Stephan Waldner

437 total citations
13 papers, 311 citations indexed

About

Stephan Waldner is a scholar working on Mechanical Engineering, Electrical and Electronic Engineering and Computer Vision and Pattern Recognition. According to data from OpenAlex, Stephan Waldner has authored 13 papers receiving a total of 311 indexed citations (citations by other indexed papers that have themselves been cited), including 7 papers in Mechanical Engineering, 7 papers in Electrical and Electronic Engineering and 6 papers in Computer Vision and Pattern Recognition. Recurrent topics in Stephan Waldner's work include Advanced Measurement and Metrology Techniques (7 papers), Optical measurement and interference techniques (6 papers) and Surface Roughness and Optical Measurements (4 papers). Stephan Waldner is often cited by papers focused on Advanced Measurement and Metrology Techniques (7 papers), Optical measurement and interference techniques (6 papers) and Surface Roughness and Optical Measurements (4 papers). Stephan Waldner collaborates with scholars based in Switzerland and Poland. Stephan Waldner's co-authors include Małgorzata Kujawińska, Xavier Maeder, Tijmen Vermeij, Amit Kumar Sharma and Thomas Frei and has published in prestigious journals such as SHILAP Revista de lepidopterología, Optics Communications and Optics and Lasers in Engineering.

In The Last Decade

Stephan Waldner

12 papers receiving 285 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Stephan Waldner Switzerland	6	265	119	110	89	49	13	311
Gerhard Kupfer Germany	8	253 1.0×	67 0.6×	95 0.9×	133 1.5×	50 1.0×	30	314
Moisés Padilla Mexico	11	300 1.1×	57 0.5×	115 1.0×	140 1.6×	51 1.0×	28	314
Lars Benckert Sweden	8	221 0.8×	91 0.8×	66 0.6×	69 0.8×	45 0.9×	20	335
Ricardo Legarda-Sáenz Mexico	11	401 1.5×	95 0.8×	149 1.4×	134 1.5×	75 1.5×	30	424
Guillermo Garnica Mexico	10	272 1.0×	46 0.4×	105 1.0×	122 1.4×	50 1.0×	33	297
P. Haible Germany	8	297 1.1×	96 0.8×	74 0.7×	102 1.1×	50 1.0×	12	321
Vít Lédl Czechia	10	182 0.7×	184 1.5×	85 0.8×	67 0.8×	54 1.1×	69	349
Yongfu Wen China	10	213 0.8×	94 0.8×	80 0.7×	130 1.5×	49 1.0×	43	349
Yau Y. Hung United States	5	222 0.8×	39 0.3×	60 0.5×	107 1.2×	43 0.9×	11	259
Ribun Onodera Japan	11	256 1.0×	120 1.0×	55 0.5×	167 1.9×	118 2.4×	32	354

Countries citing papers authored by Stephan Waldner

Since Specialization

Citations

This map shows the geographic impact of Stephan Waldner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Stephan Waldner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Stephan Waldner more than expected).

Fields of papers citing papers by Stephan Waldner

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Stephan Waldner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Stephan Waldner. The network helps show where Stephan Waldner may publish in the future.

Co-authorship network of co-authors of Stephan Waldner

This figure shows the co-authorship network connecting the top 25 collaborators of Stephan Waldner. A scholar is included among the top collaborators of Stephan Waldner based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Stephan Waldner. Stephan Waldner is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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13 of 13 papers shown

Waldner, Stephan, et al.. (2025). UV coatings using Ta₂O₅-SiO₂ quantized nanolaminates. Journal of the European Optical Society Rapid Publications. 21(1). 24–24.

Sharma, Amit Kumar, et al.. (2024). Magnetron Sputter Deposition of Amorphous Silicon–SiO₂ Quantized Nanolaminates. SHILAP Revista de lepidopterología. 5(12). 3 indexed citations

Waldner, Stephan, et al.. (2021). Pre-production simulation of optical monitoring combining monochromatic and broadband monitoring strategies. 21–21. 2 indexed citations

Waldner, Stephan, et al.. (2019). Hybrid Mode Optical Monitoring – Monochromatic and Broadband Algorithms in the same Coating Process. 1 indexed citations

Waldner, Stephan, et al.. (2013). Online re-optimization of optical filters on a production sputter tool. Chinese Optics Letters. 11(S1). S10207–S10207. 4 indexed citations

Waldner, Stephan, et al.. (2011). Optimization of ion-assisted ITO films by design of experiment. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8168. 81681H–81681H. 1 indexed citations

Waldner, Stephan, et al.. (2010). Broadband Optical Monitoring Combined with Additional Rate Measurement for Accurate and Robust Coating Processes. Optical Interference Coatings. TuC10–TuC10. 6 indexed citations

Waldner, Stephan, et al.. (1999). A simple and effective method for filtering speckle-interferometric phase fringe patterns. Optics Communications. 162(4-6). 205–210. 199 indexed citations

Waldner, Stephan, et al.. (1999). <title>Compact shearography system for the measurement of 3D deformation</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3745. 141–148. 12 indexed citations

10.

Kujawińska, Małgorzata, et al.. (1997). <title>Modified electronic speckle pattern shearing interferometry for simultaneous derivative map measurements</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3098. 204–210. 3 indexed citations

11.

Waldner, Stephan, et al.. (1997). Strain distributions made visible with image-shearing speckle pattern interferometry. Optics and Lasers in Engineering. 26(4-5). 407–420. 54 indexed citations

12.

Waldner, Stephan. (1996). Removing the image-doubling in shearography by reconstruction of the displacement field. Optics Communications. 127(1-3). 117–126. 18 indexed citations

13.

Waldner, Stephan. (1996). <title>Removing the image-doubling in shearography: theory and application</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2944. 247–255. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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