James W. Mayer

8.6k total citations · 3 hit papers
68 papers, 4.6k citations indexed

About

James W. Mayer is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, James W. Mayer has authored 68 papers receiving a total of 4.6k indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Electrical and Electronic Engineering, 20 papers in Materials Chemistry and 17 papers in Computational Mechanics. Recurrent topics in James W. Mayer's work include Ion-surface interactions and analysis (16 papers), Silicon and Solar Cell Technologies (13 papers) and Semiconductor materials and interfaces (12 papers). James W. Mayer is often cited by papers focused on Ion-surface interactions and analysis (16 papers), Silicon and Solar Cell Technologies (13 papers) and Semiconductor materials and interfaces (12 papers). James W. Mayer collaborates with scholars based in United States, Switzerland and Denmark. James W. Mayer's co-authors include L. C. Feldman, M. Nastasi, J. K. Hirvonen, F. Adams, E. Rimini, M. Grasserbauer, Peter F. Green, S.S. Lau, Edward J. Krämer and C. J. Palmstrøm and has published in prestigious journals such as Science, Physical Review Letters and Physical review. B, Condensed matter.

In The Last Decade

James W. Mayer

66 papers receiving 4.3k citations

Hit Papers

Fundamentals of surface and thin film analysis 1978 2026 1994 2010 1989 1996 1978 200 400 600

Peers

James W. Mayer
Comparison fields: 5 of 119
  • Materials Chemistry 1.9k
  • Electrical and Electronic Engineering 1.9k
  • Computational Mechanics 1.3k
  • Atomic and Molecular Physics, and Optics 980
  • Mechanics of Materials 564
Replace Lawrence Doolittle with:
Lawrence Doolittle United States
G. Dearnaley United Kingdom
G. Fóti Italy
E. Rimini Italy
Jørgen Schou Denmark
P. Oelhafen Switzerland
B. R. Appleton United States
Barney L. Doyle United States
N.P. Barradas Portugal
Michael O. Thompson United States
Lawrence Doolittle United States View profile →
Citations per field, relative to James W. Mayer
James W. Mayer · 1×
Citations per year, relative to James W. Mayer
James W. Mayer · 1×

Countries citing papers authored by James W. Mayer

Since Specialization
Citations

This map shows the geographic impact of James W. Mayer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by James W. Mayer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites James W. Mayer more than expected).

Fields of papers citing papers by James W. Mayer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by James W. Mayer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by James W. Mayer. The network helps show where James W. Mayer may publish in the future.

Co-authorship network of co-authors of James W. Mayer

This figure shows the co-authorship network connecting the top 25 collaborators of James W. Mayer. A scholar is included among the top collaborators of James W. Mayer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with James W. Mayer. James W. Mayer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
# Work Indexed citations
1
Ion implantation and synthesis of materials : with 131 figures and 10 tables
2
2 48
3 21
4 5
5
Ion-solid interactions fundamentals and applications breakdown →
638
6 13
7 63
8 28
9 1
10 14
11 11
12 58
13 7
14
Fundamentals of surface and thin film analysis breakdown →
686
15 4
16
LASER annealing of semiconductor
4
17
Ion Beam Handbook for Material Analysis breakdown →
375
18 82
19 1
20 3

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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