P. E. Freeland

1.6k citations

26 papers · 1.2k indexed · h-index 18

Structural Biology top 5%
Catalysis top 10%
Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 7
Atomic and Molecular Physics, and Optics top 5%
- Surface and Thin Film Phenomena 10
- Semiconductor materials and interfaces 6
- Semiconductor Quantum Structures and Devices 3
- Advanced Chemical Physics Studies 3
Materials Chemistry top 10%
- Microstructure and mechanical properties 4
Electrical and Electronic Engineering
- Silicon and Solar Cell Technologies 6
Biomedical Engineering
- Advanced Surface Polishing Techniques 3

Co-authors: J. R. Patel Matthias Baum R. J. H. Voorhoeve J. P. Remeika J. A. Golovchenko Michael Stavola L. C. Kimerling J. Zegenhagen
Cited by: Structural Biology Catalysis Surfaces, Coatings and Films
Journals: Physical Review Letters (5 papers)Physical review. B, Condensed matter (4 papers)Applied Physics Letters (3 papers)
Partner nations: United States Germany

In The Last Decade

P. E. Freeland

26 papers receiving 1.1k citations

Peers

Countries citing papers authored by P. E. Freeland

Since Specialization

Citations

This map shows the geographic impact of P. E. Freeland's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. E. Freeland with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. E. Freeland more than expected).

Fields of papers citing papers by P. E. Freeland

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. E. Freeland. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. E. Freeland. The network helps show where P. E. Freeland may publish in the future.

Co-authorship network

The 25 scholars most cited alongside P. E. Freeland, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with P. E. Freeland Line = papers co-authored together P. E. Freeland links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Surface structures of Si(111)/Ga Philosophical Magazine B ·J. Zegenhagen,Emilio Artacho,P. E. Freeland,J. R. Patel	1994	11
2	Epitaxially stabilized GexSn1−x diamond cubic alloys Journal of Electronic Materials ·Eugene A. Fitzgerald,P. E. Freeland,M. T. Asom,W. P. Lowe,Tilahun Abdeta,B. E. Weir,A. R. Kortan,(unknown),Ya Xie,A. M. Sergent,S. L. Cooper,G. A. Thomas,L. C. Kimerling	1991	36
3	Co on Si(111): Silicide formation Physical review. B, Condensed matter ·J. Zegenhagen,J. R. Patel,P. E. Freeland,R. T. Tung	1991	8
4	Comment on ‘‘Evidence of eightfold coordination for Co atoms at the CoSi_{2}/Si(111) interface’’ Physical Review Letters ·J. Zegenhagen,R. T. Tung,J. R. Patel,P. E. Freeland	1990	4
5	Elimination of dislocations in heteroepitaxial MBE and RTCVD Ge x Si1-x grown on patterned Si substrates Journal of Electronic Materials ·Eugene A. Fitzgerald,Ya Xie,D. Brasen,M. L. Green,Jürgen Michel,P. E. Freeland,B. E. Weir	1990	28
6	Reduction of Defect Density in Heteroepitaxial Ge_xSi_1-x Grown on Patterned Si Substrates MRS Proceedings ·Eugene A. Fitzgerald,Ya Xie,Jürgen Michel,P. E. Freeland,B. E. Weir	1989	3
7	Arsenic and gallium atom location on silicon (111) Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ·J. R. Patel,J. Zegenhagen,P. E. Freeland,Mark S. Hybertsen,J. A. Golovchenko,D. M. Chen	1989	40
8	Synchrotron x-ray standing-wave study of arsenic on Si(100) Applied Physics Letters ·J. Zegenhagen,J. R. Patel,B. M. Kincaid,J. A. Golovchenko,J. B. Mock,P. E. Freeland,R. J. Malik,Kai Huang	1988	33
9	Arsenic atom location on passivated silicon (111) surfaces Physical review. B, Condensed matter ·J. R. Patel,J. A. Golovchenko,P. E. Freeland,H.‐J. Gossmann	1987	79
10	Location of atoms in the first monolayer of GaAs on Si Physical Review Letters ·J. R. Patel,P. E. Freeland,Mark S. Hybertsen,D. C. Jacobson,J. A. Golovchenko	1987	48
11	Normal Displacements on a Reconstructed Silicon (111) Surface: An X-Ray-Standing-Wave Study Physical Review Letters ·J. R. Patel,P. E. Freeland,J. A. Golovchenko,A. R. Kortan,D. J. Chadi,M.H. Kim	1986	24
12	Diffusivity of oxygen in silicon at the donor formation temperature Applied Physics Letters ·Michael Stavola,J. R. Patel,L. C. Kimerling,P. E. Freeland	1983	167
13	Oxygen Precipitation in Silicon at 650°C Journal of The Electrochemical Society ·P. E. Freeland	1980	12
14	Dislocation-free and low-dislocation quartz prepared by hydrothermal crystallization Journal of Crystal Growth ·R. L. Barns,P. E. Freeland,E.D. Kolb,R.A. Laudise,J. R. Patel	1978	36
15	Precipitation of oxygen in silicon Applied Physics Letters ·P. E. Freeland,Kenneth A. Jackson,Erin A. Peden,J. R. Patel	1977	78
16	Velocities of Individual Dislocations in Germanium Journal of Applied Physics ·J. R. Patel,P. E. Freeland	1971	39
17	Burgers Vector of Dislocations Generated for Dislocation Velocity Measurements in Semiconductors Journal of Applied Physics ·J. R. Patel,P. E. Freeland	1970	11
18	Yield Behavior of Dislocation-Free Germanium from 500°C to the Vicinity of the Melting Point Journal of Applied Physics ·J. R. Patel,P. E. Freeland	1967	19
19	Extent of Solid Solution in the GaSb-InSb System from Crystal Pulling Experiments Journal of The Electrochemical Society ·F. A. Trumbore,P. E. Freeland,D. M. Eigler	1962	5
20	Distribution Coefficient of Antimony in Silicon from Solvent Evaporation Experiments Journal of The Electrochemical Society ·F. A. Trumbore,P. E. Freeland,R. A. Logan	1961	4

About P. E. Freeland

P. E. Freeland is a scholar working on Structural Biology, Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Materials Chemistry and Condensed Matter Physics, having authored 26 papers that have together received 1.2k indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (10 papers), Electron and X-Ray Spectroscopy Techniques (7 papers), Semiconductor materials and interfaces (6 papers), Silicon and Solar Cell Technologies (6 papers), Microstructure and mechanical properties (4 papers), Advanced Surface Polishing Techniques (3 papers), Semiconductor Quantum Structures and Devices (3 papers) and Advanced Chemical Physics Studies (3 papers). The work is most often cited by research in Structural Biology (30 citations), Catalysis (138 citations), Surfaces, Coatings and Films (135 citations), Atomic and Molecular Physics, and Optics (560 citations) and Materials Chemistry (566 citations). P. E. Freeland has collaborated with scholars based in United States and Germany. Frequent co-authors include J. R. Patel, Matthias Baum, R. J. H. Voorhoeve, J. P. Remeika, J. A. Golovchenko, Michael Stavola, L. C. Kimerling, J. Zegenhagen, L. R. Testardi and Mark S. Hybertsen. Their work appears in journals such as Physical Review Letters, Physical review. B, Condensed matter, Applied Physics Letters, Journal of The Electrochemical Society and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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