Satoshi Ohtake

415 total citations
57 papers, 271 citations indexed

About

Satoshi Ohtake is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, Satoshi Ohtake has authored 57 papers receiving a total of 271 indexed citations (citations by other indexed papers that have themselves been cited), including 47 papers in Hardware and Architecture, 45 papers in Electrical and Electronic Engineering and 9 papers in Control and Systems Engineering. Recurrent topics in Satoshi Ohtake's work include VLSI and Analog Circuit Testing (47 papers), Integrated Circuits and Semiconductor Failure Analysis (38 papers) and Radiation Effects in Electronics (13 papers). Satoshi Ohtake is often cited by papers focused on VLSI and Analog Circuit Testing (47 papers), Integrated Circuits and Semiconductor Failure Analysis (38 papers) and Radiation Effects in Electronics (13 papers). Satoshi Ohtake collaborates with scholars based in Japan, India and Germany. Satoshi Ohtake's co-authors include Hideo Fujiwara, Toshimitsu Masuzawa, Michiko Inoue, Tomokazu Yoneda, Seiji Kajihara, Yôiti Suzuki, Yasuo Satô, Toshio Sone, Kenji Ozawa and Tomoo Inoue and has published in prestigious journals such as Distributed Computing, IEICE Transactions on Information and Systems and Journal of Electronic Testing.

In The Last Decade

Satoshi Ohtake

46 papers receiving 259 citations

Peers

Countries citing papers authored by Satoshi Ohtake

Since Specialization

Citations

This map shows the geographic impact of Satoshi Ohtake's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Satoshi Ohtake with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Satoshi Ohtake more than expected).

Fields of papers citing papers by Satoshi Ohtake

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Satoshi Ohtake. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Satoshi Ohtake. The network helps show where Satoshi Ohtake may publish in the future.

Co-authorship network of co-authors of Satoshi Ohtake

This figure shows the co-authorship network connecting the top 25 collaborators of Satoshi Ohtake. A scholar is included among the top collaborators of Satoshi Ohtake based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Satoshi Ohtake. Satoshi Ohtake is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Field Monitoring System for Frost Damage Warning and Quality Difference Analysis of Tea Leaves 2023 ·(unknown), Satoshi Ohtake	0
2	A Warning System with Multiple Sensors for Avoiding Collision of Bicycles 2020 ·(unknown), Satoshi Ohtake	4
3	Factory Environment Monitoring: A Japanese Tea Manufacturer’s Case 2019 ·(unknown), Satoshi Ohtake	4
4	A Built-In Self-Diagnostic Mechanism for Delay Faults Based on Self-Generation of Expected Signatures 2019 ·(unknown), Satoshi Ohtake, Hiroshi Takahashi	2
5	A Koji Temperature Monitoring System 2019 ·(unknown), Satoshi Ohtake, (unknown)	2
6	A Mash Temperature Monitoring System for Sake Brewing 2018 ·(unknown), Satoshi Ohtake, (unknown)	6
7	F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG 2011 ·Marie Engelene J. Obien, Satoshi Ohtake, Hideo Fujiwara	0
8	Constrained ATPG for functional RTL circuits using F-Scan 2010 ·Marie Engelene J. Obien, Satoshi Ohtake, Hideo Fujiwara	2
9	Fast false path identification based on functional unsensitizability using RTL information 2009 ·Asia and South Pacific Design Automation Conference ·(unknown), Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara	6
10	Fast false path identification based on functional unsensitizability using RTL information 2009 ·(unknown), Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara	4
11	An Approach to RTL-GL Path Mapping Based on Functional Equivalence 2008 ·IEICE Technical Report; IEICE Tech. Rep. ·Hiroshi Iwata, Satoshi Ohtake, Hideo Fujiwara	1
12	Design for Testability of Software-Based Self-Test for Processors 2006 ·(unknown), Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara	5
13	Equivalence of Sequential Transition Test Generation and Constrained Combinational Stuck-at Test Generation 2005 ·Distributed Computing ·(unknown), Satoshi Ohtake, Hideo Fujiwara	1
14	Acceleration of Transition Test Generation for Acyclic Sequential Circuits Utilizing Constrained Combinational Stuck-At Test Generation 2005 ·(unknown), Satoshi Ohtake, Hideo Fujiwara	1
15	A method of test generation for path delay faults using stuck-at fault test generation algorithms 2003 ·Design, Automation, and Test in Europe ·Satoshi Ohtake, (unknown), Hideo Fujiwara	9
16	Design for Hierarchical Two-Pattern Testability of Data Paths 2002 ·IEICE Transactions on Information and Systems ·(unknown), Satoshi Ohtake, Hideo Fujiwara	5
17	Sequential test generation based on circuit pseudo-transformation 2002 ·Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara	2
18	A nonscan DFT method for controllers to provide complete fault efficiency 2002 ·Systems and Computers in Japan ·Satoshi Ohtake, Toshimitsu Masuzawa, Hideo Fujiwara	1
19	Testable design of sequential circuits with improved fault efficiency 2002 ·Debesh K. Das, Bhargab B. Bhattacharya, Satoshi Ohtake, Hideo Fujiwara	0
20	Analyzing Path Delay Fault Testability of RTL Data Paths:A Non-Scan Approach 2000 ·(unknown), Satoshi Ohtake, Hideo Fujiwara	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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