M. Zier
- Surfaces, Coatings and Films top 10%
- Automotive Engineering top 10%
- Advanced Battery Technologies Research 4
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- Copper Interconnects and Reliability 5
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- Semiconductor materials and devices 7
- Advancements in Battery Materials 6
- Advanced Battery Materials and Technologies 4
- Integrated Circuits and Semiconductor Failure Analysis 4
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- Ion-surface interactions and analysis 3
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- Semiconductor materials and interfaces 3
- Co-authors
- Steffen OswaldR. ReicheK. WetzigMartin HoffmannJ. EckertMarkus KloseLars GiebelerFrieder Scheiba
- Cited by
- Surfaces, Coatings and FilmsAutomotive EngineeringElectronic, Optical and Magnetic Materials
In The Last Decade
M. Zier
28 papers receiving 565 citations
Peers
Comparison fields: 5 of 54
- Surfaces, Coatings and Films 70
- Automotive Engineering 115
- Electronic, Optical and Magnetic Materials 146
- Electrical and Electronic Engineering 429
- Mechanics of Materials 86
Countries citing papers authored by M. Zier
This map shows the geographic impact of M. Zier's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Zier with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Zier more than expected).
Fields of papers citing papers by M. Zier
This network shows the impact of papers produced by M. Zier. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Zier. The network helps show where M. Zier may publish in the future.
Co-authorship network
The 25 scholars most cited alongside M. Zier, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 2 | |
| 2 | 2018 | 84 | |
| 3 | 2016 | 6 | |
| 4 | 2014 | 36 | |
| 5 | 2014 | 73 | |
| 6 | 2014 | 24 | |
| 7 | 2011 | 1 | |
| 8 | 2011 | 5 | |
| 9 | 2010 | 10 | |
| 10 | 2009 | 9 | |
| 11 | 2007 | 2 | |
| 12 | 2006 | 23 | |
| 13 | 2005 | 39 | |
| 14 | 2005 | 27 | |
| 15 | 2004 | 45 | |
| 16 | 2003 | 36 | |
| 17 | 2003 | 5 | |
| 18 | 1992 | 2 | |
| 19 | 1991 | 4 | |
| 20 | [Dust content of the air in less dust-polluted areas of the GDR]. | 1968 | 1 |
About M. Zier
M. Zier is a scholar working on Surfaces, Coatings and Films, Automotive Engineering and Electrical and Electronic Engineering, having authored 28 papers that have together received 577 indexed citations. Recurring topics across this work include Semiconductor materials and devices (7 papers), Advancements in Battery Materials (6 papers), Copper Interconnects and Reliability (5 papers), Advanced Battery Materials and Technologies (4 papers), Advanced Battery Technologies Research (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Ion-surface interactions and analysis (3 papers) and Semiconductor materials and interfaces (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (70 citations), Automotive Engineering (115 citations) and Electronic, Optical and Magnetic Materials (146 citations). M. Zier has collaborated with scholars based in Germany, Austria and Spain. Frequent co-authors include Steffen Oswald, R. Reiche, K. Wetzig, Martin Hoffmann, J. Eckert, Markus Klose, Lars Giebeler, Frieder Scheiba, Helmut Ehrenberg and Tony Jaumann. Their work appears in journals such as Applied Surface Science, Surface and Interface Analysis, Journal of Power Sources, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and Analytical and Bioanalytical Chemistry.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.