Yu. A. Novikov

996 total citations
113 papers, 871 citations indexed

About

Yu. A. Novikov is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Yu. A. Novikov has authored 113 papers receiving a total of 871 indexed citations (citations by other indexed papers that have themselves been cited), including 80 papers in Surfaces, Coatings and Films, 53 papers in Electrical and Electronic Engineering and 44 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Yu. A. Novikov's work include Electron and X-Ray Spectroscopy Techniques (80 papers), Advancements in Photolithography Techniques (41 papers) and Advanced Electron Microscopy Techniques and Applications (28 papers). Yu. A. Novikov is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (80 papers), Advancements in Photolithography Techniques (41 papers) and Advanced Electron Microscopy Techniques and Applications (28 papers). Yu. A. Novikov collaborates with scholars based in Russia, United States and Germany. Yu. A. Novikov's co-authors include A. V. Rakov, П. А. Тодуа, В. П. Гавриленко, V. P. Shantarovich, М. Н. Филиппов, Yu. P. Yampolskii, Harald Bosse, C. G. Frase, Gaoliang Dai and K. A. Valiev and has published in prestigious journals such as SHILAP Revista de lepidopterología, Macromolecules and Europhysics Letters (EPL).

In The Last Decade

Yu. A. Novikov

107 papers receiving 863 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Yu. A. Novikov Russia 18 686 487 320 258 122 113 871
Ted Liang United States 15 436 0.6× 569 1.2× 105 0.3× 49 0.2× 23 0.2× 51 692
G. M. Shedd United States 10 81 0.1× 200 0.4× 48 0.1× 194 0.8× 18 0.1× 16 472
Yifei Meng United States 12 49 0.1× 183 0.4× 61 0.2× 76 0.3× 54 0.4× 27 379
H. Hieslmair United States 20 51 0.1× 1.6k 3.3× 21 0.1× 1.0k 4.0× 38 0.3× 66 1.8k
B J Eves Canada 14 45 0.1× 272 0.6× 8 0.0× 201 0.8× 90 0.7× 26 492
Nobuyuki Ishida Japan 14 31 0.0× 544 1.1× 16 0.1× 152 0.6× 12 0.1× 48 772
Manish Chandhok United States 16 249 0.4× 597 1.2× 3 0.0× 55 0.2× 19 0.2× 51 666
Yi‐Sha Ku Taiwan 10 116 0.2× 186 0.4× 4 0.0× 159 0.6× 25 0.2× 48 365
Christof Klein Austria 11 71 0.1× 182 0.4× 14 0.0× 141 0.5× 16 0.1× 32 370
T. Onoue Japan 11 51 0.1× 178 0.4× 3 0.0× 221 0.9× 61 0.5× 47 457

Countries citing papers authored by Yu. A. Novikov

Since Specialization
Citations

This map shows the geographic impact of Yu. A. Novikov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yu. A. Novikov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yu. A. Novikov more than expected).

Fields of papers citing papers by Yu. A. Novikov

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Yu. A. Novikov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yu. A. Novikov. The network helps show where Yu. A. Novikov may publish in the future.

Co-authorship network of co-authors of Yu. A. Novikov

This figure shows the co-authorship network connecting the top 25 collaborators of Yu. A. Novikov. A scholar is included among the top collaborators of Yu. A. Novikov based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yu. A. Novikov. Yu. A. Novikov is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Shantarovich, V. P. & Yu. A. Novikov. (2023). Virtual Spectrometer of Positron Annihilation Lifetimes Based on a Simulator. Russian Journal of Physical Chemistry B. 17(3). 624–630.
3.
Novikov, Yu. A.. (2023). Modern Scanning Electron Microscopy. 1. Secondary Electron Emission. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 17(3). 598–611. 1 indexed citations
4.
Novikov, Yu. A.. (2022). Test Objects with a Rectangular Profile for SEM. 4. Amplitude Measurements on a SEM. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 16(5). 797–805. 2 indexed citations
5.
Novikov, Yu. A.. (2021). Calibration of a Scanning Electron Microscope: 1. Selection of the SEM Parameters. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 15(3). 502–512. 2 indexed citations
6.
Novikov, Yu. A.. (2020). Effect of Contamination on a Test Object for SEM Calibration. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 14(6). 1387–1393. 4 indexed citations
7.
Novikov, Yu. A., et al.. (2018). THE RESULTS OF INTERACTION OF LAKES, WETLANDS OF WATER-BEARING GENESIS WITH THE ENVIRONMENT AND ENVIRONMENTAL MEASURES. SHILAP Revista de lepidopterología. 130–136. 1 indexed citations
8.
Novikov, Yu. A.. (2018). Monte Carlo Method in Scanning Electron Microscopy. 2. Problems and Solutions. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 12(1). 179–184. 3 indexed citations
9.
Novikov, Yu. A.. (2017). Calibration of a scanning electron microscope from two coordinates. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 11(4). 890–896. 6 indexed citations
11.
Novikov, Yu. A.. (2015). Virtual scanning electron microscope. 5. Application in nanotechnology and in micro- and nanoelectronics. Russian Microelectronics. 44(4). 269–282. 9 indexed citations
12.
Novikov, Yu. A.. (2014). Electron distribution density in a low voltage SEM probe. Russian Microelectronics. 43(5). 361–370. 11 indexed citations
13.
Novikov, Yu. A.. (2013). Resolution of a scanning electron microscope: 1. Current state of the problem. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 7(3). 497–504. 8 indexed citations
14.
Novikov, Yu. A.. (2011). Imaging of a test object with a trapezoidal profile and large side wall inclinations in a scanning electron microscope in the backscattered electron mode. Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques. 5(5). 917–923. 17 indexed citations
15.
Novikov, Yu. A., A. V. Rakov, & П. А. Тодуа. (2009). Calibration of atomic force microscopes. Bulletin of the Russian Academy of Sciences Physics. 73(4). 450–460. 1 indexed citations
16.
Гавриленко, В. П., et al.. (2009). First Russian standards in nanotechnology. Bulletin of the Russian Academy of Sciences Physics. 73(4). 433–440. 23 indexed citations
17.
Novikov, Yu. A., et al.. (2008). Calibrating a scanning electron microscope in two coordinates by the use of one certified dimension. Measurement Techniques. 51(6). 605–608. 12 indexed citations
18.
Novikov, Yu. A., A. V. Rakov, & П. А. Тодуа. (2008). Accuracy in linear dimensions measurement in scanning electron microscopes in microtechnology and nanotechnology. Measurement Techniques. 51(6). 599–604. 1 indexed citations
19.
Frase, C. G., et al.. (2007). SEM linewidth measurements of anisotropically etched silicon structures smaller than 0.1 µm. Measurement Science and Technology. 18(2). 439–447. 28 indexed citations
20.
Novikov, Yu. A., et al.. (1996). Measurement of the divergence angle of the electron microprobe of a scanning electron microscope. Measurement Techniques. 39(12). 1204–1206. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Rankless by CCL
2026