Jacob A. Bertrand
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Biomedical Engineering
- Electronic, Optical and Magnetic Materials
- Mechanics of Materials top 10%
- Co-authors
- Steven M. GeorgeShih‐Hui JenDragos SegheteB. B. BurtonAndrew S. CavanaghArrelaine A. DameronStephen D. DavidsonDavid C. Miller
- Topics
- Semiconductor materials and devices (8 papers)Copper Interconnects and Reliability (4 papers)Metal and Thin Film Mechanics (4 papers)
- Cited by
- Electrical and Electronic EngineeringMaterials ChemistryElectronic, Optical and Magnetic Materials
- Partner nations
- United States
In The Last Decade
Jacob A. Bertrand
12 papers receiving 838 citations
Peers
Comparison fields: 5 of 50
- Electrical and Electronic Engineering 678
- Materials Chemistry 441
- Biomedical Engineering 175
- Electronic, Optical and Magnetic Materials 133
- Mechanics of Materials 100
Countries citing papers authored by Jacob A. Bertrand
This map shows the geographic impact of Jacob A. Bertrand's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jacob A. Bertrand with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jacob A. Bertrand more than expected).
Fields of papers citing papers by Jacob A. Bertrand
This network shows the impact of papers produced by Jacob A. Bertrand. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jacob A. Bertrand. The network helps show where Jacob A. Bertrand may publish in the future.
Co-authorship network of co-authors of Jacob A. Bertrand
This figure shows the co-authorship network connecting the top 25 collaborators of Jacob A. Bertrand. A scholar is included among the top collaborators of Jacob A. Bertrand based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jacob A. Bertrand. Jacob A. Bertrand is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 8 | |
| 2 | 22 | |
| 3 | 33 | |
| 4 | 8 | |
| 5 | 187 | |
| 6 | 86 | |
| 7 | 41 | |
| 8 | 98 | |
| 9 | 42 | |
| 10 | 29 | |
| 11 | 1 | |
| 12 | 299 |
About Jacob A. Bertrand
Jacob A. Bertrand is a scholar working on Electronic, Optical and Magnetic Materials, Bioengineering and Ceramics and Composites, having authored 12 papers that have together received 854 indexed citations. Recurring topics across this work include Semiconductor materials and devices (8 papers), Copper Interconnects and Reliability (4 papers) and Metal and Thin Film Mechanics (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (678 citations), Materials Chemistry (441 citations) and Electronic, Optical and Magnetic Materials (133 citations). Jacob A. Bertrand has collaborated with scholars based in United States. Frequent co-authors include Steven M. George, Shih‐Hui Jen, Dragos Seghete, B. B. Burton, Andrew S. Cavanagh, Arrelaine A. Dameron, Stephen D. Davidson, David C. Miller, Martin L. Dunn and Yung-Cheng Lee. Their work appears in journals such as Journal of Applied Physics, Chemistry of Materials and Acta Materialia.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.