S. Raghaw
- Electrical and Electronic Engineering top 10%
- Materials Chemistry
- Ceramics and Composites top 10%
- Atomic and Molecular Physics, and Optics
- Biomedical Engineering
- Co-authors
- Rama I. HegdePhilip J. TobinChunli LiuM. W. StokerJohn E. JaffeMaciej GutowskiGareth ThomasT. R. Dinger
- Topics
- Semiconductor materials and devices (7 papers)Integrated Circuits and Semiconductor Failure Analysis (4 papers)Electron and X-Ray Spectroscopy Techniques (4 papers)
- Journals
- Journal of the American Chemical SocietyApplied Physics LettersJournal of The Electrochemical Society
- Partner nations
- United StatesPolandIndia
In The Last Decade
S. Raghaw
14 papers receiving 594 citations
Peers
Comparison fields: 5 of 52
- Electrical and Electronic Engineering 357
- Materials Chemistry 329
- Ceramics and Composites 89
- Atomic and Molecular Physics, and Optics 69
- Biomedical Engineering 68
Countries citing papers authored by S. Raghaw
This map shows the geographic impact of S. Raghaw's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Raghaw with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Raghaw more than expected).
Fields of papers citing papers by S. Raghaw
This network shows the impact of papers produced by S. Raghaw. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Raghaw. The network helps show where S. Raghaw may publish in the future.
Co-authorship network of co-authors of S. Raghaw
This figure shows the co-authorship network connecting the top 25 collaborators of S. Raghaw. A scholar is included among the top collaborators of S. Raghaw based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Raghaw. S. Raghaw is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 16 | |
| 2 | Thermodynamic Stability of High-K Dielectric Metal Oxides ZrO 2 and HfO 2 in Contact with Si and SiO_2 | 2 |
| 3 | 4 | |
| 4 | 320 | |
| 5 | 23 | |
| 6 | 4 | |
| 7 | 16 | |
| 8 | 6 | |
| 9 | 1 | |
| 10 | 40 | |
| 11 | 79 | |
| 12 | 61 | |
| 13 | 39 | |
| 14 | 3 |
About S. Raghaw
S. Raghaw is a scholar working on Structural Biology, Surfaces, Coatings and Films and Ceramics and Composites, having authored 14 papers that have together received 614 indexed citations. Recurring topics across this work include Semiconductor materials and devices (7 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Electron and X-Ray Spectroscopy Techniques (4 papers). The work is most often cited by research in Ceramics and Composites (89 citations), Materials Chemistry (329 citations) and Structural Biology (10 citations). S. Raghaw has collaborated with scholars based in United States, Poland and India. Frequent co-authors include Rama I. Hegde, Philip J. Tobin, Chunli Liu, M. W. Stoker, John E. Jaffe, Maciej Gutowski, Gareth Thomas, T. R. Dinger, Gareth J. Thomas and Wilhelm F. Maier. Their work appears in journals such as Journal of the American Chemical Society, Applied Physics Letters and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.