Hanno Dierke
- Materials Chemistry
- Mechanical Engineering top 10%
- Electrical and Electronic Engineering
- Aerospace Engineering top 10%
- Mechanics of Materials top 10%
- Co-authors
- H. NeuhäuserChristian JansenMartin JacobMartin KochThomas KürnerSebastian PriebeChristoph MöllerMatthieu Mazière
- Topics
- Optical measurement and interference techniques (7 papers)Microstructure and mechanical properties (6 papers)Aluminum Alloy Microstructure Properties (4 papers)
- Journals
- SHILAP Revista de lepidopterologíaJournal of Applied PhysicsMaterials Science and Engineering A
- Partner nations
- GermanyFranceSwitzerland
In The Last Decade
Hanno Dierke
21 papers receiving 452 citations
Peers
Comparison fields: 5 of 53
- Materials Chemistry 198
- Mechanical Engineering 193
- Electrical and Electronic Engineering 181
- Aerospace Engineering 107
- Mechanics of Materials 95
Countries citing papers authored by Hanno Dierke
This map shows the geographic impact of Hanno Dierke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hanno Dierke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hanno Dierke more than expected).
Fields of papers citing papers by Hanno Dierke
This network shows the impact of papers produced by Hanno Dierke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hanno Dierke. The network helps show where Hanno Dierke may publish in the future.
Co-authorship network of co-authors of Hanno Dierke
This figure shows the co-authorship network connecting the top 25 collaborators of Hanno Dierke. A scholar is included among the top collaborators of Hanno Dierke based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hanno Dierke. Hanno Dierke is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 2 | |
| 4 | 2 | |
| 5 | 3 | |
| 6 | 1 | |
| 7 | 1 | |
| 8 | 1 | |
| 9 | 2 | |
| 10 | 39 | |
| 11 | 160 | |
| 12 | 36 | |
| 13 | 4 | |
| 14 | 22 | |
| 15 | 15 | |
| 16 | 18 | |
| 17 | 65 | |
| 18 | 12 | |
| 19 | 1 | |
| 20 | 1 |
About Hanno Dierke
Hanno Dierke is a scholar working on Computer Vision and Pattern Recognition, Mechanical Engineering and Aerospace Engineering, having authored 22 papers that have together received 463 indexed citations. Recurring topics across this work include Optical measurement and interference techniques (7 papers), Microstructure and mechanical properties (6 papers) and Aluminum Alloy Microstructure Properties (4 papers). The work is most often cited by research in Mechanical Engineering (193 citations), Metals and Alloys (12 citations) and Aerospace Engineering (107 citations). Hanno Dierke has collaborated with scholars based in Germany, France and Switzerland. Frequent co-authors include H. Neuhäuser, Christian Jansen, Martin Jacob, Martin Koch, Thomas Kürner, Sebastian Priebe, Christoph Möller, Matthieu Mazière, Rainer Tutsch and F.B. Klose. Their work appears in journals such as SHILAP Revista de lepidopterología, Journal of Applied Physics and Materials Science and Engineering A.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.