Sam Chang
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- Advanced MRI Techniques and Applications 3
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing 2
- Spectroscopy top 10%
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- Advancements in PLL and VCO Technologies 11
- Electromagnetic Compatibility and Noise Suppression 9
- Low-power high-performance VLSI design 6
- Radio Frequency Integrated Circuit Design 2
- 3D IC and TSV technologies 2
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- Nuclear Physics and Applications 2
- Co-authors
- Keith R. ThulbornGary X. ShenFernando E. BoadaJoseph GillenDan OhJames VoyvodicJihong RenChuck Yuan
- Journals
- Magnetic Resonance in Medicine (2 papers)IEEE Transactions on Advanced Packaging (1 paper)IEEE Transactions on Components Packaging and Manufacturing Technology (1 paper)
- Partner nations
- United States
In The Last Decade
Sam Chang
15 papers receiving 481 citations
Peers
Comparison fields: 5 of 57
- Radiology, Nuclear Medicine and Imaging 310
- Hardware and Architecture 50
- Spectroscopy 89
- Atomic and Molecular Physics, and Optics 106
- Biophysics 15
Countries citing papers authored by Sam Chang
This map shows the geographic impact of Sam Chang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Sam Chang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Sam Chang more than expected).
Fields of papers citing papers by Sam Chang
This network shows the impact of papers produced by Sam Chang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Sam Chang. The network helps show where Sam Chang may publish in the future.
Co-authorship network
The 22 scholars most cited alongside Sam Chang, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2013 | 1 | |
| 2 | 2011 | 8 | |
| 3 | 2011 | 13 | |
| 4 | 2010 | 9 | |
| 5 | 2010 | 5 | |
| 6 | 2009 | 17 | |
| 7 | 2009 | 8 | |
| 8 | 2008 | 37 | |
| 9 | 2008 | 12 | |
| 10 | 2007 | 15 | |
| 11 | 2007 | 13 | |
| 12 | 2006 | 5 | |
| 13 | 1997 | 205 | |
| 14 | 1997 | 73 | |
| 15 | 1997 | 69 |
About Sam Chang
Sam Chang is a scholar working on Hardware and Architecture, Radiation and Electrical and Electronic Engineering, having authored 15 papers that have together received 490 indexed citations. Recurring topics across this work include Advancements in PLL and VCO Technologies (11 papers), Electromagnetic Compatibility and Noise Suppression (9 papers), Low-power high-performance VLSI design (6 papers), Advanced MRI Techniques and Applications (3 papers), Radio Frequency Integrated Circuit Design (2 papers), VLSI and Analog Circuit Testing (2 papers), 3D IC and TSV technologies (2 papers) and Nuclear Physics and Applications (2 papers). The work is most often cited by research in Radiology, Nuclear Medicine and Imaging (310 citations), Hardware and Architecture (50 citations) and Spectroscopy (89 citations). Sam Chang has collaborated with scholars based in United States. Frequent co-authors include Keith R. Thulborn, Gary X. Shen, Fernando E. Boada, Joseph Gillen, Dan Oh, James Voyvodic, Jihong Ren, Chuck Yuan, Kyung Suk Oh and Jared Zerbe. Their work appears in journals such as Magnetic Resonance in Medicine, IEEE Transactions on Advanced Packaging, IEEE Transactions on Components Packaging and Manufacturing Technology and NMR in Biomedicine.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.