Stephan Waldner

440 citations
14 papers · 308 · h-index 6

Impact in

Papers in

Stephan Waldner

12 papers receiving 284 citations

Peers

Stephan Waldner
Comparison fields: 5 of 28
  • Computer Vision and Pattern Recognition 261
  • Media Technology 107
  • Atomic and Molecular Physics, and Optics 119
  • Mechanical Engineering 88
  • Computational Mechanics 44
Replace Vít Lédl with:
Vít Lédl Czechia
Guillermo Garnica Mexico
Moisés Padilla Mexico
Yongfu Wen China
Gerhard Kupfer Germany
C. Forno United Kingdom
Lars Benckert Sweden
Gastón A. Ayubi Uruguay
P. Haible Germany
Yongmo Zhuo China
Stephan Waldner relative to Vít Lédl Czechia Vít Lédl's profile →
Citations per field
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Citations per year

Countries citing papers authored by Stephan Waldner

Since Specialization
Citations

This map shows the geographic impact of Stephan Waldner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Stephan Waldner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Stephan Waldner more than expected).

Fields of papers citing papers by Stephan Waldner

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Stephan Waldner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Stephan Waldner. The network helps show where Stephan Waldner may publish in the future.

Co-authors

The 7 scholars most cited alongside Stephan Waldner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Stephan Waldner Line = papers co-authored together Stephan Waldner links everyone, so they are left out of the graph.

All Works

14 of 14 papers shown
#Work
1 1999199
2 199753
3 199617
4 199912
5 19967
6 20106
7 20134
8 20243
9 19972
10 20212
11 20251
12 20191
13 20111
14 20250

About Stephan Waldner

Stephan Waldner is a scholar working on Mechanical Engineering, Electrical and Electronic Engineering, Computer Vision and Pattern Recognition, Computational Mechanics and Surfaces, Coatings and Films, having authored 14 papers that have together received 308 indexed citations. Recurring topics across this work include Advanced Measurement and Metrology Techniques (7 papers), Optical measurement and interference techniques (6 papers), Surface Roughness and Optical Measurements (4 papers), Optical Coatings and Gratings (4 papers), Thin-Film Transistor Technologies (2 papers), Advanced Measurement and Detection Methods (2 papers), Advanced Fiber Optic Sensors (1 paper) and Photonic and Optical Devices (1 paper). The work is most often cited by research in Computer Vision and Pattern Recognition (261 citations), Media Technology (107 citations), Atomic and Molecular Physics, and Optics (119 citations), Mechanical Engineering (88 citations) and Computational Mechanics (44 citations). Stephan Waldner has collaborated with scholars based in Switzerland and Poland. Frequent co-authors include Thomas Frei, Małgorzata Kujawińska, Tijmen Vermeij, Fedor F. Klimashin, Xavier Maeder, Johann Michler and Amit Kumar Sharma. Their work appears in journals such as Optics Communications, Scripta Materialia, Journal of the European Optical Society Rapid Publications, Chinese Optics Letters and Optics and Lasers in Engineering.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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