | |
| 2 | 2001 | 27 | |
| 3 | 1999 | 1 | |
| 4 | 1999 | 2 | |
| 5 | 1999 | 30 | |
| 6 | 1998 | 25 | |
| 7 | 1998 | 6 | |
| 8 | 1998 | 6 | |
| 9 | Planar Patterned Magnetic Media Obtained by Ion Irradiationbreakdown → | 1998 | 653 |
| 10 | 1998 | 14 | |
| 11 | 1997 | 2 | |
| 12 | 1997 | 45 | |
| 13 | 1997 | 21 | |
| 14 | 1996 | 62 |
About V. Kottler
V. Kottler is a scholar working on Atomic and Molecular Physics, and Optics, Condensed Matter Physics and Electronic, Optical and Magnetic Materials, having authored 14 papers that have together received 943 indexed citations. Recurring topics across this work include Magnetic properties of thin films (9 papers), Near-Field Optical Microscopy (6 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Force Microscopy Techniques and Applications (3 papers), Plasmonic and Surface Plasmon Research (2 papers), Surface and Thin Film Phenomena (2 papers), Semiconductor materials and devices (2 papers) and Theoretical and Computational Physics (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (750 citations), Structural Biology (32 citations) and Condensed Matter Physics (253 citations). V. Kottler has collaborated with scholars based in France, Netherlands and Germany. Frequent co-authors include V. Mathet, C. Chappert, E. Cambril, Y. Chen, H. Launois, H. Bernas, J. P. Jamet, F. Rousseaux, T. Devolder and J. Ferré. Their work appears in journals such as Journal of Applied Physics, Journal of Magnetism and Magnetic Materials, IEEE Transactions on Magnetics, Science and Journal of Microscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.