Thomas Kups
- Ceramics and Composites top 10%
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- ZnO doping and properties 10
- MXene and MAX Phase Materials 7
- Copper-based nanomaterials and applications 4
- Bioengineering top 10%
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- Semiconductor materials and devices 8
- Gas Sensing Nanomaterials and Sensors 6
- Silicon Carbide Semiconductor Technologies 6
- Thin-Film Transistor Technologies 5
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- Metal and Thin Film Mechanics 7
Thomas Kups
43 papers receiving 565 citations
Peers
Comparison fields: 5 of 53
- Ceramics and Composites 53
- Materials Chemistry 353
- Electronic, Optical and Magnetic Materials 106
- Bioengineering 32
- Electrical and Electronic Engineering 256
Countries citing papers authored by Thomas Kups
This map shows the geographic impact of Thomas Kups's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Kups with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Kups more than expected).
Fields of papers citing papers by Thomas Kups
This network shows the impact of papers produced by Thomas Kups. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Kups. The network helps show where Thomas Kups may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Thomas Kups, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2020 | 9 | |
| 3 | 2019 | 12 | |
| 4 | 2019 | 21 | |
| 5 | 2018 | 9 | |
| 6 | 2018 | 2 | |
| 7 | 2016 | 5 | |
| 8 | 2014 | 14 | |
| 9 | 2013 | 38 | |
| 10 | 2012 | 14 | |
| 11 | 2012 | 52 | |
| 12 | 2011 | 3 | |
| 13 | 2010 | 15 | |
| 14 | 2010 | 2 | |
| 15 | An effect of bismuth film electroplating variables on electrode performance in electroanalysis | 2009 | 1 |
| 16 | STRUCTURAL AND MORPHOLOGICAL INVESTIGATIONS OF TiO2 SPUTTERED THIN FILMS | 2009 | 5 |
| 17 | 2009 | 22 | |
| 18 | 2008 | 6 | |
| 19 | 2008 | 4 | |
| 20 | 2006 | 1 |
About Thomas Kups
Thomas Kups is a scholar working on Materials Chemistry, Ceramics and Composites, Electrochemistry, Electronic, Optical and Magnetic Materials and Electrical and Electronic Engineering, having authored 44 papers that have together received 574 indexed citations. Recurring topics across this work include ZnO doping and properties (10 papers), Semiconductor materials and devices (8 papers), MXene and MAX Phase Materials (7 papers), Metal and Thin Film Mechanics (7 papers), Gas Sensing Nanomaterials and Sensors (6 papers), Silicon Carbide Semiconductor Technologies (6 papers), Thin-Film Transistor Technologies (5 papers) and Copper-based nanomaterials and applications (4 papers). The work is most often cited by research in Ceramics and Composites (53 citations), Materials Chemistry (353 citations), Electronic, Optical and Magnetic Materials (106 citations), Bioengineering (32 citations) and Electrical and Electronic Engineering (256 citations). Thomas Kups has collaborated with scholars based in Germany, Slovakia and China. Frequent co-authors include Peter Schaaf, Dong Wang, Rolf Grieseler, Lothar Spieß, J. Pezoldt, I. Hotový, E. Baradács, Zoltán Erdélyi, Bence Parditka and V. Řeháček. Their work appears in journals such as Applied Surface Science, Sustainable Energy & Fuels, Thin Solid Films, Acta Materialia and Scientific Reports.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.