Saqib Khursheed

662 total citations
52 papers, 501 citations indexed

About

Saqib Khursheed is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Automotive Engineering. According to data from OpenAlex, Saqib Khursheed has authored 52 papers receiving a total of 501 indexed citations (citations by other indexed papers that have themselves been cited), including 50 papers in Electrical and Electronic Engineering, 34 papers in Hardware and Architecture and 4 papers in Automotive Engineering. Recurrent topics in Saqib Khursheed's work include Integrated Circuits and Semiconductor Failure Analysis (32 papers), VLSI and Analog Circuit Testing (25 papers) and Semiconductor materials and devices (25 papers). Saqib Khursheed is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (32 papers), VLSI and Analog Circuit Testing (25 papers) and Semiconductor materials and devices (25 papers). Saqib Khursheed collaborates with scholars based in United Kingdom, United States and Saudi Arabia. Saqib Khursheed's co-authors include Bashir M. Al‐Hashimi, Daniele Rossi, Zhao Yi, Sheng Yang, S.M. Reddy, Amit Acharyya, Urban Ingelsson, Shida Zhong, David Flynn and Salman A. Khan and has published in prestigious journals such as IEEE Access, IEEE Transactions on Computers and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

In The Last Decade

Saqib Khursheed

52 papers receiving 482 citations

Peers

Countries citing papers authored by Saqib Khursheed

Since Specialization

Citations

This map shows the geographic impact of Saqib Khursheed's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Saqib Khursheed with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Saqib Khursheed more than expected).

Fields of papers citing papers by Saqib Khursheed

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Saqib Khursheed. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Saqib Khursheed. The network helps show where Saqib Khursheed may publish in the future.

Co-authorship network of co-authors of Saqib Khursheed

This figure shows the co-authorship network connecting the top 25 collaborators of Saqib Khursheed. A scholar is included among the top collaborators of Saqib Khursheed based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Saqib Khursheed. Saqib Khursheed is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	On-Chip Age Estimation Using Machine Learning 2025 ·IEEE Access ·(unknown), Saqib Khursheed, Daniele Rossi	1
2	Noninvasive Methodology for the Age Estimation of ICs Using Gaussian Process Regression 2024 ·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·(unknown), (unknown), Saqib Khursheed, Amit Acharyya	1
3	Operational Age Estimation of ICs using Gaussian Process Regression 2022 ·(unknown), (unknown), Saqib Khursheed, Amit Acharyya	3
4	Online Remaining Useful Lifetime Prediction Using Support Vector Regression 2021 ·IEEE Transactions on Emerging Topics in Computing ·(unknown), Saqib Khursheed, (unknown), Daniele Rossi	12
5	Differential Aging Sensor Using Subthreshold Leakage Current to Detect Recycled ICs 2021 ·IEEE Transactions on Very Large Scale Integration (VLSI) Systems ·(unknown), Saqib Khursheed, (unknown), Daniele Rossi	11
6	Leveraging CMOS Aging for Efficient Microelectronics Design 2020 ·CINECA IRIS Institutial research information system (University of Pisa) ·(unknown), Saqib Khursheed, Daniele Rossi	4
7	A Framework for TSV Based 3D-IC to Analyze Aging and TSV Thermo-Mechanical Stress on Soft Errors 2019 ·(unknown), Amit Acharyya, Saqib Khursheed	2
8	Recycled IC detection through aging sensor 2018 ·CINECA IRIS Institutial research information system (University of Pisa) ·Daniele Rossi, (unknown), Saqib Khursheed, S.M. Reddy	11
9	Reconfigurable hardware-software codesign methodology for protein identification 2016 ·PubMed ·(unknown), (unknown), (unknown), (unknown), Amit Acharyya, Vasundhra Bhandari, Paresh Sharma, Saqib Khursheed, Ganesh R. Naik	1
10	BTI and leakage aware dynamic voltage scaling for reliable low power cache memories 2015 ·ePrints Soton (University of Southampton) ·Daniele Rossi, (unknown), Saqib Khursheed, Bashir M. Al‐Hashimi	14
11	NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating 2015 ·ePrints Soton (University of Southampton) ·Daniele Rossi, (unknown), Saqib Khursheed, Bashir M. Al‐Hashimi	10
12	Improved State Integrity of Flip-Flops for Voltage Scaled Retention Under PVT Variation 2013 ·IEEE Transactions on Circuits and Systems I Regular Papers ·Sheng Yang, Saqib Khursheed, Bashir M. Al‐Hashimi, David Flynn, Geoff V. Merrett	7
13	Delay Test for Diagnosis of Power Switches 2013 ·IEEE Transactions on Very Large Scale Integration (VLSI) Systems ·Saqib Khursheed, (unknown), Bashir M. Al‐Hashimi, Peter Wilson, Krishnendu Chakrabarty	10
14	A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects 2011 ·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Shida Zhong, Saqib Khursheed, Bashir M. Al‐Hashimi	9
15	Improved DFT for Testing Power Switches 2011 ·Saqib Khursheed, Sheng Yang, Bashir M. Al‐Hashimi, Xiaoyu Huang, David Flynn	20
16	Scan based methodology for reliable state retention power gating designs 2010 ·Design, Automation, and Test in Europe ·Sheng Yang, Bashir M. Al‐Hashimi, David Flynn, Saqib Khursheed	3
17	Test cost reduction for multiple-voltage designs with bridge defects through gate-sizing 2009 ·Design, Automation, and Test in Europe ·Saqib Khursheed, Bashir M. Al‐Hashimi, (unknown)	2
18	Process Variation-Aware Test for Resistive Bridges 2009 ·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Urban Ingelsson, Bashir M. Al‐Hashimi, Saqib Khursheed, S.M. Reddy, (unknown)	24
19	Efficient test compaction for combinational circuits based on Fault detection count-directed clustering 2007 ·IET Computers & Digital Techniques ·Aiman H. El‐Maleh, Saqib Khursheed	4
20	Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation 2005 ·Aiman H. El‐Maleh, Saqib Khursheed, Sadiq M. Sait	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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