Reinhold Ritter
- Computer Vision and Pattern Recognition top 5%
- Mechanical Engineering top 10%
- Mechanics of Materials
- Computational Mechanics top 10%
- Materials Chemistry
- Co-authors
- Э. СоппаSiegfried SchmauderG. FischerH. NeuhäuserRainer TutschF.B. KloseDirk BergmannR. Scherm
- Topics
- Optical measurement and interference techniques (18 papers)Advanced Measurement and Metrology Techniques (17 papers)Advanced Measurement and Detection Methods (5 papers)
In The Last Decade
Reinhold Ritter
33 papers receiving 342 citations
Peers
Comparison fields: 5 of 46
- Computer Vision and Pattern Recognition 209
- Mechanical Engineering 187
- Mechanics of Materials 76
- Computational Mechanics 74
- Materials Chemistry 55
Countries citing papers authored by Reinhold Ritter
This map shows the geographic impact of Reinhold Ritter's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Reinhold Ritter with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Reinhold Ritter more than expected).
Fields of papers citing papers by Reinhold Ritter
This network shows the impact of papers produced by Reinhold Ritter. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Reinhold Ritter. The network helps show where Reinhold Ritter may publish in the future.
Co-authorship network of co-authors of Reinhold Ritter
This figure shows the co-authorship network connecting the top 25 collaborators of Reinhold Ritter. A scholar is included among the top collaborators of Reinhold Ritter based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Reinhold Ritter. Reinhold Ritter is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 12 | |
| 2 | 25 | |
| 3 | 10 | |
| 4 | 41 | |
| 5 | 16 | |
| 6 | 2 | |
| 7 | 1 | |
| 8 | 2 | |
| 9 | 4 | |
| 10 | 46 | |
| 11 | Measurement of curvature based on the Moire principle using intensity distribution | 1 |
| 12 | 21 | |
| 13 | 16 | |
| 14 | 1 | |
| 15 | 1 | |
| 16 | 2 | |
| 17 | 3 | |
| 18 | 3 | |
| 19 | 4 | |
| 20 | 32 |
About Reinhold Ritter
Reinhold Ritter is a scholar working on Computer Vision and Pattern Recognition, Mechanical Engineering and Surfaces, Coatings and Films, having authored 33 papers that have together received 368 indexed citations. Recurring topics across this work include Optical measurement and interference techniques (18 papers), Advanced Measurement and Metrology Techniques (17 papers) and Advanced Measurement and Detection Methods (5 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (209 citations), Mechanical Engineering (187 citations) and Media Technology (36 citations). Reinhold Ritter has collaborated with scholars based in Germany and France. Frequent co-authors include Э. Соппа, Siegfried Schmauder, G. Fischer, H. Neuhäuser, Rainer Tutsch, F.B. Klose, Dirk Bergmann, R. Scherm, G. Dolling and A. Ziegenbein. Their work appears in journals such as Computer Physics Communications, Engineering Fracture Mechanics and Computational Materials Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.