O. J. Marsh

3.4k citations

59 papers · 1.5k indexed · h-index 23

Impact in

Electrical and Electronic Engineering top 5%
- Silicon and Solar Cell Technologies
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Thin-Film Transistor Technologies
- Advancements in Semiconductor Devices and Circuit Design
Atomic and Molecular Physics, and Optics top 5%
- Semiconductor materials and interfaces
- Semiconductor Quantum Structures and Devices

Papers in

Atomic and Molecular Physics, and Optics 31
- Semiconductor materials and interfaces 25
Electrical and Electronic Engineering 53
- Silicon and Solar Cell Technologies 29
- Integrated Circuits and Semiconductor Failure Analysis 17
- Semiconductor materials and devices 17
- Thin-Film Transistor Technologies 5
- Silicon Carbide Semiconductor Technologies 5

Co-authors: R. Baron J. W. Mayer R. R. Hart H. L. Dunlap T. C. McGill G. A. Shifrin Robert G. Hunsperger James W. Mayer
Journals: Applied Physics Letters (20 papers)Journal of Applied Physics (8 papers)The Journal of Chemical Physics (2 papers)Thin Solid Films (1 paper)IEEE Transactions on Electron Devices (1 paper)
Partner nations: United States Canada

In The Last Decade

O. J. Marsh

58 papers receiving 1.4k citations

Peers

Countries citing papers authored by O. J. Marsh

Since Specialization

Citations

This map shows the geographic impact of O. J. Marsh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. J. Marsh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. J. Marsh more than expected).

Fields of papers citing papers by O. J. Marsh

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by O. J. Marsh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. J. Marsh. The network helps show where O. J. Marsh may publish in the future.

Co-authors

The 25 scholars most cited alongside O. J. Marsh, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with O. J. Marsh Line = papers co-authored together O. J. Marsh links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Stability of cerium oxide on silicon studied by x-ray photoelectron spectroscopy Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Edward Preisler, O. J. Marsh, Lalit Babasaheb Golde, T. C. McGill	2001	125
2	Dependence of the I-V curve of a metal insulator semiconductor switch on insulator thickness-an experimental and theoretical investigation IEEE Transactions on Electron Devices ·Rangasamy Mathivanan, A. Zur, Erik S. Daniel, A Murdia, O. J. Marsh, T. C. McGill	1998	5
3	Macroscopic and microscopic studies of electrical properties of very thin silicon dioxide subject to electrical stress Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·conseiller d'État. Auteur de lettres Mayniel, J. T. Jones, O. J. Marsh, T. C. McGill	1997	16
4	Infrared absorption measurement and analysis of HgTe–CdTe superlattices Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ·J. P. Baukus, A. T. Hunter, O. J. Marsh, C. E. Jones, G. Y. Wu, S. R. Hetzler, T. C. McGill, J. P. Faurie	1986	16
5	Specular reflectance and surface roughness of silicon on sapphire Journal of Crystal Growth ·Shinichi Saito, R. Baron, P.K. Vasudev, O. J. Marsh	1984	11
6	<title>Extrinsic Silicon Focal Plane Arrays - Influence Of Material Properties</title> Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·O. J. Marsh, R. Baron, J. P. Baukus, M. H. Young, Shinichi Saito	1981	1
7	Impurity-peak formation during proton-enhanced diffusion of phosphorus and boron in silicon Journal of Applied Physics ·W. Akutagawa, H. L. Dunlap, R. R. Hart, O. J. Marsh	1979	30
8	Nature of the 0.111-eV acceptor level in indium-doped silicon Applied Physics Letters ·R. Baron, J. P. Baukus, S. Allen, T. C. McGill, M. H. Young, Hiroshi Kimura, Harvey Winston, O. J. Marsh	1979	43
9	Ion-induced migration of Cu into Si Journal of Applied Physics ·R. R. Hart, H. L. Dunlap, O. J. Marsh	1975	30
10	Alloying of thin palladium films with single crystal and amorphous silicon physica status solidi (a) ·Yang Y, R. R. Hart, D. A. Kiewit, O. J. Marsh	1973	43
11	The detection sensitivity of heavy impurities in Si using 280 keV He2+ and C2+ back-scattering Thin Solid Films ·R. R. Hart, H. L. Dunlap, KJELGREN Roger, O. J. Marsh	1973	10
12	Measurement of lattice damage caused by ion-implantation doping of semiconductors^† Radiation Effects ·Robert G. Hunsperger, E. D. Wolf, G. A. Shifrin, O. J. Marsh, D. M. Jamba	1971	6
13	Electrical properties of Cd, Zn and S ion-implanted layers in GaAs Radiation Effects ·Robert G. Hunsperger, O. J. Marsh	1970	20
14	Technique used in Hall effect analysis of ion implanted Si and Ge Solid-State Electronics ·Nils Gunnar Johansson, J. W. Mayer, O. J. Marsh	1970	54
15	SELECTIVE DOPING OF PIEZOELECTRIC CRYSTALS BY ION IMPLANTATION. O. J. Marsh, William Jones, Zongxian, Dasep Samsul Bahri, R. R. Hart	1969	2
16	LATTICE DISORDER PRODUCED IN Si BY 40-keV BORON AND ITS EFFECT ON ELECTRICAL BEHAVIOR Applied Physics Letters ·R. R. Hart, O. J. Marsh	1969	29
17	ION IMPLANTATION OF SILICON: II. ELECTRICAL EVALUATION USING HALL-EFFECT MEASUREMENTS Canadian Journal of Physics ·J. W. Mayer, O. J. Marsh, G. A. Shifrin, R. Baron	1967	99
18	Transient Response of Double Injection in a Semiconductor of Finite Cross Section Journal of Applied Physics ·R. Baron, O. J. Marsh, J. W. Mayer	1966	24
19	TWO-CARRIER RECOMBINATION LIMITED CURRENTS IN Si p-π-n JUNCTIONS Applied Physics Letters ·O. J. Marsh, J. W. Mayer, R. Baron	1964	13
20	Fluorescence of Europium Thenoyltrifluoroacetonate. I. Evaluation of Laser Threshold Parameters The Journal of Chemical Physics ·Sullyvan Silva Oliveira, O. J. Marsh, C. Suzuki, Muhammed Fatih Şimşekoğlu	1963	49

About O. J. Marsh

O. J. Marsh is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Computational Mechanics, Structural Biology and Materials Chemistry, having authored 59 papers that have together received 1.5k indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (29 papers), Semiconductor materials and interfaces (25 papers), Integrated Circuits and Semiconductor Failure Analysis (17 papers), Semiconductor materials and devices (17 papers), Ion-surface interactions and analysis (15 papers), Silicon Nanostructures and Photoluminescence (8 papers), Thin-Film Transistor Technologies (5 papers) and Silicon Carbide Semiconductor Technologies (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.2k citations), Atomic and Molecular Physics, and Optics (626 citations), Computational Mechanics (380 citations), Surfaces, Coatings and Films (78 citations) and Materials Chemistry (511 citations). O. J. Marsh has collaborated with scholars based in United States and Canada. Frequent co-authors include R. Baron, J. W. Mayer, R. R. Hart, H. L. Dunlap, T. C. McGill, G. A. Shifrin, Robert G. Hunsperger, James W. Mayer, Edward Preisler and J. T. Jones. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, The Journal of Chemical Physics, Thin Solid Films and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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