R. Weimer
- Mechanics of Materials top 5%
- Metal and Thin Film Mechanics 9
- Materials Chemistry top 10%
- Diamond and Carbon-based Materials Research 10
- Geophysics top 10%
- High-pressure geophysics and materials 2
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- Ion-surface interactions and analysis 3
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- Semiconductor materials and devices 6
- Integrated Circuits and Semiconductor Failure Analysis 2
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- Force Microscopy Techniques and Applications 1
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- Advanced Surface Polishing Techniques 1
- Co-authors
- Y. LiouR. MessierDiane S. KnightA. InspektorWilliam B. WhiteL. J. PilioneC.J. BrinkerPatrick M. Lenahan
- Journals
- Applied Physics Letters (6 papers)Journal of Crystal Growth (1 paper)Journal of materials research/Pratt's guide to venture capital sources (1 paper)
- Partner nations
- United StatesIsraelGreece
In The Last Decade
R. Weimer
12 papers receiving 416 citations
Peers
Comparison fields: 5 of 28
- Mechanics of Materials 272
- Materials Chemistry 379
- Geophysics 99
- Computational Mechanics 48
- Electrical and Electronic Engineering 123
Countries citing papers authored by R. Weimer
This map shows the geographic impact of R. Weimer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Weimer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Weimer more than expected).
Fields of papers citing papers by R. Weimer
This network shows the impact of papers produced by R. Weimer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Weimer. The network helps show where R. Weimer may publish in the future.
Co-authorship network
The 18 scholars most cited alongside R. Weimer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 1 | |
| 2 | 2002 | 5 | |
| 3 | 2001 | 19 | |
| 4 | 1995 | 5 | |
| 5 | 1995 | 2 | |
| 6 | 1994 | 15 | |
| 7 | 1994 | 4 | |
| 8 | 1990 | 59 | |
| 9 | 1990 | 76 | |
| 10 | 1990 | 126 | |
| 11 | 1990 | 5 | |
| 12 | 1989 | 81 | |
| 13 | 1989 | 0 | |
| 14 | 1987 | 26 |
About R. Weimer
R. Weimer is a scholar working on Mechanics of Materials, Materials Chemistry, Geophysics, Computational Mechanics and Electrical and Electronic Engineering, having authored 14 papers that have together received 424 indexed citations. Recurring topics across this work include Diamond and Carbon-based Materials Research (10 papers), Metal and Thin Film Mechanics (9 papers), Semiconductor materials and devices (6 papers), Ion-surface interactions and analysis (3 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), High-pressure geophysics and materials (2 papers), Force Microscopy Techniques and Applications (1 paper) and Advanced Surface Polishing Techniques (1 paper). The work is most often cited by research in Mechanics of Materials (272 citations), Materials Chemistry (379 citations), Geophysics (99 citations), Computational Mechanics (48 citations) and Electrical and Electronic Engineering (123 citations). R. Weimer has collaborated with scholars based in United States, Israel and Greece. Frequent co-authors include Y. Liou, R. Messier, Diane S. Knight, A. Inspektor, William B. White, L. J. Pilione, C.J. Brinker, Patrick M. Lenahan, Keith A. Snail and S.T. Liu. Their work appears in journals such as Applied Physics Letters, Journal of Crystal Growth, Journal of materials research/Pratt's guide to venture capital sources, IEEE Transactions on Semiconductor Manufacturing and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.