N. V. Nguyen
- Electrical and Electronic Engineering
- Materials Chemistry
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
- Biomedical Engineering
- Co-authors
- Curt A. RichterJames R. EhrsteinJack C. LeeByoung Hun LeeJohn S. SuehleAlan SeabaughHuili Grace XingDavid J. Gundlach
- Topics
- Semiconductor materials and devices (5 papers)Electron and X-Ray Spectroscopy Techniques (3 papers)Magnetic properties of thin films (3 papers)
- Cited by
- Materials ChemistryElectrical and Electronic EngineeringElectronic, Optical and Magnetic Materials
- Journals
- SHILAP Revista de lepidopterologíaNano LettersApplied Physics Letters
- Partner nations
- United StatesBrazilSouth Korea
In The Last Decade
N. V. Nguyen
16 papers receiving 275 citations
Peers
Comparison fields: 5 of 34
- Electrical and Electronic Engineering 212
- Materials Chemistry 176
- Atomic and Molecular Physics, and Optics 58
- Electronic, Optical and Magnetic Materials 51
- Biomedical Engineering 30
Countries citing papers authored by N. V. Nguyen
This map shows the geographic impact of N. V. Nguyen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. V. Nguyen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. V. Nguyen more than expected).
Fields of papers citing papers by N. V. Nguyen
This network shows the impact of papers produced by N. V. Nguyen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. V. Nguyen. The network helps show where N. V. Nguyen may publish in the future.
Co-authorship network of co-authors of N. V. Nguyen
This figure shows the co-authorship network connecting the top 25 collaborators of N. V. Nguyen. A scholar is included among the top collaborators of N. V. Nguyen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. V. Nguyen. N. V. Nguyen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 0 | |
| 4 | 2 | |
| 5 | 1 | |
| 6 | 15 | |
| 7 | Optical Constants of Iron and Nickel Metal from the Far-Ultraviolet to the Near-Infrared | 1 |
| 8 | 3 | |
| 9 | 11 | |
| 10 | 1 | |
| 11 | 2 | |
| 12 | 62 | |
| 13 | 30 | |
| 14 | 11 | |
| 15 | 5 | |
| 16 | 7 | |
| 17 | 136 | |
| 18 | 2 |
About N. V. Nguyen
N. V. Nguyen is a scholar working on Surfaces, Coatings and Films, Condensed Matter Physics and Atomic and Molecular Physics, and Optics, having authored 18 papers that have together received 290 indexed citations. Recurring topics across this work include Semiconductor materials and devices (5 papers), Electron and X-Ray Spectroscopy Techniques (3 papers) and Magnetic properties of thin films (3 papers). The work is most often cited by research in Materials Chemistry (176 citations), Electrical and Electronic Engineering (212 citations) and Electronic, Optical and Magnetic Materials (51 citations). N. V. Nguyen has collaborated with scholars based in United States, Brazil and South Korea. Frequent co-authors include Curt A. Richter, James R. Ehrstein, Jack C. Lee, Byoung Hun Lee, John S. Suehle, Alan Seabaugh, Huili Grace Xing, David J. Gundlach, Kang Wang and Qin Zhang. Their work appears in journals such as SHILAP Revista de lepidopterología, Nano Letters and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.