T. A. Dellin

586 total citations
19 papers, 459 citations indexed

About

T. A. Dellin is a scholar working on Electrical and Electronic Engineering, Radiation and Surfaces, Coatings and Films. According to data from OpenAlex, T. A. Dellin has authored 19 papers receiving a total of 459 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Electrical and Electronic Engineering, 5 papers in Radiation and 4 papers in Surfaces, Coatings and Films. Recurrent topics in T. A. Dellin's work include Semiconductor materials and devices (9 papers), Radiation Effects in Electronics (5 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). T. A. Dellin is often cited by papers focused on Semiconductor materials and devices (9 papers), Radiation Effects in Electronics (5 papers) and Integrated Circuits and Semiconductor Failure Analysis (4 papers). T. A. Dellin collaborates with scholars based in United States and Spain. T. A. Dellin's co-authors include P. J. McWhorter, S. L. Miller, C. J. MacCallum, Daniel A. Tichenor, E. Barsis, Robert D. Hatcher, C. R. Fischer, W. D. Wilson, R. E. Huddleston and G. J. Dienes and has published in prestigious journals such as Journal of Applied Physics, American Journal of Obstetrics and Gynecology and IEEE Transactions on Nuclear Science.

In The Last Decade

T. A. Dellin

18 papers receiving 419 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
T. A. Dellin United States 12 322 96 54 50 35 19 459
S. Girard France 14 429 1.3× 105 1.1× 53 1.0× 150 3.0× 9 0.3× 39 538
J. Stephen United Kingdom 11 219 0.7× 104 1.1× 54 1.0× 25 0.5× 16 0.5× 34 327
G. Farrell United Kingdom 13 221 0.7× 113 1.2× 102 1.9× 36 0.7× 21 0.6× 26 397
L. J. Varnerin United States 8 198 0.6× 54 0.6× 18 0.3× 149 3.0× 10 0.3× 11 300
R.K. Lawrence United States 16 771 2.4× 138 1.4× 34 0.6× 50 1.0× 8 0.2× 52 800
Toshio Hirao Japan 14 627 1.9× 57 0.6× 47 0.9× 62 1.2× 17 0.5× 68 695
Noboru Shiono Japan 14 775 2.4× 128 1.3× 3 0.1× 89 1.8× 11 0.3× 36 820
Antoine Jay France 11 147 0.5× 130 1.4× 16 0.3× 23 0.5× 4 0.1× 23 283
Jaw-Jung Shin United States 10 107 0.3× 74 0.8× 13 0.2× 80 1.6× 16 0.5× 22 325
H. Y. Zhao China 11 196 0.6× 150 1.6× 40 0.7× 122 2.4× 5 0.1× 57 481

Countries citing papers authored by T. A. Dellin

Since Specialization
Citations

This map shows the geographic impact of T. A. Dellin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. A. Dellin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. A. Dellin more than expected).

Fields of papers citing papers by T. A. Dellin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T. A. Dellin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. A. Dellin. The network helps show where T. A. Dellin may publish in the future.

Co-authorship network of co-authors of T. A. Dellin

This figure shows the co-authorship network connecting the top 25 collaborators of T. A. Dellin. A scholar is included among the top collaborators of T. A. Dellin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T. A. Dellin. T. A. Dellin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

19 of 19 papers shown
1.
Hawkins, C.F., J. Segura, J.M. Soden, & T. A. Dellin. (1999). Test and reliability: partners in IC manufacturing. 2. IEEE Design & Test of Computers. 16(4). 66–73. 13 indexed citations
2.
Dellin, T. A., et al.. (1993). <title>Wafer level reliability</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1802. 144–154. 3 indexed citations
3.
Miller, S. L., et al.. (1990). Effect of temperature on data retention of silicon-oxide-nitride-oxide-semiconductor nonvolatile memory transistors. Journal of Applied Physics. 67(11). 7115–7124. 19 indexed citations
4.
McWhorter, P. J., S. L. Miller, & T. A. Dellin. (1990). Modeling the memory retention characteristics of silicon-nitride-oxide-silicon nonvolatile transistors in a varying thermal environment. Journal of Applied Physics. 68(4). 1902–1909. 81 indexed citations
5.
McWhorter, P. J., et al.. (1989). Radiation response of floating gate EEPROM memory cells. IEEE Transactions on Nuclear Science. 36(6). 2131–2139. 97 indexed citations
6.
McWhorter, P. J., et al.. (1987). Retention Characteristics of SNOS Nonvolatile Devices in a Radiation Environment. IEEE Transactions on Nuclear Science. 34(6). 1652–1657. 19 indexed citations
7.
Dellin, T. A. & P. J. McWhorter. (1986). Scaling of MONOS nonvolatile memory transistors. American Journal of Obstetrics and Gynecology. 137(6). 743–4. 2 indexed citations
8.
McWhorter, P. J., S. L. Miller, & T. A. Dellin. (1986). Radiation Response of SNOS Nonvolatile Transistors. IEEE Transactions on Nuclear Science. 33(6). 1413–1419. 45 indexed citations
9.
Dellin, T. A., et al.. (1983). A Radiation-Hardened 16K-BIT MNOS EAROM. IEEE Transactions on Nuclear Science. 30(6). 4224–4228. 5 indexed citations
10.
Dellin, T. A., et al.. (1979). DELSOL - A code for central receiver performance and optimization calculations. 2. 1233–1237.
11.
Dellin, T. A., Daniel A. Tichenor, & E. Barsis. (1977). Volume, index-of-refraction, and stress changes in electron-irradiated vitreous silica. Journal of Applied Physics. 48(3). 1131–1138. 55 indexed citations
12.
Dellin, T. A. & C. J. MacCallum. (1976). Analytical Photo-Compton Deposition Profiles. IEEE Transactions on Nuclear Science. 23(6). 1844–1849. 6 indexed citations
13.
Dellin, T. A., R. E. Huddleston, & C. J. MacCallum. (1975). Second Generation Analytical Photo-Compton Current Methods. IEEE Transactions on Nuclear Science. 22(6). 2549–2555. 17 indexed citations
14.
Dellin, T. A. & C. J. MacCallum. (1975). Photo-Compton currents emitted from a surface. Journal of Applied Physics. 46(7). 2924–2934. 8 indexed citations
15.
Dellin, T. A., et al.. (1974). Photo-compton currents at material interfaces: Theory and experiment. IEEE Transactions on Nuclear Science. 21(6). 227–234. 10 indexed citations
16.
MacCallum, C. J. & T. A. Dellin. (1973). Photo-Compton currents in unbounded media. Journal of Applied Physics. 44(4). 1878–1884. 14 indexed citations
17.
Dellin, T. A. & C. J. MacCallum. (1973). Analytical Prediction of Photo-Compton Emission Currents. IEEE Transactions on Nuclear Science. 20(6). 91–96. 24 indexed citations
18.
Dellin, T. A., G. J. Dienes, C. R. Fischer, Robert D. Hatcher, & W. D. Wilson. (1970). Low-Temperature Volume Expansion of LiH: LiT. Physical review. B, Solid state. 1(4). 1745–1753. 24 indexed citations
19.
Fischer, C. R., T. A. Dellin, S. W. Harrison, Robert D. Hatcher, & W. D. Wilson. (1970). Repulsive Interactions for LiH. Physical review. B, Solid state. 1(2). 876–881. 17 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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