Shih‐Hui Jen

606 total citations
9 papers, 543 citations indexed

About

Shih‐Hui Jen is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Materials Chemistry. According to data from OpenAlex, Shih‐Hui Jen has authored 9 papers receiving a total of 543 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Electrical and Electronic Engineering, 5 papers in Electronic, Optical and Magnetic Materials and 5 papers in Materials Chemistry. Recurrent topics in Shih‐Hui Jen's work include Semiconductor materials and devices (8 papers), Copper Interconnects and Reliability (5 papers) and Metal and Thin Film Mechanics (4 papers). Shih‐Hui Jen is often cited by papers focused on Semiconductor materials and devices (8 papers), Copper Interconnects and Reliability (5 papers) and Metal and Thin Film Mechanics (4 papers). Shih‐Hui Jen collaborates with scholars based in United States. Shih‐Hui Jen's co-authors include Steven M. George, Jacob A. Bertrand, David C. Miller, Martin L. Dunn, P. F. Carcia, R. Scott McLean, Yung-Cheng Lee, Dragos Seghete, Ronggui Yang and Arthur S. Morris and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Acta Materialia.

In The Last Decade

Shih‐Hui Jen

9 papers receiving 538 citations

Peers

Shih‐Hui Jen

EEE

MC

BE

MM

EOMM

Oili Ylivaara Finland

Tai‐Hong Chen Taiwan

Ahmet Gün Erlat United States

Heike Bartsch Germany

Daniel J. R. Appleby United Kingdom

Thomas Kups Germany

Alan Iacopi Australia

Leonie Hold Australia

Baogui Shi United Kingdom

Takahiro Kozeki Japan

Oili Ylivaara Finland

Shih‐Hui Jen

518 ×1.2

EEE

371 ×1.4

MC

106 ×0.8

BE

107 ×1.1

MM

65 ×0.7

EOMM

Citations per year, relative to Shih‐Hui Jen Shih‐Hui Jen (= 1×) peers Oili Ylivaara

Countries citing papers authored by Shih‐Hui Jen

Since Specialization

Citations

This map shows the geographic impact of Shih‐Hui Jen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shih‐Hui Jen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shih‐Hui Jen more than expected).

Fields of papers citing papers by Shih‐Hui Jen

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Shih‐Hui Jen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shih‐Hui Jen. The network helps show where Shih‐Hui Jen may publish in the future.

Co-authorship network of co-authors of Shih‐Hui Jen

This figure shows the co-authorship network connecting the top 25 collaborators of Shih‐Hui Jen. A scholar is included among the top collaborators of Shih‐Hui Jen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shih‐Hui Jen. Shih‐Hui Jen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

9 of 9 papers shown

1.

George, Steven M., et al.. (2013). Hybrid organic-inorganic films fabricated using atomic and molecular layer deposition. 8. 9–13. 1 indexed citations

2.

Jen, Shih‐Hui, Byoung H. Lee, Steven M. George, R. Scott McLean, & P. F. Carcia. (2012). Critical tensile strain and water vapor transmission rate for nanolaminate films grown using Al2O3 atomic layer deposition and alucone molecular layer deposition. Applied Physics Letters. 101(23). 45 indexed citations

3.

Jen, Shih‐Hui, Steven M. George, R. Scott McLean, & P. F. Carcia. (2012). Alucone Interlayers to Minimize Stress Caused by Thermal Expansion Mismatch between Al₂O₃ Films and Teflon Substrates. ACS Applied Materials & Interfaces. 5(3). 1165–1173. 54 indexed citations

4.

Jen, Shih‐Hui, Jacob A. Bertrand, & Steven M. George. (2011). Critical tensile and compressive strains for cracking of Al2O3 films grown by atomic layer deposition. Journal of Applied Physics. 109(8). 187 indexed citations

5.

Miller, David C., Shih‐Hui Jen, Jacob A. Bertrand, et al.. (2010). Thermo-mechanical properties of alumina films created using the atomic layer deposition technique. Sensors and Actuators A Physical. 164(1-2). 58–67. 86 indexed citations

6.

Miller, David C., Yadong Zhang, Shih‐Hui Jen, et al.. (2009). The mechanical robustness of atomic-layer- and molecular-layer-deposited coatings on polymer substrates. Journal of Applied Physics. 105(9). 98 indexed citations

7.

Miller, David C., Shih‐Hui Jen, Jacob A. Bertrand, et al.. (2009). Thermomechanical properties of aluminum alkoxide (alucone) films created using molecular layer deposition. Acta Materialia. 57(17). 5083–5092. 42 indexed citations

8.

Zhang, Yadong, Yu‐Zhong Zhang, David C. Miller, et al.. (2009). Fluorescent tags to visualize defects in Al2O3 thin films grown using atomic layer deposition. Thin Solid Films. 517(24). 6794–6797. 29 indexed citations

9.

Zhang, Yadong, David C. Miller, Jacob A. Bertrand, et al.. (2008). 12.3: Defect Visualization of Atomic Layer Deposition Enabled Polymer Barriers Using Fluorescent Tags. SID Symposium Digest of Technical Papers. 39(1). 143–146. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact