J. Szmidt

1.7k total citations
124 papers, 1.3k citations indexed

About

J. Szmidt is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Mechanics of Materials. According to data from OpenAlex, J. Szmidt has authored 124 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 80 papers in Electrical and Electronic Engineering, 53 papers in Materials Chemistry and 30 papers in Mechanics of Materials. Recurrent topics in J. Szmidt's work include Semiconductor materials and devices (40 papers), Diamond and Carbon-based Materials Research (36 papers) and Silicon Carbide Semiconductor Technologies (36 papers). J. Szmidt is often cited by papers focused on Semiconductor materials and devices (40 papers), Diamond and Carbon-based Materials Research (36 papers) and Silicon Carbide Semiconductor Technologies (36 papers). J. Szmidt collaborates with scholars based in Poland, Canada and Türkiye. J. Szmidt's co-authors include Mateusz Śmietana, Mariusz Sochacki, Michael L. Korwin-Pawlowski, Wojtek J. Bock, A. Jakubowski, S. Mitura, J. Grabarczyk, A. Olszyna, A. Sokołowska and P. Niedzielski and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and The Journal of Physical Chemistry C.

In The Last Decade

J. Szmidt

106 papers receiving 1.3k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. Szmidt Poland 20 751 734 361 355 192 124 1.3k
David A. J. Moran United Kingdom 19 934 1.2× 729 1.0× 227 0.6× 244 0.7× 174 0.9× 68 1.3k
Hisato Ogiso Japan 16 496 0.7× 452 0.6× 454 1.3× 478 1.3× 404 2.1× 97 1.2k
Pirouz Pirouz United States 18 674 0.9× 543 0.7× 295 0.8× 196 0.6× 247 1.3× 31 1.2k
Ralf Bandorf Germany 19 439 0.6× 678 0.9× 577 1.6× 234 0.7× 245 1.3× 56 1.1k
Ladislav Bárdoš Sweden 21 1.1k 1.5× 546 0.7× 536 1.5× 103 0.3× 122 0.6× 101 1.5k
O. Zabeida Canada 22 716 1.0× 684 0.9× 557 1.5× 113 0.3× 112 0.6× 58 1.3k
E. Scheid France 20 1.1k 1.5× 572 0.8× 121 0.3× 295 0.8× 270 1.4× 110 1.3k
Evgeniya H. Lock United States 19 760 1.0× 540 0.7× 275 0.8× 133 0.4× 322 1.7× 42 1.2k
El Hadj Dogheche France 21 693 0.9× 678 0.9× 128 0.4× 448 1.3× 504 2.6× 110 1.4k
Tokihiro Nishihara Japan 21 833 1.1× 969 1.3× 279 0.8× 347 1.0× 991 5.2× 38 1.7k

Countries citing papers authored by J. Szmidt

Since Specialization
Citations

This map shows the geographic impact of J. Szmidt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Szmidt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Szmidt more than expected).

Fields of papers citing papers by J. Szmidt

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Szmidt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Szmidt. The network helps show where J. Szmidt may publish in the future.

Co-authorship network of co-authors of J. Szmidt

This figure shows the co-authorship network connecting the top 25 collaborators of J. Szmidt. A scholar is included among the top collaborators of J. Szmidt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Szmidt. J. Szmidt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sochacki, Mariusz, et al.. (2024). The Overview of Silicon Carbide Technology: Status, Challenges, Key Drivers, and Product Roadmap. Materials. 18(1). 12–12. 3 indexed citations
2.
Mazur, M., J. Domaradzki, Artur Wiatrowski, et al.. (2022). Investigation of the Microstructure, Optical, Electrical and Nanomechanical Properties of ZnOx Thin Films Deposited by Magnetron Sputtering. Materials. 15(19). 6551–6551. 9 indexed citations
3.
Borecki, M., et al.. (2019). A passive sensing device for a cloud on the skyline detection. 38. 57–57. 1 indexed citations
4.
Ciuk, Tymoteusz, et al.. (2016). Low-noise epitaxial graphene on SiC Hall effect element for commercial applications. Applied Physics Letters. 108(22). 22 indexed citations
5.
Szmidt, J., et al.. (2014). Charge pumping characterization of MISFETs with SiO2/BaTiO3 as a gate stack. PRZEGLĄD ELEKTROTECHNICZNY. 26–28.
6.
Ciuk, Tymoteusz, Semih Çakmakyapan, Ekmel Özbay, et al.. (2014). Step-edge-induced resistance anisotropy in quasi-free-standing bilayer chemical vapor deposition graphene on SiC. Journal of Applied Physics. 116(12). 29 indexed citations
7.
Sochacki, Mariusz, M. Turek, J. Żuk, et al.. (2013). Influence of Nitrogen Implantation on Electrical Properties of Al/SiO<sub>2</sub>/4H-SiC MOS Structure. Materials science forum. 740-742. 733–736. 2 indexed citations
8.
Taube, Andrzej, Mariusz Sochacki, & J. Szmidt. (2012). Symulacje i modelowanie tranzystorów HEMT AlGaN/GaN : wpływ przewodności cieplnej podłoża. Elektronika : konstrukcje, technologie, zastosowania. 53. 34–37.
9.
Borecki, M., et al.. (2011). Zagadnienia klasyfikacji biopaliw : głowica hybrydowa współpracująca z optrodami kapilarnymi. Elektronika : konstrukcje, technologie, zastosowania. 52. 56–59.
10.
Taube, Andrzej, Iwona Pasternak, M. Wzorek, et al.. (2011). Wytwarzanie i charakteryzacja cienkich warstw tlenku hafnu dla zastosowań w technologii MOSFET w węgliku krzemu. Elektronika : konstrukcje, technologie, zastosowania. 52. 117–120. 1 indexed citations
11.
Borecki, M., et al.. (2010). Optoelectronic Capillary Sensors in Microfluidic and Point-of-Care Instrumentation. Sensors. 10(4). 3771–3797. 32 indexed citations
12.
Taube, Andrzej, Mariusz Sochacki, & J. Szmidt. (2009). Optymalizacja konstrukcji i modelowanie tranzystora RESURF LJFET w 4H-SiC. Elektronika : konstrukcje, technologie, zastosowania. 50. 20–25.
13.
Sochacki, Mariusz, et al.. (2009). Power devices in Polish National Silicon Carbide Program. Materials Science and Engineering B. 165(1-2). 18–22. 3 indexed citations
14.
Sochacki, Mariusz, et al.. (2008). Symulacje elektryczne diod Schottky'ego oraz tranzystorów RESURF JFET i RESURF MOSFET na podłożach z węglika krzemu (SiC). Elektronika : konstrukcje, technologie, zastosowania. 49. 11–15. 1 indexed citations
15.
Jakubowska, Małgorzata, et al.. (2006). lead-free solder joints in microelectronic thick film technology. Archives of Metallurgy and Materials. 407–412. 1 indexed citations
16.
Śmietana, Mateusz, J. Szmidt, & Mariusz Dudek. (2005). Warstwa diamentopodobna jako obszar czynny dla czujników światłowodowych. Elektronika : konstrukcje, technologie, zastosowania. 46. 37–38.
17.
Szmidt, J., et al.. (2005). Properties of Al contacts to Si surface exposed in the course of plasma etching of previously grown nanocrystalline c-BN film. Journal of Telecommunications and Information Technology. 76–80.
18.
Gotszalk, Teodor, Andrzej Sikora, J. Szmidt, et al.. (2005). Metody mikroskopii bliskiego pola od mikro- do nanoelektroniki: diagnostyka, wytwarzanie. Elektronika : konstrukcje, technologie, zastosowania. 46. 14–18. 1 indexed citations
19.
Śmietana, Mateusz, J. Szmidt, Mariusz Dudek, & P. Niedzielski. (2004). Optical properties of diamond-like cladding for optical fibres. Diamond and Related Materials. 13(4-8). 954–957. 29 indexed citations
20.
Szmidt, J., et al.. (2002). Electric Characterization and Plasma Etching of Nanocrystalline c-BN Layers. 9(3). 169–176. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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