R. Castagné
About
In The Last Decade
R. Castagné
21 papers receiving 566 citations
Hit Papers
Peers
Comparison fields: 5 of 22
- Electrical and Electronic Engineering 561
- Atomic and Molecular Physics, and Optics 392
- Materials Chemistry 140
- Biomedical Engineering 34
- Condensed Matter Physics 31
Countries citing papers authored by R. Castagné
This map shows the geographic impact of R. Castagné's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Castagné with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Castagné more than expected).
Fields of papers citing papers by R. Castagné
This network shows the impact of papers produced by R. Castagné. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Castagné. The network helps show where R. Castagné may publish in the future.
Co-authorship network of co-authors of R. Castagné
This figure shows the co-authorship network connecting the top 25 collaborators of R. Castagné. A scholar is included among the top collaborators of R. Castagné based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Castagné. R. Castagné is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 3 | |
| 3 | 1 | |
| 4 | 1 | |
| 5 | 5 | |
| 6 | 3 | |
| 7 | 7 | |
| 8 | Proceedings of the International Conference on Microlithography on Microcircuit Engineering 87 | 0 |
| 9 | 6 | |
| 10 | 3 | |
| 11 | 2 | |
| 12 | 14 | |
| 13 | 19 | |
| 14 | 2 | |
| 15 | 2 | |
| 16 | 10 | |
| 17 | 17 | |
| 18 | 1 | |
| 19 | Description of the SiO2Si interface properties by means of very low frequency MOS capacitance measurements breakdown → | 444 |
| 20 | 39 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.