Remo Kirsch
Impact in
- Structural Biology top 10%
- Surfaces, Coatings and Films top 10%
Papers in
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- Electron and X-Ray Spectroscopy Techniques 2
-
- Advancements in Photolithography Techniques 4
- Integrated Circuits and Semiconductor Failure Analysis 4
- Semiconductor materials and devices 3
- Molecular Junctions and Nanostructures 2
- Co-authors
- Michael MertigW. PompeJan RichterJens PlaschkeRalf SeidelHans K. SchackertHarald EngelhardtM. Eibschütz
- Journals
- Applied Surface Science (1 paper)The European Physical Journal D (1 paper)Applied Physics Letters (1 paper)IEEE Transactions on Semiconductor Manufacturing (1 paper)Thin Solid Films (1 paper)
- Partner nations
- GermanyIsraelUnited States
In The Last Decade
Remo Kirsch
14 papers receiving 622 citations
Peers
Comparison fields: 5 of 60
- Structural Biology 25
- Surfaces, Coatings and Films 49
- Electronic, Optical and Magnetic Materials 112
- Biomaterials 76
- Molecular Biology 342
Countries citing papers authored by Remo Kirsch
This map shows the geographic impact of Remo Kirsch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Remo Kirsch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Remo Kirsch more than expected).
Fields of papers citing papers by Remo Kirsch
This network shows the impact of papers produced by Remo Kirsch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Remo Kirsch. The network helps show where Remo Kirsch may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Remo Kirsch, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 4 | |
| 2 | 2015 | 6 | |
| 3 | 2011 | 1 | |
| 4 | 2008 | 2 | |
| 5 | 2000 | 346 | |
| 6 | 1999 | 91 | |
| 7 | 1999 | 13 | |
| 8 | 1998 | 52 | |
| 9 | 1997 | 70 | |
| 10 | 1997 | 5 | |
| 11 | 1996 | 6 | |
| 12 | 1993 | 6 | |
| 13 | 1978 | 4 | |
| 14 | 1976 | 41 |
About Remo Kirsch
Remo Kirsch is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Atmospheric Science, Electronic, Optical and Magnetic Materials and Computational Mechanics, having authored 14 papers that have together received 647 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Semiconductor materials and devices (3 papers), Copper Interconnects and Reliability (2 papers), Molecular Junctions and Nanostructures (2 papers), nanoparticles nucleation surface interactions (2 papers), Nanofabrication and Lithography Techniques (2 papers) and Electron and X-Ray Spectroscopy Techniques (2 papers). The work is most often cited by research in Structural Biology (25 citations), Surfaces, Coatings and Films (49 citations), Electronic, Optical and Magnetic Materials (112 citations), Biomaterials (76 citations) and Molecular Biology (342 citations). Remo Kirsch has collaborated with scholars based in Germany, Israel and United States. Frequent co-authors include Michael Mertig, W. Pompe, Jan Richter, Jens Plaschke, Ralf Seidel, Hans K. Schackert, Harald Engelhardt, W. Pompe, M. Eibschütz and J. M. Poate. Their work appears in journals such as Applied Surface Science, The European Physical Journal D, Applied Physics Letters, IEEE Transactions on Semiconductor Manufacturing and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.